Abstract: A photoelectric conversion device which is a semiconductor device comprising a first conductive layer having a first conductivity type; a second conductive layer formed on the first conductive layer and having a second conductivity type; and a photosensitizing layer formed between the first conductive layer and the second conductive layer, wherein charge carriers generated by photoelectric conversion in the photosensitizing layer are freely movable to at least one of the first conductive layer and the second conductive layer.

Abstract: A photoelectric conversion device which inhibits characteristic degradation caused by crystal defects, and an inspection method for crystal defects in photoelectric conversion devices. The photoelectric conversion device is provided with an active layer, and a deactivator contained in the active layer.

Abstract: A solar cell is provided with: a first conductivity layer comprising a first conductivity type material; a sensitizer layer formed on the first conductivity layer; and a second conductivity layer comprising a second conductivity type material and formed on the sensitizer layer. At least one of the first conductivity layer, the second conductivity layer and the sensitizer layer has a first semiconductor of a first film thickness and a second semiconductor of a second film thickness.

Abstract: A microscope system improves the operability of a user in performing a microscope observation. The microscope system attains the improvement by including: a microscope apparatus including a plurality of drive units; a display unit for displaying an operation screen for operation of the microscope apparatus; a pointing device for inputting by a pointer an operation instruction to the microscope apparatus on the operation screen; and a control unit for switching the drive units depending on the position of the pointer on the operation screen, and controlling the operation of the switched drive units depending on the operation of the pointing device.

Abstract: Disclosed is a photoelectric conversion device which inhibits characteristic degradation caused by crystal defects, and an inspection method for crystal defects in photoelectric conversion devices. The photoelectric conversion device is provided with an active layer, and a deactivator contained in the active layer.

Abstract: A solar cell is provided with: a first conductivity layer comprising a first conductivity type material; a sensitizer layer formed on the first conductivity layer; and a second conductivity layer comprising a second conductivity type material and formed on the sensitizer layer. At least one of the first conductivity layer, the second conductivity layer and the sensitizer layer has a first semiconductor of a first film thickness and a second semiconductor of a second film thickness.

Abstract: Disclosed is a photoelectric conversion device which inhibits characteristic degradation caused by crystal defects, and an inspection method for crystal defects in photoelectric conversion devices. The photoelectric conversion device is provided with an active layer, and a deactivator contained in the active layer.

Abstract: An object of the present invention is to provide a predetermined site luminescence measuring method and a predetermined site luminescence measuring apparatus, which allow for determining whether, when the luminescence from the predetermined site in live samples is measured, a photoprotein is localized at the predetermined site in the same ones as the samples.

Abstract: A method of producing a zinc oxide-based semiconductor crystal, including: introducing at least zinc and oxygen on a surface of a substrate; and growing a zinc oxide-based semiconductor crystal on the substrate, wherein a total or partial portion of the zinc is ionized in a vacuum atmosphere of 1×10?4 Torr or less and is introduced to the surface of the substrate to grow the ZnO based semiconductor crystal. As a result, it is possible to provide a method of producing a zinc oxide based semiconductor crystal capable of growing a zinc oxide semiconductor crystal having excellent surface flatness and crystallinity and including an extremely small amount of impurities at a high growth rate.

Abstract: A photoelectric conversion device which is a semiconductor device comprising a first conductive layer having a first conductivity type; a second conductive layer formed on the first conductive layer and having a second conductivity type; and a photosensitizing layer formed between the first conductive layer and the second conductive layer, wherein charge carriers generated by photoelectric conversion in the photosensitizing layer are freely movable to at least one of the first conductive layer and the second conductive layer.

Abstract: A microscope includes an illuminating unit that includes an excitation light source emitting an excitation light, and a phosphor receiving the excitation light and emitting illumination light in a specific wavelength range. The illuminating unit illuminates a specimen with the illumination light. The microscope also includes an observation unit for observing the specimen illuminated by the illuminating unit.

Abstract: An object of the present invention is to provide a predetermined site luminescence measuring method and a predetermined site luminescence measuring apparatus, which allow for determining whether, when the luminescence from the predetermined site in live samples is measured, a photoprotein is localized at the predetermined site in the same ones as the samples.

Abstract: An object of the present invention is to provide a predetermined site luminescence measuring method and a predetermined site luminescence measuring apparatus, which allow for determining whether, when the luminescence from the predetermined site in live samples is measured, a photoprotein is localized at the predetermined site in the same ones as the samples.

Abstract: A microscope includes an illuminating unit that includes an excitation light source emitting an excitation light, and a phosphor receiving the excitation light and emitting illumination light in a specific wavelength range. The illuminating unit illuminates a specimen with the illumination light. The microscope also includes an observation unit for observing the specimen illuminated by the illuminating unit.

Abstract: A microscope system improves the operability of a user in performing a microscope observation. The microscope system attains the improvement by including: a microscope apparatus including a plurality of drive units; a display unit for displaying an operation screen for operation of the microscope apparatus; a pointing device for inputting by a pointer an operation instruction to the microscope apparatus on the operation screen; and a control unit for switching the drive units depending on the position of the pointer on the operation screen, and controlling the operation of the switched drive units depending on the operation of the pointing device.

Abstract: The present invention provides a control method for a microscope apparatus, comprising: a first step for recognizing a type of a specimen retention member retaining a specimen; a second step for obtaining a first image including the whole image of a specimen retention member showing a picture of the entirety of the specimen retention member and an image of the specimen, and obtaining a second image including only the whole image of the specimen retention member in accordance with the type of the specimen retention member; and a third step for obtaining a macro observation image with a self fluorescence removed except for the specimen based on the first image and second image.

Abstract: This is an optical apparatus provided with an objective with a correction collar for correcting aberration due to an error in the optical thickness of a piece of cover glass comprising a focusing mechanism for changing a distance between the objective and the sample, an optical thickness detecting unit for detecting the optical thickness of the cover glass, an operating unit for calculating the amount of aberration correction, based on the optical thickness of the cover glass detected by the optical thickness detecting unit, a driver unit for driving a correction collar, based on the amount of aberration correction calculated by the operating unit and an imaging sensor for forming the image of the sample that passes through the objective.

Abstract: An object of the present invention is to provide a predetermined site luminescence measuring method and a predetermined site luminescence measuring apparatus, which allow for determining whether, when the luminescence from the predetermined site in live samples is measured, a photoprotein is localized at the predetermined site in the same ones as the samples.

Abstract: A method of producing a zinc oxide-based semiconductor crystal, including: introducing at least zinc and oxygen on a surface of a substrate; and growing a zinc oxide-based semiconductor crystal on the substrate, wherein a total or partial portion of the zinc is ionized in a vacuum atmosphere of 1×10?4 Torr or less and is introduced to the surface of the substrate to grow the ZnO based semiconductor crystal. As a result, it is possible to provide a method of producing a zinc oxide based semiconductor crystal capable of growing a zinc oxide semiconductor crystal having excellent surface flatness and crystallinity and including an extremely small amount of impurities at a high growth rate.

Abstract: This is an optical apparatus provided with an objective with a correction collar for correcting aberration due to an error in the optical thickness of a piece of cover glass comprising a focusing mechanism for changing a distance between the objective and the sample, an optical thickness detecting unit for detecting the optical thickness of the cover glass, an operating unit for calculating the amount of aberration correction, based on the optical thickness of the cover glass detected by the optical thickness detecting unit, a driver unit for driving a correction collar, based on the amount of aberration correction calculated by the operating unit and an imaging sensor for forming the image of the sample that passes through the objective.