Abstract: An example system includes a controller having a first controller terminal, a second controller terminal, and a third controller terminal and digitally locked loop (DLL) circuitry having a first DLL terminal and a second DLL terminal, the first DLL terminal coupled to the first controller terminal. The system also includes first retimer circuitry having a first retimer terminal, and a second retimer terminal, and a third retimer terminal, the first retimer terminal coupled to the second DLL terminal and the second retimer terminal coupled to the second controller terminal and second retimer circuitry having a fourth retimer terminal, a fifth retimer terminal, and a sixth retimer terminal, the fourth retimer terminal coupled to the second DLL terminal and the fifth retimer terminal coupled to the third controller terminal.

Abstract: An example apparatus includes: digitally locked loop (DLL) circuitry coupled to a clock terminal and configured to generate a plurality of delayed clocks at a plurality of delayed clock terminals based on a reference clock of the clock terminal; first retimer circuitry coupled to the plurality of delayed clock terminals, a first data terminal, and a second data terminal, the first retimer circuitry configured to delay and serialize data of the first data terminal and the second data terminal using at least one of the delayed clocks of the plurality of delayed clock terminals; and second retimer circuitry coupled to the plurality of delayed clock terminals, a third data terminal, and a fourth data terminal, the second retimer circuitry configured to delay and serialize data of the third data terminal and the fourth data terminal.

Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.

Abstract: A device includes a first transistor (M1) having a control terminal that is a first comparator input, a first terminal that can be coupled to a voltage source, and a second terminal that provides a first comparator output; a second transistor (M2) having a control terminal that is a second comparator input, a first terminal that can be coupled to the voltage source, and a second terminal that provides a second comparator output; a third transistor (M3) having a control terminal coupled to M1, and a first terminal coupled to ground; a fourth transistor (M4) having a control terminal coupled to M2, and a first terminal coupled to ground; first switches that couple M3 second terminal to M3 control terminal, and M4 second terminal to M4 control terminal; and second switches that couple M3 second terminal to the M2 second terminal, and M4 second terminal to the M1 second terminal.

Abstract: An example apparatus includes: digitally locked loop (DLL) circuitry coupled to a clock terminal and configured to generate a plurality of delayed clocks at a plurality of delayed clock terminals based on a reference clock of the clock terminal; first retimer circuitry coupled to the plurality of delayed clock terminals, a first data terminal, and a second data terminal, the first retimer circuitry configured to delay and serialize data of the first data terminal and the second data terminal using at least one of the delayed clocks of the plurality of delayed clock terminals; and second retimer circuitry coupled to the plurality of delayed clock terminals, a third data terminal, and a fourth data terminal, the second retimer circuitry configured to delay and serialize data of the third data terminal and the fourth data terminal.

Abstract: A glitch filter system includes an input stage to receive an input signal, a first output to provide a first digital signal, and a second output to provide a second digital signal. A C-element of such system receives the first digital signal and the second digital signal and provides a third digital signal at a first logic state in response to each of the first and second digital signals having a second logic state opposite the first logic state. An output latch of such system provides an output signal at the second logic state in response to the first logic state of the third digital. The output latch also receives the first and second digital signals to maintain the first logic state of the third digital signal in response to one of the first and second digital signals changing from the second logic state to the first logic state.

Abstract: In some examples, a switch comprises first and second drain-extended transistors of a first type, third and fourth drain-extended transistors of a second type, a switch input coupled between drains of the first and third drain-extended transistors, a switch output coupled between drains of the second and fourth drain-extended transistors, and a control input. The control input is coupled to gates of the first and second drain-extended transistors, a first switch coupled to sources of the first and second drain-extended transistors, a second switch coupled between a voltage supply and gates of the third and fourth drain-extended transistors, and a third switch coupled between the voltage supply and sources of the third and fourth drain-extended transistors. The control input comprises a fifth drain-extended transistor coupled between the sources of the third and fourth drain-extended transistors and the gates of the third and fourth drain-extended transistors.

Abstract: An analog-to-digital converter (ADC) is provided. In some examples, the ADC includes a first reference voltage supply input, a second reference voltage supply input, a comparator comprising an input node, and a first reference switch coupled between the second reference voltage supply input and the input node of the comparator. The ADC also includes a set of capacitors, where each capacitor of the set of capacitors comprises a first terminal. In addition, the ADC includes a second reference switch coupled between the first reference voltage supply input and the first terminal of each capacitor of the set of capacitors. The ADC further includes a third switch coupled between the input node of the comparator and the first terminal of each capacitor of the set of capacitors.

Abstract: Examples of this description provide for a circuit. In some examples, the circuit includes a resistive network, a least significant bit (LSB) capacitor selectively coupled via a switch to receive an analog input voltage or to a selected first tap in the resistive network, and a charge boost network coupled in parallel with the resistive network and to a midpoint of the resistive network. To determine a most significant bit of lower order bits of a digital representation of the analog input voltage, the charge boost network is coupled to the LSB capacitor.

Abstract: In some examples, a switch comprises first and second drain-extended transistors of a first type, third and fourth drain-extended transistors of a second type, a switch input coupled between drains of the first and third drain-extended transistors, a switch output coupled between drains of the second and fourth drain-extended transistors, and a control input. The control input is coupled to gates of the first and second drain-extended transistors, a first switch coupled to sources of the first and second drain-extended transistors, a second switch coupled between a voltage supply and gates of the third and fourth drain-extended transistors, and a third switch coupled between the voltage supply and sources of the third and fourth drain-extended transistors. The control input comprises a fifth drain-extended transistor coupled between the sources of the third and fourth drain-extended transistors and the gates of the third and fourth drain-extended transistors.

Abstract: A device includes a first transistor (M1) having a control terminal that is a first comparator input, a first terminal that can be coupled to a voltage source, and a second terminal that provides a first comparator output; a second transistor (M2) having a control terminal that is a second comparator input, a first terminal that can be coupled to the voltage source, and a second terminal that provides a second comparator output; a third transistor (M3) having a control terminal coupled to M1, and a first terminal coupled to ground; a fourth transistor (M4) having a control terminal coupled to M2, and a first terminal coupled to ground; first switches that couple M3 second terminal to M3 control terminal, and M4 second terminal to M4 control terminal; and second switches that couple M3 second terminal to the M2 second terminal, and M4 second terminal to the M1 second terminal.

Abstract: An analog-to-digital converter (ADC) is provided. In some examples, the ADC includes a first reference voltage supply input, a second reference voltage supply input, a comparator comprising an input node, and a first reference switch coupled between the second reference voltage supply input and the input node of the comparator. The ADC also includes a set of capacitors, where each capacitor of the set of capacitors comprises a first terminal. In addition, the ADC includes a second reference switch coupled between the first reference voltage supply input and the first terminal of each capacitor of the set of capacitors. The ADC further includes a third switch coupled between the input node of the comparator and the first terminal of each capacitor of the set of capacitors.

Abstract: This disclosure relates generally to a system and method to predict the personalized boarding time dynamically. The personalized boarding time in real-time by considering flight schedule data, predefined flight configuration data, passenger details, historical boarding time data, real time invasive data, and non-invasive real time data. Estimating boarding service rate based on historical information, predefined airline policies and boarding arrangements. Herein, the method categorizes input data related to an airline history, airport history, and various airline reference data. Further, the system analyses the cause of delay in boarding by comparing with the average historical time which may include boarding related delays and service rate related delays. The system and method compute the personalized boarding time by considering dynamic operational hurdles and various input datasets.

Abstract: A level shifter circuit is provided. In some examples, the level shifter circuit includes a first set of transistors and a second set of transistors coupled between first and second power supply nodes. The control terminals of the first and second lower transistors are coupled to an input node. The level shifter circuit also includes a third set of transistors and a fourth set of transistors coupled between first and third power supply nodes. A control terminal of a third lower transistor is coupled to a second intermediate node, and a control terminal of a fourth lower transistor is coupled to a first intermediate node. Control terminals of the first upper transistor and the fourth upper transistor are coupled to a third intermediate node. Control terminals of the second upper transistor and the third upper transistor are coupled to a fourth intermediate node.

Abstract: One example includes a glitch filter system. The system includes an input stage to receive an input signal, a first output to provide a first digital signal, and a second output to provide a second digital signal. A C-element receives the first digital signal and the second digital signal and provides a third digital signal at a first logic state in response to each of the first and second digital signals having a second logic state opposite the first logic state. An output latch provides an output signal at the second logic state in response to the first logic state of the third digital. The output latch also receives the first and second digital signals to maintain the first logic state of the third digital signal in response to one of the first and second digital signals changing from the second logic state to the first logic state.

Abstract: One example includes a glitch filter system. The system includes an input stage to receive an input signal, a first output to provide a first digital signal, and a second output to provide a second digital signal. A C-element receives the first digital signal and the second digital signal and provides a third digital signal at a first logic state in response to each of the first and second digital signals having a second logic state opposite the first logic state. An output latch provides an output signal at the second logic state in response to the first logic state of the third digital. The output latch also receives the first and second digital signals to maintain the first logic state of the third digital signal in response to one of the first and second digital signals changing from the second logic state to the first logic state.

Abstract: One example includes a glitch filter system. The system includes an input stage to receive an input signal, a first output to provide a first digital signal, and a second output to provide a second digital signal. A C-element receives the first digital signal and the second digital signal and provides a third digital signal at a first logic state in response to each of the first and second digital signals having a second logic state opposite the first logic state. An output latch provides an output signal at the second logic state in response to the first logic state of the third digital. The output latch also receives the first and second digital signals to maintain the first logic state of the third digital signal in response to one of the first and second digital signals changing from the second logic state to the first logic state.

Abstract: An integrated circuit device is provided. In some examples, an integrated circuit die of the device includes a first capacitor arranged such that when the integrated circuit die is coupled to a package, the package affects a capacitance of the first capacitor, a second capacitor disposed directly underneath the first capacitor, and a capacitance measurement circuit coupled to the first capacitor and the second capacitor to determine the capacitance of the first capacitor and a capacitance of the second capacitor. The integrated circuit device may detect tampering with the die and/or the package based on the capacitances of the first capacitor and the second capacitor.

Abstract: A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.

Abstract: A system includes an oscillator comprising a first switch, a current source, a capacitor, and a comparator, the capacitor and the comparator coupled at a node. The system includes one or more delay buffers coupled to the comparator. The system includes a first inverter coupled to the one or more delay buffers. The system includes a first buffer coupled to the one or more delay buffers. The system includes a first coupling capacitor coupled to the first inverter and the first buffer via second and third switches, respectively. The system includes a second inverter coupled to the one or more delay buffers. The system includes a second buffer coupled to the one or more delay buffers. The system includes a second coupling capacitor coupled to the second inverter and the second buffer via fourth and fifth switches, respectively. The first and second coupling capacitors are coupled to the oscillator.