Abstract: A traveling vehicle includes a mechanical brake link mechanism to transmit operation of a brake pedal to a brake device housed in a case and to control brakes of right and left rear wheels. The brake link mechanism includes a pair of brake rods extending in a front-back direction at sides of the case. A guard assembly includes a pair of guards extending in the front-back direction below the pair of brake rods. The pair of brake rods overlaps the pair of guards in a vertical direction. In a side view of the traveling vehicle, the pair of brake rods includes a higher portion positioned above a lower surface of the case to be distanced by a predetermined interval or more and positioned above the lower surface of the case, and a lower portion positioned below the higher portion. The pair of guards overlaps at least all of the lower portions in the vertical direction.

Abstract: A sensor device includes: a holder having an insertion hole; a probe having a proximal end to be inserted in the insertion hole and having a portion to be inserted in the insertion hole, a diameter of the portion of the probe to be inserted in the insertion hole being smaller than a hole diameter of the insertion hole; piezoelectric elements housed in the holder, configured to be brought into contact with the proximal end of the probe directly or indirectly, a vibration of the probe acting on the piezoelectric elements; an O-ring (prevention member) disposed in the insertion hole and holding the probe to prevent the probe from contacting the holder, the probe being configured such that a tip of the probe is pushed against a measurement object to detect a vibration of the measurement object.

Abstract: A sensor device includes: a holder having an insertion hole; a probe having a proximal end to be inserted in the insertion hole and having a portion to be inserted in the insertion hole, a diameter of the portion of the probe to be inserted in the insertion hole being smaller than a hole diameter of the insertion hole; piezoelectric elements housed in the holder, configured to be brought into contact with the proximal end of the probe directly or indirectly, a vibration of the probe acting on the piezoelectric elements; an O-ring (prevention member) disposed in the insertion hole and holding the probe to prevent the probe from contacting the holder, the probe being configured such that a tip of the probe is pushed against a measurement object to detect a vibration of the measurement object.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A data processing device includes a load circuit including a central processing unit and operated by supplied electric power, a step-down power supply circuit stepping down an external power supply voltage and including an output node coupled to the load circuit, the step-down power supply circuit including a first step-down unit stepping down the external power supply voltage, and a bias current control circuit controlling a magnitude of bias current flowing through an auxiliary path from the output node to a ground, the auxiliary path is separate from a path to the load circuit, and a control circuit increasing the magnitude of the bias current, prior to a change of an operation state of the load circuit by which a relatively large change occurs to an amount of current consumed by the load circuit.

Abstract: The disclosed invention is intended to prevent malfunction of an internal circuit because of unwanted power supply switching caused by a noise during operation of a semiconductor device powered by a backup power supply, while eliminating wasteful consumption of the backup power supply. A first switching transition time after coupling the main power supply terminal to the internal power supply node until decoupling the backup power supply terminal from the internal power supply node is made longer than a second switching transition time after coupling the backup power supply terminal to the internal power supply node until decoupling the main power supply terminal from the internal power supply node.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: The disclosed invention is intended to prevent malfunction of an internal circuit because of unwanted power supply switching caused by a noise during operation of a semiconductor device powered by a backup power supply, while eliminating wasteful consumption of the backup power supply. A first switching transition time after coupling the main power supply terminal to the internal power supply node until decoupling the backup power supply terminal from the internal power supply node is made longer than a second switching transition time after coupling the backup power supply terminal to the internal power supply node until decoupling the main power supply terminal from the internal power supply node.

Abstract: The disclosed invention is intended to prevent malfunction of an internal circuit because of unwanted power supply switching caused by a noise during operation of a semiconductor device powered by a backup power supply, while eliminating wasteful consumption of the backup power supply. A first switching transition time after coupling the main power supply terminal to the internal power supply node until decoupling the backup power supply terminal from the internal power supply node is made longer than a second switching transition time after coupling the backup power supply terminal to the internal power supply node until decoupling the main power supply terminal from the internal power supply node.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A data processing device includes a load circuit including a central processing unit and operated by supplied electric power, a step-down power supply circuit stepping down an external power supply voltage and including an output node coupled to the load circuit, the step-down power supply circuit including a first step-down unit stepping down the external power supply voltage, and a bias current control circuit controlling a magnitude of bias current flowing through an auxiliary path from the output node to a ground, the auxiliary path is separate from a path to the load circuit, and a control circuit increasing the magnitude of the bias current, prior to a change of an operation state of the load circuit by which a relatively large change occurs to an amount of current consumed by the load circuit.

Abstract: A step down unit steps down an external power supply voltage Vcc. A bias current control circuit controls the magnitude of bias current flowing through an auxiliary path connecting an output node and the ground. A system controller increases the magnitude of the bias current, prior to a change of the operation state of a load circuit by which a relatively large change occurs to the amount of current consumed by the load circuit including a central processing unit.

Abstract: The disclosed invention is intended to prevent malfunction of an internal circuit because of unwanted power supply switching caused by a noise during operation of a semiconductor device powered by a backup power supply, while eliminating wasteful consumption of the backup power supply. A first switching transition time after coupling the main power supply terminal to the internal power supply node until decoupling the backup power supply terminal from the internal power supply node is made longer than a second switching transition time after coupling the backup power supply terminal to the internal power supply node until decoupling the main power supply terminal from the internal power supply node.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.

Abstract: There is a need to provide a technology that shortens a time period from a point to start an external power supply for a microcontroller to a point to start operating a logic circuit. A stable voltage supply circuit of a semiconductor circuit accepts an external power supply VCC and supplies a VDD line with one of a power supply voltage to cause a stable output voltage and a power supply voltage to cause an unstable output voltage and fast start. At startup, the semiconductor circuit accepts an external power supply. The semiconductor circuit raises a power supply voltage to cause a stable output voltage and supplies a logic portion initialization circuit with an unstable power supply voltage to fast start, and initializes a VDD operation circuit. When the output voltage is stabilized, the semiconductor circuit changes a power supply voltage supplied to the VDD line and starts operating the VDD operation circuit.