Patents by Inventor Adam Weiss
Adam Weiss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7970556Abstract: A system and method for monitoring the condition of a gear assembly analyzes a signal output by a vibration detector that is attached to the gear assembly. Each time that an amplitude of the signal output from the vibration detector exceeds a threshold value, the system assumes that a debris particle has passed between meshing parts of the gear assembly. The number of times that this occurs, and possibly the amplitude of the vibrations are analyzed to determine a condition of the gear assembly, and possibly a damage index. This system and method are particularly applicable to planetary gear arrangements where the vibration detector can be mounted on a fixed ring gear of the gear assembly, or a structure upon which the fixed ring gear is mounted.Type: GrantFiled: January 30, 2009Date of Patent: June 28, 2011Assignee: General ElectricInventors: Roger Hala, Charles T Hatch, Adam Weiss, Mel Maalouf, Matthew Kalb, Steven Hadley
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Publication number: 20110040630Abstract: A computerized method for providing targeted offers to a subset of a plurality of users. The method comprises receiving offer data from an offerror, receiving a filtering parameter for the offer data, generating an offerror profile, which includes the offer data and the filtering parameter; comparing the offerror profile to a plurality of user profiles; determining a matching user profile from the plurality of user profiles; and forwarding an offer to a user account that is associated with the matching user profile, wherein the offer data includes the offer.Type: ApplicationFiled: August 6, 2010Publication date: February 17, 2011Applicant: Credit Online Ventures, Inc.Inventor: ADAM WEISS
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Publication number: 20100198534Abstract: A system and method for monitoring the condition of a gear assembly analyzes a signal output by a vibration detector that is attached to the gear assembly. Each time that an amplitude of the signal output from the vibration detector exceeds a threshold value, the system assumes that a debris particle has passed between meshing parts of the gear assembly. The number of times that this occurs, and possibly the amplitude of the vibrations are analyzed to determine a condition of the gear assembly, and possibly a damage index. This system and method are particularly applicable to planetary gear arrangements where the vibration detector can be mounted on a fixed ring gear of the gear assembly, or a structure upon which the fixed ring gear is mounted.Type: ApplicationFiled: January 30, 2009Publication date: August 5, 2010Inventors: Roger Hala, Charles T. Hatch, Adam Weiss, Mel Maalouf, Matthew Kalb, Steven Hadley
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Publication number: 20100138388Abstract: Mapping data stored in a data storage system for use by a computer system includes processing specifications of dataflow graphs that include nodes representing computations interconnected by links representing flows of data. At least one of the dataflow graphs receives a flow of data from at least one input dataset and at least one of the dataflow graphs provides a flow of data to at least one output dataset. A mapper identifies one or more sets of datasets. Each dataset in a given set matches one or more criteria for identifying different versions of a single dataset. A user interface is provided to receive a mapping between at least two datasets in a given set. The mapping received over the user interface is stored in association with a dataflow graph that provides data to or receives data from the datasets of the mapping.Type: ApplicationFiled: December 1, 2009Publication date: June 3, 2010Inventors: Tim Wakeling, Adam Weiss
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Patent number: 7700903Abstract: The invention is directed at a method and apparatus for auto-focusing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focusing measurements which are used to auto-focus the microscope.Type: GrantFiled: June 11, 2007Date of Patent: April 20, 2010Assignee: WDI Wise Device Inc.Inventors: Adam Weiss, Alexandre Obotnine, Andrew Lasinski
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Patent number: 7624421Abstract: Proper user-to-data associations are maintained in shared spaces created in a peer-to-peer collaborative system by means of a simplified and minimal user interface that permits users to easily authenticate other members of a shared space. In particular, support is provided for automatically building authenticated relationships even if users do not take the time to authenticate other users. When a user enters a shared space and views the contacts in that space, the display names of each contact are accompanied by distinctive icons that identify that authentication status of that contact. A mechanism is provided for resolving conflicts between contacts with the same display names to prevent confusion and contact “spoofing.” Security policies can be established to provide a uniform approach to authentication. These policies can be set by a user or, alternatively, the policies can be set by an administrator.Type: GrantFiled: July 31, 2003Date of Patent: November 24, 2009Assignee: Microsoft CorporationInventors: Raymond E. Ozzie, George P. Moromisato, Nimisha Asthagiri, Wei Dai, Alexei Evdokimov, Mark Cote, Adam Weiss
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Patent number: 7613840Abstract: Methods and apparatus for transmitting data between elements of a data acquisition system are provided. The method includes receiving, at a first element, a self-describing control packet including a first configuration parameter, the first configuration parameter controls first data acquisition by the first element, acquiring first data by the first element in accordance with the first configuration parameter, generating a self-describing data packet including an identifier for the first configuration parameter and the acquired first data, and interpreting the acquired first data using the identifier.Type: GrantFiled: August 17, 2006Date of Patent: November 3, 2009Assignee: General Electric CompanyInventors: Donald Frank Brockhage, Erik Dylan Evans, Mark Leo Gneiting, Adam Weiss
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Publication number: 20090150968Abstract: Proper user-to-data associations are maintained in shared spaces created in a peer-to-peer collaborative system by means of a simplified and minimal user interface that permits users to easily authenticate other members of a shared space. In particular, support is provided for automatically building authenticated relationships even if users do not take the time to authenticate other users. When a user enters a shared space and views the contacts in that space, the display names of each contact are accompanied by distinctive icons that identify that authentication status of that contact. A mechanism is provided for resolving conflicts between contacts with the same display names to prevent confusion and contact “spoofing.” Security policies can be established to provide a uniform approach to authentication. These policies can be set by a user or, alternatively, the policies can be set by an administrator.Type: ApplicationFiled: July 31, 2003Publication date: June 11, 2009Applicant: Groove Networks, Inc.Inventors: Raymond E. Ozzie, George P. Moromisato, Nimisha Asthagiri, Wei Dai, Alexei Evdokimov, Mark Cote, Adam Weiss
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Patent number: 7386161Abstract: A concurrent low resolution/high resolution parallel scanning system and method are provided as an improvement in the scanning process of an inspection system for planar objects, such as large flat plates employed in panel displays, whereby lower resolution defect detection efficiently overlaps and parallels higher resolution defect review and classification stages in which defects are automatically defined and resolved. Although the invention is a valid solution for the more general problem of optically inspecting the surface of a flat article for defects, the invention is particularly useful for detecting pattern defects on large glass plates deposited with integrated-circuits for forming LCD flat panel displays.Type: GrantFiled: October 17, 2003Date of Patent: June 10, 2008Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Publication number: 20080062422Abstract: The invention is directed at a method and system of detecting defects in a transparent media such as a piece of glass. The method comprises the steps of transmitting light from a light source towards the transparent media and then detecting defects in the transparent media by Photodiode array scanning the light as it is reflected or passes through the transparent media. The method and system may operate in any one of a dark field mode, a bright field mode for scanning or a bright field mode for inspecting.Type: ApplicationFiled: September 19, 2005Publication date: March 13, 2008Applicant: DE. VICE SCIENTIFIC INCORPORATEDInventors: David Thomas, Adam Weiss
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Publication number: 20080043821Abstract: Methods and apparatus for transmitting data between elements of a data acquisition system are provided. The method includes receiving, at a first element, a self-describing control packet including a first configuration parameter, the first configuration parameter controls first data acquisition by the first element, acquiring first data by the first element in accordance with the first configuration parameter, generating a self-describing data packet including an identifier for the first configuration parameter and the acquired first data, and interpreting the acquired first data using the identifier.Type: ApplicationFiled: August 17, 2006Publication date: February 21, 2008Inventors: Donald Frank Brockhage, Erik Dylan Evans, Mark Leo Gneiting, Adam Weiss
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Publication number: 20080002252Abstract: The invention is directed at a method and apparatus for auto-focussing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focussing measurements which are used to auto-focus the microscope.Type: ApplicationFiled: June 11, 2007Publication date: January 3, 2008Applicant: Wegu-Device Inc.Inventors: Adam WEISS, Alexandre Obotnine, Andrew Lasinski
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Patent number: 7301133Abstract: A tracking auto-focus system maintains a microscope pointed at a TFT array continuously in focus so as to eliminate the auto-focusing time that would otherwise be required. The tracking auto-focus system includes, in part, a microscope Z actuator, an auto-focus sensor, an analog-to-digital converter (ADC), a signal conditioner, a digital proportional integrating and differentiating (PID) controller, and a digital-to-analog converter. The actuator adjusts the distance between the microscope's objective lens and the target and includes, in part, an amplifier, a linear motor, and a linear encoder which provides positional feedback. The auto-focus sensor together with the ADC and signal conditioner continuously monitor and detect the distance between the microscope's objective lens and the target and supply the measured distance to the amplifier. The PID controller together with the DAC stabilizes the distance separating the microscope's objective lens and the target to maintain the best focus.Type: GrantFiled: December 20, 2005Date of Patent: November 27, 2007Assignee: Photon Dynamics, Inc.Inventor: Adam Weiss
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Patent number: 7180084Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: GrantFiled: March 15, 2006Date of Patent: February 20, 2007Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Patent number: 7137309Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: GrantFiled: October 11, 2005Date of Patent: November 21, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Publication number: 20060202103Abstract: A tracking auto-focus system maintains a microscope pointed at a TFT array continuously in focus so as to eliminate the auto-focusing time that would otherwise be required. The tracking auto-focus system includes, in part, a microscope Z actuator, an auto-focus sensor, an analog-to-digital converter (ADC), a signal conditioner, a digital proportional integrating and differentiating (PID) controller, and a digital-to-analog converter. The actuator adjusts the distance between the microscope's objective lens and the target and includes, in part, an amplifier, a linear motor, and a linear encoder which provides positional feedback. The auto-focus sensor together with the ADC and signal conditioner continuously monitor and detect the distance between the microscope's objective lens and the target and supply the measured distance to the amplifier. The PID controller together with the DAC stabilizes the distance separating the microscope's objective lens and the target to maintain the best focus.Type: ApplicationFiled: December 20, 2005Publication date: September 14, 2006Applicant: Photon Dynamics, Inc.Inventor: Adam Weiss
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Publication number: 20060186361Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: ApplicationFiled: March 15, 2006Publication date: August 24, 2006Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Patent number: 7084970Abstract: In an inspection system for electrical and electro-optical inspection of TFT-LCD panels, a fine resolution area imaging camera with a pulse illumination source disposed to scan the region and operative capture images of the region illuminated with pulses of short illumination and automatically maintained in focus while continuously scanning in order to resolve points of defects.Type: GrantFiled: May 14, 2004Date of Patent: August 1, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Patent number: 7077019Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: GrantFiled: August 8, 2003Date of Patent: July 18, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Publication number: 20060096395Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: ApplicationFiled: October 11, 2005Publication date: May 11, 2006Applicant: PHOTON DYNAMICS, INC.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin