Patents by Inventor Adam Weiss
Adam Weiss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7180084Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: GrantFiled: March 15, 2006Date of Patent: February 20, 2007Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Patent number: 7137309Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: GrantFiled: October 11, 2005Date of Patent: November 21, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Publication number: 20060202103Abstract: A tracking auto-focus system maintains a microscope pointed at a TFT array continuously in focus so as to eliminate the auto-focusing time that would otherwise be required. The tracking auto-focus system includes, in part, a microscope Z actuator, an auto-focus sensor, an analog-to-digital converter (ADC), a signal conditioner, a digital proportional integrating and differentiating (PID) controller, and a digital-to-analog converter. The actuator adjusts the distance between the microscope's objective lens and the target and includes, in part, an amplifier, a linear motor, and a linear encoder which provides positional feedback. The auto-focus sensor together with the ADC and signal conditioner continuously monitor and detect the distance between the microscope's objective lens and the target and supply the measured distance to the amplifier. The PID controller together with the DAC stabilizes the distance separating the microscope's objective lens and the target to maintain the best focus.Type: ApplicationFiled: December 20, 2005Publication date: September 14, 2006Applicant: Photon Dynamics, Inc.Inventor: Adam Weiss
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Publication number: 20060186361Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: ApplicationFiled: March 15, 2006Publication date: August 24, 2006Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Patent number: 7084970Abstract: In an inspection system for electrical and electro-optical inspection of TFT-LCD panels, a fine resolution area imaging camera with a pulse illumination source disposed to scan the region and operative capture images of the region illuminated with pulses of short illumination and automatically maintained in focus while continuously scanning in order to resolve points of defects.Type: GrantFiled: May 14, 2004Date of Patent: August 1, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Patent number: 7077019Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: GrantFiled: August 8, 2003Date of Patent: July 18, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Publication number: 20060096395Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: ApplicationFiled: October 11, 2005Publication date: May 11, 2006Applicant: PHOTON DYNAMICS, INC.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Patent number: 7041998Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: GrantFiled: March 24, 2003Date of Patent: May 9, 2006Assignee: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Publication number: 20050254045Abstract: In an inspection system for electrical and electro-optical inspection of TFT-LCD panels, a fine resolution area imaging camera with a pulse illumination source disposed to scan the region and operative capture images of the region illuminated with pulses of short illumination and automatically maintained in focus while continuously scanning in order to resolve points of defects.Type: ApplicationFiled: May 14, 2004Publication date: November 17, 2005Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Publication number: 20050040338Abstract: A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held by a vacuum contact is transported on air cushions from the up-web air table to the central inspection/repair section. Vacuum nozzles integrated with porous medium pads precisely control the height of the flexible media above the central section during inspection or repair. Embodiments includes structures in which the media is either stationary or moving during inspection/repair. A first media can be loaded/unloaded while a second media is undergoing inspection or repair in a pipelined operational mode.Type: ApplicationFiled: August 8, 2003Publication date: February 24, 2005Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Eduardo Ghelman, David Baldwin
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Patent number: 6841774Abstract: A sample introduction device for introducing a plurality of independent fluid sample streams into a mass spectrometer includes a manifold (84) having a plurality of fluid sample stream direct paths. Each direct path extends between a fluid sample stream inlet (80, 82) and a fluid sample stream outlet. A plurality of bypass paths (92, 96) is also provided in the manifold. Each bypass path is coupled to a respective one of the direct paths between the inlet and outlet. A plurality of transfer lines (86, 94) is also provided with each transfer line being coupled to a respective one of the outlets to deliver a fluid sample stream to an ionization region of the mass spectrometer. A valve (90, 96) is positioned in each of the bypass paths and is actuable to divert the fluid sample stream entering the direct path via the inlet from the direct path and into the bypass path.Type: GrantFiled: November 28, 2001Date of Patent: January 11, 2005Assignee: MDS Inc.Inventor: Adam Weiss
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Publication number: 20040188643Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.Type: ApplicationFiled: March 24, 2003Publication date: September 30, 2004Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
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Publication number: 20040132524Abstract: A player is dealt a hand of cards, and bonus items. The bonus items are unique, each one corresponding to a unique card or unique set of cards in the deck from which the player's hand was drawn. The player may discard cards and receive new cards, resulting in a final hand, as in a normal poker game. In addition to the normal poker hand evaluation, this final hand is evaluated for any bonus winnings based on the bonus items. Additional winnings are awarded depending upon the number of bonus items that match the player's final hand. In another variation, multiple players compete against each other in an attempt to be the first player to match or “qualify” all of a common set of bonus items. As the bonus items are qualified, winnings are paid into a common bank. The first player to qualify all bonus items is awarded the contents of the bank.Type: ApplicationFiled: October 16, 2003Publication date: July 8, 2004Inventors: Christopher M. Ramstad, Adam A. Weiss
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Publication number: 20040109598Abstract: A concurrent low resolution/high resolution parallel scanning system and method are provided as an improvement in the scanning process of an inspection system for planar objects, such as large flat plates employed in panel displays, whereby lower resolution defect detection efficiently overlaps and parallels higher resolution defect review and classification stages in which defects are automatically defined and resolved. Although the invention is a valid solution for the more general problem of optically inspecting the surface of a flat article for defects, the invention is particularly useful for detecting pattern defects on large glass plates deposited with integrated-circuits for forming LCD flat panel displays.Type: ApplicationFiled: October 17, 2003Publication date: June 10, 2004Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Publication number: 20040086166Abstract: A concurrent low resolution/high resolution parallel scanning system is provided as an improvement in the scanning process of an inspection system for planar objects, such as large flat plates employed in panel displays, whereby lower resolution defect detection efficiently overlaps and parallels higher resolution defect review and classification stages in which defects are automatically defined and resolved. Although the invention is a valid solution for the more general problem of optically inspecting the surface of a flat article for defects, the invention is particularly useful for detecting pattern defects on large glass plates deposited with integrated-circuits for forming LCD flat panel displays.Type: ApplicationFiled: May 16, 2003Publication date: May 6, 2004Applicant: Photon Dynamics, Inc.Inventors: Adam Weiss, Afsar Saranli
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Patent number: 6633377Abstract: Apparatus and a method for the detection and identification of light diverting and transparent defects with optical properties in a transparent medium. The apparatus has a light source with an aperture stop, a lens system focusing an image of the aperture stop at a plane, and means to pass the transparent medium through said column of light. The apparatus and method provide dark view images of the defects. The apparatus and method may be combined with a viewing area inspection system. The transparent medium may be curved, and especially face plates for cathode ray tubes.Type: GrantFiled: April 20, 2000Date of Patent: October 14, 2003Assignee: Image Processing Systems Inc.Inventors: Adam Weiss, Alexandre Obotnine
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Patent number: 6512239Abstract: Apparatus and a method for the detection and identification of defects in a transparent medium, especially light diverting and transparent defects with optical properties. The apparatus comprises an extended source of illumination, first and second optical recording devices, and a means to pass the transparent medium between the extended source of illumination and the first and second optical recording devices. The first and second optical recording devices are disposed to record images at opposed acute angles from a common location on the transparent medium. The second optical recording device has two sources of laser illumination attached thereto, which are directed at the common location in a spaced apart relationship such that scattered of laser light from surfaces of the transparent medium is recorded by the first optical recording device.Type: GrantFiled: June 27, 2000Date of Patent: January 28, 2003Assignee: Photon Dynamics Canada Inc.Inventors: Adam Weiss, Alexandre Obotnine
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Patent number: 6501546Abstract: An inspection system for the edge of a sheet of glass e.g. automobile glass. The system has at least one laser, with the laser beam directed at the edge of the glass. Light reflected from the edge is recorded e.g. with a camera. The path length from the laser to the glass edge and back to the camera is maintained constant as the glass moves through the apparatus.Type: GrantFiled: May 5, 2000Date of Patent: December 31, 2002Assignee: Photon Dynamics Canada Inc.Inventor: Adam Weiss
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Patent number: 6437357Abstract: An inspection system for a sheet of glass. The system comprises a first laser and a second laser, each of which provide a sheet of light, a cylindrical lens system, and a first light detection system and a second light detection system. The first laser is located at the focal point of the lens system. The second laser is located at a distance from the lens system that is greater than that of the first laser, and off of the axis of the lens system. The first light detection system receives light from the first laser and the second light detection system receives light from the second laser. The inspection system is adapted to position a sheet of glass between the lens system and the detection systems. A method is also described.Type: GrantFiled: October 29, 1999Date of Patent: August 20, 2002Assignee: Photon Dynamics Canada Inc.Inventors: Adam Weiss, Alexandre Obotnine