Abstract: A semiconductor memory device includes a memory array region including normal cells and redundancy cells; a repair fuse block including a plurality of fuse sets suitable for programming repair addresses of the repair target cells as repair information, the repair fuse block being suitable for outputting the programmed repair information, in response to a boot-up signal; a fuse information storage block including a plurality of memory cells for storing the repair information outputted from the repair fuse block, the plurality of memory cells being refreshed simultaneously with the normal cells and the redundancy cells of the memory array region; and a repair control block suitable for comparing the repair information stored in the fuse information storage block and an address to generate a repair control signal to selectively activate redundant paths between the repair target cells and the redundancy cells.

Abstract: The present invention relates to a pharmaceutical composition for improving a sociability behavior in a patient having a mental disease with an enhanced NMDAR function.

Abstract: A semiconductor memory device includes a fuse portion including a first fuse set having a plurality of first fuses assigned for a first mode and a second fuse set having a plurality of second fuses assigned for a second mode, and a program portion suitable for programming an available fuse among the first fuses included in the first fuse set or programming the second fuses included in the second fuse set in response to a repair control signal in the second mode.

Abstract: A semiconductor memory device includes a plurality of normal memory mats, one or more of which includes a redundancy word line, a dummy memory mat suitable for performing an operation with an edge memory mat as a pair during an active operation, wherein the edge memory mat is one among the plurality of normal memory mats disposed at an edge, and a refresh control section suitable for controlling refresh operations for the plurality of normal memory mats and the dummy memory mat, and restricting activation of the redundancy word line during a refresh operation for the edge memory mat.

Abstract: A memory device includes: a non-volatile memory circuit suitable for storing hard repair data; a data bus suitable for transmitting the hard repair data during a boot-up operation, and transmitting soft repair data during a soft repair mode; a plurality of registers suitable for storing repair data transmitted through the data bus and activated when the transmitted repair data is stored; a control circuit suitable for selecting a register to store the transmitted repair data among the plurality of the registers, and during the soft repair mode, deactivating a register that stores the same data as the transmitted repair data; and a memory bank suitable for performing a repair operation based on the data stored in a register that is activated among the plurality of the registers.

Abstract: A semiconductor device includes: a first block, which is initialized during an initialization mode; and a second block, which is initialized while the first block latches first signals during a boot-up mode. Herein, the second block may latch second signals after being initialized during the boot-up mode.

Abstract: Provided is a method for analyzing the prognosis of cervical cancer according to the human papillomavirus (HPV) DNA integration pattern. The method of analyzing the prognosis of cervical cancer according to the human papillomavirus DNA integration pattern of the present invention enables an observation of the HPV DNA integration pattern with accuracy and convenience via in situ hybridization (ISH) compared to qPCR analysis. Since the prognosis of cervical cancer having the tumors with an episomal pattern and an integrated pattern can be significantly distinguished when the HPV DNA integration patterns are classified by the above method, the survival rate after radiotherapy of cervical cancer, and in particular invasive cervical cancer, can be more accurately analyzed.

Abstract: A semiconductor apparatus includes a clock division block suitable for generating a first internal clock and a second internal clock having a first phase difference at which active sections of the first internal clock and the second internal clock overlap with each other by dividing a phase of a source clock at a predetermined rate, and a phase detection block suitable for outputting detection result information generated by combining a result obtained by detecting a phase of the first internal clock at a predetermined edge of a strobe signal and a result obtained by detecting a phase of the second internal clock at the predetermined edge of the strobe signal.

Abstract: A memory device may include an address latch circuit that latches an address received from an exterior of the memory device, a repair signal generation circuit that generates a soft repair signal, a selection information generation circuit that generates first selection information by using first bits of a latched address latched by the address latch circuit, first to Nth register circuits that store second bits of the latched address as repair data by being selected by the first selection information when the soft repair signal is activated, and first to Nth memory blocks that perform repair operations using the repair data stored in the respective first to Nth register circuits.

Abstract: A repair circuit includes a fuse set latch array including a plurality of fuse set latches, and configured to store fuse informations in target fuse latches selected among the plurality of fuse set latches in response to fuse latch select signals; a fuse information control unit configured to generate the fuse latch select signals by using boot-up source signals generated by differently combining boot-up mode region select informations according to a region determination signal; and a repair processing unit configured to compare an address inputted from an exterior and the fuse informations, and access a normal memory cell corresponding to the external address or a redundant memory cell.

Abstract: A memory device may include an address latch circuit that latches an address received from an exterior of the memory device, a repair signal generation circuit that generates a soft repair signal, a selection information generation circuit that generates first selection information by using first bits of a latched address latched by the address latch circuit, first to Nth register circuits that store second bits of the latched address as repair data by being selected by the first selection information when the soft repair signal is activated, and first to Nth memory blocks that perform repair operations using the repair data stored in the respective first to Nth register circuits.

Abstract: A repair circuit includes a fuse set latch array including a plurality of fuse set latches, and configured to store fuse informations in target fuse latches selected among the plurality of fuse set latches in response to fuse latch select signals; a fuse information control unit configured to generate the fuse latch select signals by using boot-up source signals generated by differently combining boot-up mode region select informations according to a region determination signal; and a repair processing unit configured to compare an address inputted from an exterior and the fuse informations, and access a normal memory cell corresponding to the external address or a redundant memory cell.

Abstract: A memory device includes: a non-volatile memory circuit suitable for storing hard repair data; a data bus suitable for transmitting the hard repair data during a boot-up operation, and transmitting soft repair data during a soft repair mode; a plurality of registers suitable for storing repair data transmitted through the data bus and activated when the transmitted repair data is stored; a control circuit suitable for selecting a register to store the transmitted repair data among the plurality of the registers, and during the soft repair mode, deactivating a register that stores the same data as the transmitted repair data; and a memory bank suitable for performing a repair operation based on the data stored in a register that is activated among the plurality of the registers.

Abstract: A semiconductor memory device includes a plurality of normal memory mats, one or more of which includes a redundancy word line, a dummy memory mat suitable for performing an operation with an edge memory mat as a pair during an active operation, wherein the edge memory mat is one among the plurality of normal memory mats disposed at an edge, and a refresh control section suitable for controlling refresh operations for the plurality of normal memory mats and the dummy memory mat, and restricting activation of the redundancy word line during a refresh operation for the edge memory mat.

Abstract: A semiconductor memory device includes a fuse portion including a first fuse set having a plurality of first fuses assigned for a first mode and a second fuse set having a plurality of second fuses assigned for a second mode, and a program portion suitable for programming an available fuse among the first fuses included in the first fuse set or programming the second fuses included in the second fuse set in response to a repair control signal in the second mode.

Abstract: A semiconductor device includes: a first block, which is initialized during an initialization mode; and a second block, which is initialized while the first block latches first signals during a boot-up mode. Herein, the second block may latch second signals after being initialized during the boot-up mode.

Abstract: A semiconductor device includes a first buffer suitable for receiving and buffering data, a second buffer suitable for receiving and buffering a data strobe signal, a strobe line suitable for transferring the data strobe signal; a plurality of data transfer lines suitable for transferring data inputted at corresponding turns among data inputted in series through the first buffer, a latch signal generation block suitable for generating a plurality of latch signals which are sequentially activated, based on the data strobe signal transferred through the strobe line, a data latch block suitable for latching and aligning in parallel the data inputted in series through the first buffer, based on the latch signals, and a data transfer block suitable for transferring the data latched by the data latch block to the plurality of data transfer lines, according to a correspondence relationship determined based on an input start signal that is activated at a time when the input of data corresponding to the data input com

Abstract: A semiconductor device includes a clock division block suitable for dividing a frequency of a source clock and generating first and second internal clocks; a strobe division block suitable for dividing a frequency of a strobe signal, and generating first and second internal strobe signals; and a phase difference detection block suitable for generating and alternately outputting first and second detection information as a detection result information.

Abstract: A semiconductor device includes a first buffer suitable for receiving and buffering data, a second buffer suitable for receiving and buffering a data strobe signal, a strobe line suitable for transferring the data strobe signal; a plurality of data transfer lines suitable for transferring data inputted at corresponding turns among data inputted in series through the first buffer, a latch signal generation block suitable for generating a plurality of latch signals which are sequentially activated, based on the data strobe signal transferred through the strobe line, a data latch block suitable for latching and aligning in parallel the data inputted in series through the first buffer, based on the latch signals, and a data transfer block suitable for transferring the data latched by the data latch block to the plurality of data transfer lines, according to a correspondence relationship determined based on an input start signal that is activated at a time when the input of data corresponding to the data input com

Abstract: A semiconductor apparatus includes a clock division block suitable for generating a first internal dock and a second internal clock having a first phase difference at which active sections of the first internal clock and the second internal clock overlap with each other by dividing a phase of a source clock at a predetermined rate, and a phase detection block suitable for outputting detection result information generated by combining a result obtained by detecting a phase of the first internal clock at a predetermined edge of a strobe signal and a result obtained by detecting a phase of the second internal clock at the predetermined edge of the strobe signal.