Patents by Inventor Abhijit Kumar Das

Abhijit Kumar Das has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190369148
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
    Type: Application
    Filed: August 14, 2019
    Publication date: December 5, 2019
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Patent number: 10491228
    Abstract: An electronic circuit system with an input for receiving an analog signal having a frequency and comprising noise, that noise including input referred noise, and the noise fluctuates in a range. The system also comprises a signal path with: (i) an analog to digital converter for providing a digital output value in response to a clock period; (ii) a feedback node; and (iii) circuitry for limiting a signal swing at the feedback node, during a period of the clock period, to be no greater than an RMS value of the noise. The analog to digital converter is further for providing the digital output value in response to the analog signal and the signal swing at the feedback node.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: November 26, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Abhijit Kumar Das, Brian Roger Elies
  • Patent number: 10466286
    Abstract: A system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: November 5, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Patent number: 10422822
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: September 24, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Patent number: 10330767
    Abstract: A calibrated measurement circuit, with a first node, a second node, a circuit element coupled between the first node and the second node, and a reference circuit element. The calibrated measurement circuit also comprises circuitry for directing a first current and a second current between the first node and the second node and to the reference circuit element. The calibrated measurement circuit also comprises circuitry for measuring voltage across the circuit element in response to the first and second currents, and circuitry for measuring voltage across the reference circuit element in response to the first and second currents. A calibration factor is also determined for calibrating measured voltages across the circuit element, in response to a relationship between the first voltage, the second voltage, and the reference circuit element.
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: June 25, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Abhijit Kumar Das, Christy Lee She
  • Publication number: 20180335459
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
    Type: Application
    Filed: July 30, 2018
    Publication date: November 22, 2018
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Patent number: 10060959
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
    Type: Grant
    Filed: February 25, 2014
    Date of Patent: August 28, 2018
    Assignee: Texas Instruments Incorporated
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Publication number: 20180123607
    Abstract: An electronic circuit system with an input for receiving an analog signal having a frequency and comprising noise, that noise including input referred noise, and the noise fluctuates in a range. The system also comprises a signal path with: (i) an analog to digital converter for providing a digital output value in response to a clock period; (ii) a feedback node; and (iii) circuitry for limiting a signal swing at the feedback node, during a period of the clock period, to be no greater than an RMS value of the noise. The analog to digital converter is further for providing the digital output value in response to the analog signal and the signal swing at the feedback node.
    Type: Application
    Filed: August 31, 2017
    Publication date: May 3, 2018
    Inventors: Abhijit Kumar Das, Brian Roger Elies
  • Publication number: 20180106844
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
    Type: Application
    Filed: December 18, 2017
    Publication date: April 19, 2018
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Publication number: 20180054204
    Abstract: A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
    Type: Application
    Filed: October 12, 2017
    Publication date: February 22, 2018
    Inventor: Abhijit Kumar Das
  • Patent number: 9846185
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
    Type: Grant
    Filed: February 25, 2014
    Date of Patent: December 19, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Patent number: 9825637
    Abstract: A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
    Type: Grant
    Filed: October 18, 2016
    Date of Patent: November 21, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Abhijit Kumar Das
  • Patent number: 9780798
    Abstract: An electronic circuit system with an input for receiving an analog signal having a frequency and comprising noise, that noise including input referred noise, and the noise fluctuates in a range. The system also comprises a signal path with: (i) an analog to digital converter for providing a digital output value in response to a clock period; (ii) a feedback node; and (iii) circuitry for limiting a signal swing at the feedback node, during a period of the clock period, to be no greater than an RMS value of the noise. The analog to digital converter is further for providing the digital output value in response to the analog signal and the signal swing at the feedback node.
    Type: Grant
    Filed: November 1, 2016
    Date of Patent: October 3, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Abhijit Kumar Das, Brian Roger Elies
  • Publication number: 20170146633
    Abstract: A calibrated measurement circuit, with a first node, a second node, a circuit element coupled between the first node and the second node, and a reference circuit element. The calibrated measurement circuit also comprises circuitry for directing a first current and a second current between the first node and the second node and to the reference circuit element. The calibrated measurement circuit also comprises circuitry for measuring voltage across the circuit element in response to the first and second currents, and circuitry for measuring voltage across the reference circuit element in response to the first and second currents. A calibration factor is also determined for calibrating measured voltages across the circuit element, in response to a relationship between the first voltage, the second voltage, and the reference circuit element.
    Type: Application
    Filed: November 25, 2015
    Publication date: May 25, 2017
    Inventors: Abhijit Kumar Das, Christy Lee She
  • Publication number: 20170126235
    Abstract: A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
    Type: Application
    Filed: October 18, 2016
    Publication date: May 4, 2017
    Inventor: Abhijit Kumar Das
  • Patent number: 9520881
    Abstract: A system for tuning an oscillator frequency. The system includes a trimmed calibration circuit comprising a comparator and trimmed delay element and calibration logic. The calibration logic is configured to receive an output of the comparator and control an on time and an off time of an oscillator based on the output of the comparator.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: December 13, 2016
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Abhijit Kumar Das, Krishnasawamy Nagaraj, Rahul Bhandarkar
  • Patent number: 9503100
    Abstract: A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: November 22, 2016
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Abhijit Kumar Das
  • Publication number: 20140239983
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
    Type: Application
    Filed: February 25, 2014
    Publication date: August 28, 2014
    Applicant: Texas Instruments Incorporated
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
  • Publication number: 20140240153
    Abstract: A Sigma Delta Modulator (SDM) signal overload conditions are overcome without sacrificing performance or driving up implementation costs. These advanced overload protection method can be applied to any higher order SDM where overloading is a serious system concern.
    Type: Application
    Filed: February 28, 2013
    Publication date: August 28, 2014
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Abhijit Kumar Das
  • Publication number: 20140239977
    Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
    Type: Application
    Filed: February 25, 2014
    Publication date: August 28, 2014
    Applicant: Texas Instruments Incorporated
    Inventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das