Patents by Inventor Alan Philips
Alan Philips has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11982236Abstract: A titanium-based component having a high heat capacity surface. The high heat capacity surface prevents or inhibits titanium fires. The component is titanium-based, forming the substrate, and includes a high heat capacity surface overlying the titanium substrate. A diffusion barrier is intermediate the titanium-based substrate and the high heat capacity surface. The diffusion barrier is non-reactive with both the titanium-based substrate and the high heat capacity surface. The system eliminates the formation of detrimental phases due to diffusion between the applied high heat capacity surface and the titanium substrate. The high heat capacity material has a coefficient of thermal expansion compatible with the coefficient of thermal expansion of the titanium-based substrate.Type: GrantFiled: December 22, 2017Date of Patent: May 14, 2024Assignee: General Electric CompanyInventors: Alan Glenn Turner, Andrew Philip Woodfield, Leonardo Ajdelsztajn, Laura Cerully Dial
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Patent number: 11902665Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.Type: GrantFiled: January 26, 2022Date of Patent: February 13, 2024Assignee: Protochips, Inc.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
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Publication number: 20230418863Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.Type: ApplicationFiled: September 11, 2023Publication date: December 28, 2023Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
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Patent number: 11755639Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.Type: GrantFiled: September 12, 2022Date of Patent: September 12, 2023Assignee: PROTOCHIPS, INC.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
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Publication number: 20230049691Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.Type: ApplicationFiled: September 12, 2022Publication date: February 16, 2023Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
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Publication number: 20220408024Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: ApplicationFiled: August 25, 2022Publication date: December 22, 2022Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Patent number: 11514586Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.Type: GrantFiled: August 3, 2022Date of Patent: November 29, 2022Assignee: PROTOCHIPS, INC.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
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Publication number: 20220377244Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.Type: ApplicationFiled: August 3, 2022Publication date: November 24, 2022Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
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Patent number: 11477388Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: GrantFiled: December 8, 2021Date of Patent: October 18, 2022Assignee: PROTOCHIPS, INC.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Publication number: 20220327156Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.Type: ApplicationFiled: April 7, 2022Publication date: October 13, 2022Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
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Patent number: 11455333Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.Type: GrantFiled: April 7, 2022Date of Patent: September 27, 2022Assignee: PROTOCHIPS, INC.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
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Publication number: 20220247934Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.Type: ApplicationFiled: January 26, 2022Publication date: August 4, 2022Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
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Patent number: 11399138Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: GrantFiled: March 24, 2021Date of Patent: July 26, 2022Assignee: Protochips, Inc.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Publication number: 20220103755Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: ApplicationFiled: December 8, 2021Publication date: March 31, 2022Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Publication number: 20210235021Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: ApplicationFiled: March 24, 2021Publication date: July 29, 2021Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Patent number: 10986279Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: GrantFiled: November 18, 2020Date of Patent: April 20, 2021Assignee: Protochips, Inc.Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Publication number: 20210112203Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.Type: ApplicationFiled: November 18, 2020Publication date: April 15, 2021Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
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Publication number: 20180310171Abstract: Methods, systems, computer-readable media, and apparatuses for interactive challenges for accessing a resource are presented. In some embodiments, a method may include presenting a challenge requesting the performance of a specific motion. The method may also include capturing sensor data generated by one or more sensors associated with a mobile device as a result of one or more actions performed by a user in response to the challenge. The method may additionally include determining whether the specific motion was performed by comparing the captured sensor data to reference data associated with the requested specific motion. The method may further include indicating whether the challenge was satisfied based at least in part on the determining.Type: ApplicationFiled: April 20, 2017Publication date: October 25, 2018Inventors: Simon Whitaker, Ludovic Fardel, Felix Leupold, Alan Philip Sutton, Sebastian Felix Oberste-Vorth, Rahul Parsani
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Patent number: 9903589Abstract: A tile for attaching to a wall of a gas turbine engine. The tile has a main body. The tile also has a bridging structure that projects outwardly from the main body and has a hole configured to receive an elongate fastener so that the tile can be attached to the wall of the gas turbine engine by passing the elongate fastener through a hole in the wall of the gas turbine engine and the hole in the bridging structure.Type: GrantFiled: August 27, 2014Date of Patent: February 27, 2018Assignee: ROLLS-ROYCE plcInventors: Paul Allan Hucker, Alan Philip Geary, Anthony John Moran, Jonathan Mark Gregory
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Patent number: 9668096Abstract: Provided herein are methods and systems relating to location-based services such as providing a geofence, outputting location-based information on a mobile device, varying transmissions to and from a mobile device, and providing location-based alerts. More specifically, a method can include obtaining a first physical location of a mobile device; and generating a geofence on the mobile device based on the first physical location. The methods and systems also provide the capability to generate a geofence based on one or more physical locations of a mobile device over a course of time.Type: GrantFiled: January 31, 2015Date of Patent: May 30, 2017Assignee: PAYPAL, INC.Inventors: Alan Philips, Frank Schroth, Geoffrey M. Palmer, Stefan G. Zielinski, Allen P. Smith, Colin M. Cunningham, III