Patents by Inventor Abu Sebastian

Abu Sebastian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method to transiently detect samples in atomic force microscopes
    Patent number: 7066014
    Abstract: An approach to determine cantilever movement is presented. An observer based state estimation and statistical signal detection and estimation techniques are applied to Atomic Force Microscopes. A first mode approximation model of the cantilever is considered and a Kalman filter is designed to estimate the dynamic states. The tip-sample interaction is modeled as an impulsive force applied to the cantilever in order to detect the presence of sample. A generalized likelihood ratio test is performed to obtain the decision rule and the maximum likelihood estimation of the unknown arrival time of the sample profile and unknown magnitude of it. The use of the transient data results in sample detection at least ten times faster than using the steady state characteristics.
    Type: Grant
    Filed: September 29, 2004
    Date of Patent: June 27, 2006
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: Murti V. Salapaka, Abu Sebastian, Deepak Ranjan Sahoo
  • Method to transiently detect samples in atomic force microscopes
    Publication number: 20050066713
    Abstract: An approach to determine cantilever movement is presented. An observer based state estimation and statistical signal detection and estimation techniques are applied to Atomic Force Microscopes. A first mode approximation model of the cantilever is considered and a Kalman filter is designed to estimate the dynamic states. The tip-sample interaction is modeled as an impulsive force applied to the cantilever in order to detect the presence of sample. A generalized likelihood ratio test is performed to obtain the decision rule and the maximum likelihood estimation of the unknown arrival time of the sample profile and unknown magnitude of it. The use of the transient data results in sample detection at least ten times faster than using the steady state characteristics.
    Type: Application
    Filed: September 29, 2004
    Publication date: March 31, 2005
    Applicant: Iowa State University Research Foundation, Inc.
    Inventors: Murti Salapaka, Abu Sebastian, Deepak Sahoo