Abstract: A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.

Abstract: A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.

Abstract: An analog-to-digital converter stage includes: a comparator and logic circuit having first upper and lower unscaled voltage trip points that are different than upper and lower residue voltage trip points; and a switched capacitor circuit. The comparator and logic circuit is configured prior to an initial residue calculation cycle to compare a magnitude of an unscaled input voltage to the first upper and lower unscaled voltage trip points, to generate an initial output bit, and to generate a voltage scaling and gain control signal. The switched capacitor circuit is configured to sample the unscaled input voltage, to receive a reference voltage, and to receive the voltage scaling and gain control signal for selectively controlling a subset of switches of the switched capacitor circuit to scale the unscaled input voltage sample and reference voltage and generate an initial residue voltage during a single operation of the initial residue calculation cycle.

Abstract: An analog-to-digital converter stage includes: a comparator and logic circuit having first upper and lower unscaled voltage trip points that are different than upper and lower residue voltage trip points; and a switched capacitor circuit. The comparator and logic circuit is configured prior to an initial residue calculation cycle to compare a magnitude of an unscaled input voltage to the first upper and lower unscaled voltage trip points, to generate an initial output bit, and to generate a voltage scaling and gain control signal. The switched capacitor circuit is configured to sample the unscaled input voltage, to receive a reference voltage, and to receive the voltage scaling and gain control signal for selectively controlling a subset of switches of the switched capacitor circuit to scale the unscaled input voltage sample and reference voltage and generate an initial residue voltage during a single operation of the initial residue calculation cycle.

Abstract: A sample and hold circuit is provided. The circuit includes a first switch configured to receive an input, a second switch coupled to a second end of the first switch, a first capacitor coupled to the second end of the first switch, a third switch coupled to a second end of the first capacitor, a fourth switch coupled between the second end of the first capacitor and ground, an op-amp having a first input coupled to the second end of the third switch and a second input connected to ground and an output coupled to the second end of the second switch, a fifth switch coupled to a second end of the third switch, a second capacitor coupled between the output of the op-amp and a second end of the fifth switch, and a sixth switch coupled between the second end of the second capacitor and ground.

Abstract: An algorithmic or cyclic data converter uses an RSD stage having a switched capacitor network for efficiently scaling at least one externally supplied reference voltage. A reference voltage is scaled by using capacitor ratios that also function to provide an output voltage used as a residue output of the RSD A/D converter. The residue is used to generate a bit value corresponding to the magnitude of the residue. Two RSD stages cycle back and forth generating a logic value each half clock cycle until the desired bit resolution is achieved. In one form, the RSD stage scales the externally supplied reference voltage only by factors of less than one. In another form, the RSD stage scales the reference voltage by any scaling factor. A reference voltage scaling circuit separate from the RSD stage is avoided.

Abstract: Methods and apparatus are provided for an analog converter. The apparatus comprises a first redundant signed digit (RSD) stage and a configurable block. The configurable block converts to a sample/hold circuit to sample a single ended analog signal. The sampled signal is then scaled, converted to a differential signal and provided to the first RSD stage. The first RSD stage outputs a bit value corresponding to the magnitude of the digital signal. In a next half clock cycle the first RSD stage calculates a residue that is provided to the configurable block. The configurable block is converted to a second redundant signed digit stage and generates a bit value corresponding to the magnitude of the residue provided by the first RSD stage. The first and second RSD stages cycle back and forth generating logic value each half clock cycle until the desired bit resolution is achieved. The configurable block is then converted back to a sample/hold circuit to start another conversion process.

Abstract: A voltage boosting circuit which derives an output voltage than is substantially twice the magnitude of a supply voltage applied thereto. The voltage boosting circuit consists of complementary acting boost circuits each having a pair of switches (42A, 52A; 42B, 52B) connected between an input of the voltage boosting circuit, at which is applied the supply voltage, and an output at which the output voltage is produced. Boost capacitors (48A, 48B) are connected between the respective switches of the complementary boost circuits and the switches of the these circuits are opened and closed out of phase with respect to each other in response to clocking signals being applied thereto such that a boosted output voltage is produced during each half cycle of the clocking signals.

Abstract: A digital controlled oscillator (14) generates an oscillator clock that is phase locked to a reference clock. A control circuit (12) generates a reset signal from the reference clock that sets the edges of the oscillator signal in line with an edge of the reference clock. The reset signal must have correct timing and duration. A course tune detector (16, 18) monitors the oscillator clock and generates course tune control signals (CT) that adjust the reset signal pulse width and the oscillator signal frequency by adding and removing capacitors from the inverters in the control circuit and digital controlled oscillator. A phase comparator (22) compares the reference clock and the oscillator clock. A fine tune detector (20) monitors the phase comparison and generates fine tune control signals (FT) that make fine adjustments to the pulse width of the reset signal and the frequency of the oscillator signal.

Abstract: A digital clock circuit generates a high-speed clock and window pulses substantially centered about transitions of the high-speed clock in one quadrant of an integrated circuit (IC) and routes the high-speed clock and window pulses to other quadrants of the IC where a low-speed clock generator develops a low-speed clock signal from the window pulses. A control circuit checks alignment between the high-speed and low-speed clock signals and adjusts first and second shift registers to control the delay in generating the low-speed clock as necessary to maintain alignment. The first shift register controls the falling edge of the low-speed clock signal and the second shift register controls the rising edge of the low-speed clock signal.

Abstract: A phase lock loop monitors a first digital signal and generates a second digital signal operating substantially at frequency and in-phase with the first digital signal. A programmable divider latches a program integer for providing a latch integer, compares the latch integer to a constant integer, and generates a flag signal having a first state when the latch integer mismatches the constant integer and a second state when the latch integer matches the constant integer. The latch integer is decremented when the flag signal has the first state. The flag signal is delayed in response to first and second clock signals for providing the second digital signal having a frequency determined by the program integer. The first and second digital signals are applied to a lock detection circuit for providing a lock detection signal.

Abstract: A voltage controlled oscillator runs at full speed to generate an output frequency dependent on temperature and process variation. First and second clock signals are generated from the oscillator signal, while third and fourth clock signals are developed in response to an input clock signal. The number of clock signals occurring during a first state of the third clock signal are counted for providing a plurality of output signals also indicative of the temperature and process variation. The plurality of output signals compensate an input signal for the temperature and process variation for providing an output signal.

Abstract: A phase lock loop operates independent of temperature and process variation by digitally loading a VCO until reaching the desired operating frequency. The VCO reaches a high output frequency even under worst case processing by controlling multiple current mirrors to increase inverter switching current without slowing the response of the VCO to changes in loop node voltage. An Initialize-to-VDD circuit sets the loop node voltage to V.sub.DD so that the load control circuit need only increase loading to slow down the VCO to the desired operating frequency. A frequency range detector monitors the output frequency of the VCO and passes control signals to a load control circuit to activate digital loads and slow down the VCO to the desired operating frequency.

Abstract: A charge pump in a phase lock loop equalizes the charge and discharge currents flowing into the filter capacitor independent of the loop node voltage for providing a linear VCO output frequency. The potential at the output of the charge pump determines whether the charging/discharging current is decreased or increased. An active up control signal to increase VCO output frequency and a low level potential at the output of the charge pump limits the charging current to the loop filter while increasing the discharge current. An active down control signal to decrease the VCO output frequency and a high potential at the output of the charge pump limits the discharging current while increasing the charge current. The voltage change at the output of the charge pump in response to the up control signal is made equal to the voltage change during the down control signal for providing equal charge and discharge currents to the loop filter independent of the loop voltage.

Abstract: A phase lock loop monitors a first digital signal and generates a second digital signal operating substantially at frequency and in-phase with the first digital signal. The first and second digital signals are applied to a lock detection circuit for providing a lock detection signal when the first and second digital input signals have a first logic state at a first transition of a control signal and a second logic state at a second transition of the control signal. One false lock triggers an out-of-phase status indicator. The lock detection signal must return to a valid state for a predetermined number of periods before the phase lock status indicates a valid lock condition. The first and second digital input signals may operate with a non-50% duty cycle.

Abstract: A phase lock loop operates independent of temperature and process variation by digitally loading a VCO until reaching the desired operating frequency. The VCO reaches a high output frequency even under worst case processing by controlling multiple current mirrors to increase inverter switching current without slowing the response of the VCO to changes in loop node voltage. An Initialize-to-VDD circuit sets the loop node voltage to V.sub.DD so that the load control circuit need only increase loading to slow down the VCO to the desired operating frequency. A frequency range detector monitors the output frequency of the VCO and passes control signals to a load control circuit to activate digital loads and slow down the VCO to the desired operating frequency.

Abstract: A phase lock loop monitors the frequency of redundant input clock signals and switches back and forth therebetween should one or the other become invalid. Thus, the PLL may continue normal operation even with a failure of one input clock signal. If both the input clock signals fail, an internal reference signal maintains the PLL at a nominal operating frequency until one of the input clock signals is restored whereby the loop can quickly re-establish phase lock. To determined validity, the input clock signals are sampled and stored by the reference signal in a predetermined manner. The input clock signal is valid if the samples of the input clock signal each have the same logic state after the sampling period; otherwise, the input clock signal is invalid if the samples of the input clock signal have at least one different logic state after the sampling period.

Abstract: A phase lock loop monitors a first digital signal and generates a second digital signal operating substantially at frequency and in-phase with the first digital signal. The first and second digital signal are applied to a lock detection circuit for generating a first digital output signal having a first logic state from a mutually exclusive combination of the first and second digital signals. The first logic state of the first digital output signal is compared with a time slot window formed by a control signal for generating a true lock detection signal when the first logic state of the first digital output signal occurs within the time slot window and a false lock detection signal when the first logic state of the first digital output signal occurs outside the time slot window.

Abstract: A phase lock loop operates independent of temperature and process variation by digitally loading a VCO until reaching the desired operating frequency. The VCO reaches a high output frequency even under worst case processing by controlling multiple current mirrors to increase inverter switching current without slowing the response of the VCO to changes in loop node voltage. An Initialize-to-VDD circuit sets the loop node voltage to V.sub.DD so that the load control circuit need only increase loading to slow down the VCO to the desired operating frequency. A frequency range detector monitors the output frequency of the VCO and passes control signals to a load control circuit to activate digital loads and slow down the VCO to the desired operating frequency.

Abstract: A power on reset circuit uses a first inverter with hysteresis operating in response to a first power supply potential to develop a first reset signal when the first power supply potential is greater than a first predetermined threshold. A second inverter with hysteresis also operates in response to the first power supply potential for developing a second reset signal when the first power supply potential is greater than a second predetermined threshold. The first reset signal disables the second inverter until the first power supply potential reaches the first predetermined threshold. A delay circuit delays the second reset signal to ensure the first power supply potential is fully operational before indicating a ready condition.