Patents by Inventor Akishige Ito
Akishige Ito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10298174Abstract: A photoelectric conversion element evaluation apparatus includes: a probe light source that irradiates a photoelectric conversion element as the object of measurement with probe light; a pump light source that irradiates the photoelectric conversion element being irradiated with the probe light with pulsed pump light; and a light receiving element that detects time dependency of a change in an amount of the probe light obtained from the photoelectric conversion element.Type: GrantFiled: January 11, 2016Date of Patent: May 21, 2019Assignee: Yokogawa Electric CorporationInventors: Akishige Ito, Masato Ishikawa, Takashi Tsubota, Yoshinori Matsumoto
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Patent number: 9541493Abstract: An inspection apparatus using polarized lights according to one aspect of the present invention includes an irradiator configured to irradiate an inspection target with a first plurality of lights. The first plurality of lights have different polarization states and different wavelengths from each other. The inspection apparatus further includes a light receiver configured to perform a wavelength demultiplexing of a second plurality of lights obtained from the inspection target to generate a third plurality of lights, to separately receive the third plurality of lights, and to output at least one light-receiving signal associated with the third plurality of lights and a processor configured to calculate at least one of an ellipse azimuth, a degree of polarization, and a polarization component intensity using the light-receiving signal and to determine whether the inspection target is defective or non-defective.Type: GrantFiled: May 29, 2015Date of Patent: January 10, 2017Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Yoshinori Matsumoto, Takashi Tsubota, Toyoaki Hamaguchi, Akishige Ito
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Publication number: 20160248375Abstract: A photoelectric conversion element evaluation apparatus includes: a probe light source that irradiates a photoelectric conversion element as the object of measurement with probe light; a pump light source that irradiates the photoelectric conversion element being irradiated with the probe light with pulsed pump light; and a light receiving element that detects time dependency of a change in an amount of the probe light obtained from the photoelectric conversion element.Type: ApplicationFiled: January 11, 2016Publication date: August 25, 2016Applicant: Yokogawa Electric CorporationInventors: Akishige ITO, Masato ISHIKAWA, Takashi TSUBOTA, Yoshinori MATSUMOTO
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Publication number: 20150346083Abstract: An inspection apparatus using polarized lights according to one aspect of the present invention includes an irradiator configured to irradiate an inspection target with a first plurality of lights. The first plurality of lights have different polarization states and different wavelengths from each other. The inspection apparatus further includes a light receiver configured to perform a wavelength demultiplexing of a second plurality of lights obtained from the inspection target to generate a third plurality of lights, to separately receive the third plurality of lights, and to output at least one light-receiving signal associated with the second plurality of lights and a processor configured to calculate at least one of an ellipse azimuth, a degree of polarization, and a polarization component intensity using the light-receiving signal and to determine whether the inspection target is defective or non-defective.Type: ApplicationFiled: May 29, 2015Publication date: December 3, 2015Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Yoshinori MATSUMOTO, Takashi TSUBOTA, Toyoaki HAMAGUCHI, Akishige ITO
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Publication number: 20090022184Abstract: An improvement is made to a wavelength tunable light source of an external resonator type for selecting a wavelength of light from a semiconductor laser using a diffraction grating. The device has a prism provided between the semiconductor laser and the diffraction grating for enlarging the beam shape of the light from the semiconductor laser in the groove arrangement direction of the diffraction grating, emitting the light to the diffraction grating, and reflecting diffracted light from the diffraction grating to provide output light.Type: ApplicationFiled: June 26, 2008Publication date: January 22, 2009Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Akishige ITO, Keisuke ASAMI, Yasuyuki SUZUKI
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Patent number: 6624644Abstract: An electro-optic probe has a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic or magneto-optic element provided with a reflection film on an end surface thereof, a separator provided between the laser diode and electro-optic or magneto-optic element which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film and two photodiodes which transform the beam reflected by the separator. A member of weak dielectric material, such as a glass plate, overlies the electro-optic or magneto-optic element at the end of the probe to protect the element, or the element is at the end of the probe and is exposed.Type: GrantFiled: July 2, 2001Date of Patent: September 23, 2003Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Sanjay Gupta, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi
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Patent number: 6507014Abstract: The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.Type: GrantFiled: February 22, 2002Date of Patent: January 14, 2003Assignees: Ando Electric Co. Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6429669Abstract: In order to maintain accuracy of measurement, a temperature-insensitive electro-optic probe has a laser diode provided to emit a laser beam based on a control signal of an oscilloscope body, a collimator lens provided to convert the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with the optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side, an isolator provided between the collimator lens and the electro-optic element, and adapted to transmit the laser beam emitted from the laser diode, in order to separate a light reflected by the reflective coating from the laser beam, a photodiode provided to convert the reflected light separated by the isolator into an electrical signal, a temperature detection section arranged to be in contact with optical components consisting the isolator, and to detect the temperature of the optical components and output the resType: GrantFiled: July 20, 2000Date of Patent: August 6, 2002Assignee: Ando Electric Co., Ltd.Inventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi
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Publication number: 20020092975Abstract: The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.Type: ApplicationFiled: February 22, 2002Publication date: July 18, 2002Inventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6410906Abstract: An electro-optic probe is provided which is able to prevent unnecessary reflected light from optical components in the electro-optic probe from entering photodiodes. The optical components which constitutes an isolator 13 are disposed inclining from an optical path of a parallel light emitted from a collimating lens 8, such that the unnecessary reflected light beams from these optical component surfaces are not incident to the photodiodes 10 and 11. The inclination angle of these optical components are set within a range from an angle formed by an optical path from said optical component to a light receiving element in said photodiode, and the diameter of said light receiving element to an angle allowable for the optical component to maintain the transmittance thereof.Type: GrantFiled: February 8, 2000Date of Patent: June 25, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and TelephoneInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6407561Abstract: A probe for an electro-optic sampling oscilloscope is provided, capable of obtaining an improved accuracy in measurement of the test measuring signals by controlling a temperature of an electro-optic element so as to be maintained at a constant such that the refractive index of the electro-optic element does not change due to the temperature change. The probe for the electro-optic sampling oscilloscope comprises a reflecting film at one end and a metal pin provided on the surface of the reflecting film such that the optical property of the electro-optic film changes according to an electric field applied through the metal pin.Type: GrantFiled: May 25, 2000Date of Patent: June 18, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6369562Abstract: An electro-optical probe used for an oscilloscope (e.g., electro-optic sampling oscilloscope) is mainly constructed by a probe head and a probe unit. The probe head contains a metal pin and an electro-optical element having a reflector at its terminal surface. The probe unit contains a reduced number of optical parts, which are arranged such that an optical axis of incoming beams of the electro-optical element differs from a optical axis of outgoing beams of the electro-optical element. That is, laser beams output form a laser diode are subjected to convergence by a converging lens to produce converged beams, which are incident on the electro-optical element as its incoming beams. The incoming beams are subjected to reflection by the reflector to produce reflected beams, which are output from the electro-optical element as its outgoing beams. Then, the reflected beams are converted to parallel beams by a collimator lens, or they are converged by a converging lens.Type: GrantFiled: November 23, 1999Date of Patent: April 9, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6348787Abstract: A probe for an electrooptic sampling oscilloscope in which an electric field generated by a measured field is coupled with an electrooptic crystal. A beam is incident on this electrooptic crystal, and by the polarization state of the incident beam, the form of the measured signal is measured. The electrooptic element is supported form the end terminal side of the probe body by a probe head member that serves as the end terminal of the probe body. An insertion hole is formed from the outside up to the reflecting film on the probe head member. One end thereof is in contact with a reflecting film, the other end thereof is inserted so as to protrude from the probe head member, and at the same time, the external radial diameter of the insertion hole is formed so as to be large compared to the radial dimension of the reflected film.Type: GrantFiled: September 30, 1999Date of Patent: February 19, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Publication number: 20020011830Abstract: An electro-optical probe used for an oscilloscope (e.g., electro-optic sampling oscilloscope) is mainly constructed by a probe head and a probe unit. The probe head contains a metal pin and an electro-optical element having a reflector at its terminal surface. The probe unit contains a reduced number of optical parts, which are arranged such that an optical axis of incoming beams of the electro-optical element differs from a optical axis of outgoing beams of the electro-optical element. That is, laser beams output form a laser diode are subjected to convergence by a converging lens to produce converged beams, which are incident on the electro-optical element as its incoming beams. The incoming beams are subjected to reflection by the reflector to produce reflected beams, which are output from the electro-optical element as its outgoing beams. Then, the reflected beams are converted to parallel beams by a collimator lens, or they are converged by a converging lens.Type: ApplicationFiled: November 23, 1999Publication date: January 31, 2002Inventors: AKISHIGE ITO, KATSUSHI OHTA, TOSHIYUKI YAGI, MITSURU SHINAGAWA, TADAO NAGATSUMA, JUNZO YAMADA
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Patent number: 6342783Abstract: An electrooptic probe which can facilitate replacement of a metallic pin. A probe head constituting a tip end portion of a probe body including a head body for retaining an electrooptic element and a tip member detachably provided on the head body for retaining the metallic pin.Type: GrantFiled: October 8, 1999Date of Patent: January 29, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Publication number: 20020008533Abstract: The electro-optic probe of the present invention comprises a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic element, provided with a reflection film on the end surface thereof, a separator provided between the laser diode and electro-optic element, which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film, two photodiodes which transform the beam reflected by the separator, and a glass plate used for protecting the electro-optic element.Type: ApplicationFiled: July 2, 2001Publication date: January 24, 2002Applicant: ANDO ELECTRIC CO., LTDInventors: Akishige Ito, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Sanjay Gupta, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi
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Patent number: 6337565Abstract: An electro-optic probe having a laser diode for generating a laser beam based on a control signal from an oscilloscope body; a collimator lens for making the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side; an isolator provided between the collimator lens and the electro-optic element, which passes a laser beam generated by the laser diode and isolates a reflected beam which is reflected by the reflective coating; and photodiodes which convert the reflected beam isolated by the isolator into electrical signals. The electro-optic element is integrally affixed to a probe head which is rotatable with respect to a probe body on which the probe head is mounted.Type: GrantFiled: March 7, 2000Date of Patent: January 8, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6297650Abstract: The present invention relates to an electrooptic probe that couples an electrical field generated by a measured signal and an electrooptic crystal, makes light incident on this electrooptic crystal, and measures the waveform of the measured signal by the state of the polarization of the incident light. Here, in the probe body 22, the probe head 23 and the supporting member 44 positioned between the end terminal 22a and the part that encloses the laser diode 25 and the photodiodes 38 and 39 are formed by an insulating body (polyacetal resin). Furthermore, the photodiodes 38 and 39 and the laser diode 25 are covered by electromagnetic shield members 41 and 42 that are separated from each other.Type: GrantFiled: August 16, 1999Date of Patent: October 2, 2001Assignees: Ando Electric Co., LTD, Nippon Telegraph & Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Publication number: 20010022340Abstract: Disclosed is an electro-optic probe which comprises a laser diode for emitting a laser beam based on a control signal from a main body of a measuring unit; an electro-optic element having a reflection film on an end face; first isolators, provided between the laser diode and the electro-optic element, for passing the laser beam emitted from the laser diode and separating reflected light of the laser beam reflected by the reflection film; two photodiodes for converting the reflected light separated by the first isolator into electric signals; and a second isolator provided on an optical path which connects the photodiodes to the first isolator.Type: ApplicationFiled: December 18, 2000Publication date: September 20, 2001Inventors: Akishige Ito, Katsushi Ohta, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi, Kazuhide Ohno, Jin Yoshito
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Patent number: 6288531Abstract: An electro-optic probe is provided which is capable of maintaining the contact pressure of the metal pin on the test object at a constant and capable of protecting the safety of the electro-optic element during measurement. The electro-optic probe has a probe head which is attached to the probe body such that a relative position of the probe head in the direction of the optical path can be elastically regulated by a spring disposed between the probe head and the probe body.Type: GrantFiled: January 31, 2000Date of Patent: September 11, 2001Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada