Patents by Inventor Akira Omachi

Akira Omachi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11560288
    Abstract: To make it possible to comprehensively predict the movement of people by associating an elevator control system in a facility such as a building and an external system other than this system with each other and thereby provide a new service that has not existed before.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: January 24, 2023
    Assignee: Hitachi, Ltd.
    Inventors: Takahiro Hatori, Masayasu Fujiwara, Akira Omachi, Takamichi Hoshino, Satoru Toriyabe, Manabu Kato, Atsuya Fujino, Wataru Toriumi
  • Publication number: 20200299099
    Abstract: To make it possible to comprehensively predict the movement of people by associating an elevator control system in a facility such as a building and an external system other than this system with each other and thereby provide a new service that has not existed before.
    Type: Application
    Filed: October 30, 2017
    Publication date: September 24, 2020
    Inventors: Takahiro HATORI, Masayasu FUJIWARA, Akira OMACHI, Takamichi HOSHINO, Satoru TORIYABE, Manabu KATO, Atsuya FUJINO, Wataru TORIUMI
  • Patent number: 10460187
    Abstract: A biometric authentication device including a housing, a light source unit that is installed on an upper surface of the housing and includes a light source, and an opening that is provided in the upper surface of the housing and located below the light source, and an imaging unit that is disposed inside the housing is disclosed. In the device, an optical axis of the light source intersects with a longitudinal direction of the housing, and the imaging unit images a user's biometric feature irradiated with an irradiation light from the light source through the opening.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: October 29, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Masaru Oda, Akira Omachi, Yoshihiro Iwama, Yusuke Daimon, Daisuke Matsubara, Hiroko Hasebe, Akio Nagasaka, Yusuke Matsuda, Naoto Miura
  • Publication number: 20180247142
    Abstract: A biometric authentication device including a housing, a light source unit that is installed on an upper surface of the housing and includes a light source, and an opening that is provided in the upper surface of the housing and located below the light source, and an imaging unit that is disposed inside the housing is disclosed. In the device, an optical axis of the light source intersects with a longitudinal direction of the housing, and the imaging unit images a user's biometric feature irradiated with an irradiation light from the light source through the opening.
    Type: Application
    Filed: February 18, 2015
    Publication date: August 30, 2018
    Inventors: Masaru ODA, Akira OMACHI, Yoshihiro IWAMA, Yusuke DAIMON, Daisuke MATSUBARA, Hiroko HASEBE, Akio NAGASAKA, Yusuke MATSUDA, Naoto MIURA
  • Patent number: 9196277
    Abstract: A terminal includes a terminal wiring part extending from a flexure and having an insulating layer and a wiring layer formed on the insulating layer, a terminal main part formed at a front end of the terminal wiring part and connected to a piezoelectric element arranged to face the terminal main part, and a terminal bender that is made of a supportive metal layer, is arranged along a part of the terminal wiring part in an extending direction thereof, and is plastically deformed to form a bend in the part of the terminal wiring part so as to bring the terminal main part closer to the piezoelectric element.
    Type: Grant
    Filed: April 3, 2013
    Date of Patent: November 24, 2015
    Assignee: NHK Spring Co., Ltd.
    Inventor: Akira Omachi
  • Patent number: 8809782
    Abstract: A scanning electron microscope includes a main scanning electron microscope unit having an electron optical column and a sample chamber, a controller over the main scanning electron microscope unit, a single housing that houses both the main scanning electron microscope unit and the controller, and a bottom plate disposed under the single housing, the main scanning electron microscope unit and the controller. A first leg member is attached to a bottom face of the bottom plate on a side of the controller with a first opening hole provided through the bottom plate on a side of the main scanning electron microscope unit, and a damper is fixed to a bottom face of the main scanning electron microscope unit and disposed through the first opening hole.
    Type: Grant
    Filed: July 20, 2010
    Date of Patent: August 19, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito, Mitsuru Onuma, Akira Omachi
  • Publication number: 20130286512
    Abstract: A terminal includes a terminal wiring part extending from a flexure and having an insulating layer and a wiring layer formed on the insulating layer, a terminal main part formed at a front end of the terminal wiring part and connected to a piezoelectric element arranged to face the terminal main part, and a terminal bender that is made of a supportive metal layer, is arranged along a part of the terminal wiring part in an extending direction thereof, and is plastically deformed to form a bend in the part of the terminal wiring part so as to bring the terminal main part closer to the piezoelectric element.
    Type: Application
    Filed: April 3, 2013
    Publication date: October 31, 2013
    Applicant: NHK Spring Co., Ltd.
    Inventor: Akira OMACHI
  • Publication number: 20120127299
    Abstract: A scanning electron microscope includes a main scanning electron microscope unit having an electron optical column and a sample chamber, a controller over the main scanning electron microscope unit, a single housing that houses both the main scanning electron microscope unit and the controller, and a bottom plate disposed under the single housing, the main scanning electron microscope unit and the controller. A first leg member is attached to a bottom face of the bottom plate on a side of the controller with a first opening hole provided through the bottom plate on a side of the main scanning electron microscope unit, and a damper is fixed to a bottom face of the main scanning electron microscope unit and disposed through the first opening hole.
    Type: Application
    Filed: July 20, 2010
    Publication date: May 24, 2012
    Inventors: Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito, Mitsuru Onuma, Akira Omachi
  • Patent number: D646797
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: October 11, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroyuki Noda, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D653351
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: January 31, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D653765
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: February 7, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroshi Watanabe, Masanori Akutsu, Shigeki Matsubara
  • Patent number: D653766
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: February 7, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D654183
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: February 14, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroshi Watanabe, Masanori Akutsu, Shigeki Matsubara
  • Patent number: D654184
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: February 14, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroshi Watanabe, Masanori Akutsu, Shigeki Matsubara
  • Patent number: D655422
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 6, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D655822
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 13, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D655823
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 13, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D658776
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: May 1, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D663040
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: July 3, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroshi Watanabe, Masanori Akutsu, Shigeki Matsubara
  • Patent number: D687475
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: August 6, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Junichi Katane, Mitsuo Akatsu, Hiroyuki Komuro, Tomoyasu Hirashima