Patents Examined by Wm. H. Punter
  • Patent number: 4227812
    Abstract: To determine a dimension of an article, a beam is directed at the article by means of a first mobile deflector so as to scan the part of the profile of the article comprising the dimension to be measured. Rays reflected by the article are orientated in the direction of at least one receiver by means of a second mobile deflector. The deflectors are angularly moved at different speeds. The positions occupied by two points related with the dimension are determined. The dimension is calculated with respect to these points.
    Type: Grant
    Filed: March 7, 1978
    Date of Patent: October 14, 1980
    Assignee: Centre de Recherches Metallurgiques Centrum voor Research in de Metallurgie
    Inventor: Robert A. Pirlet
  • Patent number: 4227805
    Abstract: A slit beam of coherent light is scanned across a flat finger print or fingerpress to provide a modulated reflected light beam. A Fourier transform of the modulated light beam is projected onto a hologram of a standard character plate. The character plate, from which the hologram is made, contains standardized minutia; specifically, line bifurcations and line endings, that are typical of a finger surface image. Correspondence between one of the minutia being scanned and one of the minutia in the character plate results in correlation of the Fourier transform of the minutia being scanned with the hologram of the corresponding minutia on the character plate to produce a correlation beam. An array of photocells is placed optically downstream from the hologram. Excitation of one of the photocells by one of the correlation light beams serves to identify the minutia being scanned by type of minutia, position of minutia and angular orientation thereof.
    Type: Grant
    Filed: January 25, 1978
    Date of Patent: October 14, 1980
    Inventor: Michael Schiller
  • Patent number: 4226530
    Abstract: A method and device for indicating alignment of a pair of headlights. A pair of elongated members are removably mounted by suction cups to the forward-looking faces of a pair of headlights. Each elongated member includes a sight-line scope which is used to visually observe a lateral aim mark on the elongated member mounted to the opposite headlight. The vertical aim of each headlight is adjusted until the bubble levels on the members are properly centered. The lateral aim of each headlight is adjusted until the lateral aim mark on one elongated member is properly centered relative to the sight-line scope provided on the opposite elongated member.
    Type: Grant
    Filed: October 10, 1978
    Date of Patent: October 7, 1980
    Inventor: Gilbert R. Broom
  • Patent number: 4226534
    Abstract: The micropolarizing equipment of the present invention consists in a pair of capillary tubes of black glass or glass with a black outer coating which fit into sockets in three prisms, the first being a prism over the central aperture of the microscope stage which reflects the plane polarized beam at right angles through one of the capillary tubes; a second prism, which is double, reflects light emerging from the first capillary tube at right angles up to a second prism into which the second capillary tube is mounted in a socket and is parallel to the first capillary tube. The third prism receives the other end of the second capillary tube in a socket and reflects the light up into the objective of the microscope.
    Type: Grant
    Filed: November 13, 1978
    Date of Patent: October 7, 1980
    Assignee: Fairfield University
    Inventor: Julius A. Kuck
  • Patent number: 4226536
    Abstract: A non-contacting, electro-optical system adapted automatically to measure the contours of helicopter rotor blades and other shaped objects at high speed and with a high degree of accuracy. An object to be measured is held in a fixture with its contoured surface presented to an electro-optical triangulation rangefinder assembly supported on a carriage that is caused to step incrementally from one end of the object to the other. The assembly is constituted by a pivoted laser beam illuminator and a pivoted automatic tracker mounted for rotation at spaced pivot points on a carriage beam, the line extending between these points forming a triangulation baseline. At each carriage step, the assembly is activated to cause the illuminator to swing through a sector whereby the laser beam spot scans across the surface of the object being tested from one edge to the other.
    Type: Grant
    Filed: February 23, 1979
    Date of Patent: October 7, 1980
    Inventors: Marc G. Dreyfus, Arnold Pellman
  • Patent number: 4225229
    Abstract: A flow chamber includes a flow passage having a knee with a window through which cells in liquid suspension pass. An optical system establishes an observation plane through the passage at the corner enclosed in the knee and illuminates the two portions separated by the corner with light at different wavelengths. Fluorescence of the cells is detected and measured.
    Type: Grant
    Filed: March 6, 1978
    Date of Patent: September 30, 1980
    Inventor: Wolfgang Gohde
  • Patent number: 4220414
    Abstract: A sample of material to be analyzed is applied in a thin layer to a substrate such as an elongated tape and then is illuminated by a laser beam of such wavelength and power that at least a portion of the sample is vaporized. The substrate is non-absorptive at the laser wavelength and therefore is unaffected by the laser beam. The vaporized matter is removed from the region at which vaporization takes place, and is subsequently excited in a plasma to facilitate analysis by a conventional spectrometer.
    Type: Grant
    Filed: April 28, 1977
    Date of Patent: September 2, 1980
    Assignee: Barringer Research Limited
    Inventor: Anthony R. Barringer
  • Patent number: 4217053
    Abstract: A workpiece is passed through a beam of either continuous or pulsed light which is interrupted thereby. The light impinges on a phototransducer such as a phototransistor, which is connected to an evaluation circuit. The evaluation circuit evaluates instantaneous light values with respect to movement of the workpieces in the beam, that is, evaluates variations derived from the transducer which preferably are decoded with respect to threshold levels and the time between sequential level exceeding, or passing, the thresholds is sensed, for example by a counter, to provide an output representative of the occurrence of changes in the light values indicative, for example, of discontinuities in the workpiece.
    Type: Grant
    Filed: April 17, 1978
    Date of Patent: August 12, 1980
    Assignee: Robert Bosch GmbH
    Inventors: Jean-Pierre Lavanchy, Frieder Heizmann
  • Patent number: 4214813
    Abstract: A light optic data handling system for providing changes in the cross sectional dimension of a substantially collimated monochromatic beam of light by allowing the beam to be directed repeatedly, at Brewster's angle, toward and incident upon a common air/light conducting material interface so as to provide said changes utilizing a minimum of bulk material and space while achieving a very high degree of efficiency in the transmission of light through the system.
    Type: Grant
    Filed: July 11, 1978
    Date of Patent: July 29, 1980
    Inventor: Joseph T. McNaney
  • Patent number: 4211489
    Abstract: An automatic photomask alignment system includes a monochromatic light source, such as a laser, a series of diffraction patterns which are located on a semiconductor substrate and keys which are located on photomasks with which the substrate is to be aligned. A light beam is directed through the key on a photomask onto the diffraction pattern to provide a pattern of light spots whose intensities at various locations are determined by the relative alignment of the mask and the diffraction grating. A feedback arrangement which employs photocells and means for moving the photomasks relative to the substrate provides the alignment of the photomasks with the substrate.
    Type: Grant
    Filed: January 16, 1978
    Date of Patent: July 8, 1980
    Assignee: RCA Corporation
    Inventors: Hans P. Kleinknecht, Wolfram A. Bosenberg
  • Patent number: 4210401
    Abstract: The instrument disclosed assists in determining the refractive index and absorption index, at different spectral frequencies, of a solid sample by illuminating the sample at various angles in incidence and measuring the corresponding reflected intensities at various spectral frequencies and polarization angles. The ratio of the intensity of the reflected light for parallel polarized light to that for perpendicular polarized light at two different angles of incidence can be used to determine the optical constants of the sample.The invention involves an apparatus for facilitating the utilization of a wide variety of angles of incidence. The light source and polarizing element are positioned on an outer platform; the sample is positioned on an inner platform. The two platforms rotate about a common axis and cooperate in their rotation such that the sample is rotated one degree for every two degrees of rotation of the light source.
    Type: Grant
    Filed: July 28, 1978
    Date of Patent: July 1, 1980
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Carmen E. Batten
  • Patent number: 4206978
    Abstract: This invention relates to a light reflecting magnifier primarily for reading and which consists of a magnifying lense mounted in a frame which spaces the lense in properly focused relation to a reading surface and which is circular and having a circular interior reflective wall that tapers from a maximum diameter adjacent the underside of the lense to a smaller diameter opening at the bottom of the mounting frame.
    Type: Grant
    Filed: January 29, 1979
    Date of Patent: June 10, 1980
    Inventor: Norbert Leopoldi
  • Patent number: 4207000
    Abstract: Method comprises (1) introducing a polarized light beam into the convex surface of an optically-transparent body whereby the beam propagates in the body in a guided manner near the surface, (2) extracting at least a portion of the beam from the body through the surface at a distance from where the beam was introduced, (3) sensing the change in polarization state of the extracted portion of the beam occurring during its propagation in the body, and (4) calculating the value of stress from the sensed change in polarization state.
    Type: Grant
    Filed: February 27, 1978
    Date of Patent: June 10, 1980
    Assignee: RCA Corporation
    Inventor: Arthur Miller
  • Patent number: 4201450
    Abstract: A rigidly bonded electro-optic phase retardation device comprising a transparent, electrically induced ferroelectric ceramic element bonded with a rigid adhesive in sandwich-like configuration between transparent sheet elements, such as glass, or polarizer elements is described. The electro-optic phase retardation device, provided with means for applying an electric field across at least a portion of the induced ferroelectric ceramic element, can be utilized as a birefringent optical device for controllable modulation of polarized light passing through the device. The device is bonded with an adhesive material, such as a cross-linked unsaturated polyester, effective to provide a rigid boundary between the ceramic material and the sheet elements thereof and exhibits rapid optical response speed in the switching from a field-induced birefringent mode to an isotropic zero-field condition.
    Type: Grant
    Filed: April 3, 1978
    Date of Patent: May 6, 1980
    Assignee: Polaroid Corporation
    Inventor: Giorgio B. Trapani
  • Patent number: 4200393
    Abstract: According to the present method of positioning a semiconductor member by examining it, an optical image of the semiconductor member is focussed on a photoelectric conversion face formed by having a plurality of photoelectric conversion elements arranged thereon in the form of a matrix. By means of the photoelectric conversion elements spotlighted by said optical image, the distributions of the spotlighted elements and the remaining non-spotlighted elements are examined through scanning operation.
    Type: Grant
    Filed: June 7, 1977
    Date of Patent: April 29, 1980
    Assignee: Tokyo Shibaura Elecric Co., Ltd.
    Inventors: Etsuji Suzuki, Itaru Yasue, Tomio Kashihama
  • Patent number: 4198165
    Abstract: An apparatus for measuring an object comprises a rotatable fixture that holds the object to be measured with one end positioned at a fixed location spaced from the axis of rotation of the fixture and the other end projecting freely from the fixture. A scanner that generates a planar unidirectional scanning beam is positioned with respect to the fixture and object such that at one point of rotation of the object the free end of the object intersects the plane of the scanning beam, and along a subsequent portion of the arc of rotation, the entire object, in cross section, projects through the beam.
    Type: Grant
    Filed: April 12, 1978
    Date of Patent: April 15, 1980
    Assignee: Loew's Theatres, Inc.
    Inventor: Werner P. Kirschstein
  • Patent number: 4192612
    Abstract: A device is disclosed for the contact free thickness measurement of an object. A light source produces a sharply bundled light ray which is divided into two light rays and simultaneously and periodically deflected so as to scan over opposite surfaces of the object. A reference detector determines a time t.sub.O at which two rays corresponding to a zero position of the light deflector strike the object. A first detector picks up light only along a first sighting line which intersects the object at a first point on one surface thereof. This first detector detects a time t.sub.A when one of the two light rays scans across the first point. A second detector picks up light only along a second sighting line which intersects the object at a second point on the one surface thereof. The second detector detects a time t.sub.B when the one light ray scans across the second point.
    Type: Grant
    Filed: November 30, 1977
    Date of Patent: March 11, 1980
    Assignee: Siemens Aktiengesellschaft
    Inventor: Viktor Bodlaj
  • Patent number: 4192610
    Abstract: At least four beams of linearly polarized light are produced separately at one and the same point of measurement in a single direction of observation at right angles to a unitary sheet of a specimen of photoelastic material in order to determine the state of mechanical stress in the plane of the sheet.
    Type: Grant
    Filed: April 13, 1977
    Date of Patent: March 11, 1980
    Assignee: Centre Technique des Industries Mecaniques
    Inventor: Dimitri Paraskevas
  • Patent number: 4191472
    Abstract: A method and apparatus for evaluating coins on an objective basis. A support structure displays facsimile coins representative of the obverse and reverse sides of a given class of coins. The facsimile coins within the obverse and reverse groups are further divided into sets. Each set contains facsimile coins representative of a particular type of coin defect or imperfection. The facsimile coins within a set are arranged according to increasing or decreasing extents to which the coin defect is exhibited. Each of the facsimile coins has assigned to it a number representative of the relative value of the facsimile coin in regard to that particular coin defect. The obverse and reverse sides of a test coin are compared with the facsimile coins within each set. The numeric values of the facsimile coins which exhibit the coin defects to the same extent as the test coin are noted and summed to arrive at a total numeric value for the coin.
    Type: Grant
    Filed: October 17, 1977
    Date of Patent: March 4, 1980
    Inventor: Derek Mason
  • Patent number: 4185918
    Abstract: The surface to be sensed or scanned is placed in the path of a projector which is moved along an axis of the surface. The path of motion of the projector is subdivided into predetermined sections which are illuminated by the projector in accordance with a predetermined sequential pattern. This procedure of moving the projector is repeated a predetermined number of times, with a separate illuminating pattern prevailing each time that the projector is moved relative to the surface and traverses the entire surface to be scanned. The combinations of the patterns obtained from the repeated scannings of the projector define closely-spaced sections of the surface. The patterns are coded so that each section is uniquely defined in coded form. A camera having the entire surface within its field of view photographs the surface each time that the projector is moved along the axis of the surface.
    Type: Grant
    Filed: August 27, 1975
    Date of Patent: January 29, 1980
    Assignee: Solid Photography Inc.
    Inventors: Paul L. DiMatteo, Joseph A. Ross, Howard K. Stern