Electron microscope

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines shown are for illustrative purpose and form no part of the claimed design.

Claims

We claim the ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
3297284 January 1967 Pellerin
D223669 May 1972 Nishino
3814356 June 1974 Coleman et al.
3835320 September 1974 Helwig
4523094 June 11, 1985 Rossow
D303267 September 5, 1989 Takahashi et al.
D332616 January 19, 1993 Hashimoto et al.
5350921 September 27, 1994 Aoyama et al.
D381031 July 15, 1997 Miyata et al.
5864138 January 26, 1999 Miyata et al.
6084239 July 4, 2000 Miyata et al.
D623211 September 7, 2010 Oonuma et al.
D625749 October 19, 2010 Oonuma et al.
D626579 November 2, 2010 Oonuma et al.
D632323 February 8, 2011 Oonuma et al.
D633537 March 1, 2011 Oonuma et al.
D633538 March 1, 2011 Oonuma et al.
D635167 March 29, 2011 Oonuma et al.
D635168 March 29, 2011 Oonuma et al.
D636005 April 12, 2011 Oonuma et al.
D638046 May 17, 2011 Noda et al.
D644258 August 30, 2011 Noda et al.
Patent History
Patent number: D687475
Type: Grant
Filed: Sep 12, 2012
Date of Patent: Aug 6, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Junichi Katane (Naka), Mitsuo Akatsu (Hitachinaka), Hiroyuki Komuro (Hitachinaka), Tomoyasu Hirashima (Yokohama)
Primary Examiner: Paula Greene
Application Number: 29/431,888
Classifications
Current U.S. Class: Microscope (D16/131)