Patents by Inventor Alan Philips

Alan Philips has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250053594
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Application
    Filed: October 25, 2024
    Publication date: February 13, 2025
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Publication number: 20250029810
    Abstract: Disclosed herein are methods and systems for selectively managing different temporal and/or spatial resolution images and metadata collected during a transmission electron microscope (TEM) session. The system includes a transmission electron microscope and a computer system communicatively coupled to the transmission electron microscope. The computer system includes memory, data storage, and at least one processor configured for continuously receiving, from the transmission electron microscope, data captured at a lower temporal and/or spatial resolution and selectively receiving, from the transmission electron microscope, data captured at a higher temporal and/or spatial resolution.
    Type: Application
    Filed: July 19, 2024
    Publication date: January 23, 2025
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Marusak Stephens
  • Patent number: 12130858
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Grant
    Filed: September 11, 2023
    Date of Patent: October 29, 2024
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Publication number: 20240267628
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: February 9, 2024
    Publication date: August 8, 2024
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
  • Publication number: 20240252408
    Abstract: A deodorant composition which is an ethanolic solution comprising a zinc dicarboxylate salt of a fatty acid having from 6 to 14 carbon atoms and a crystallisation inhibitor which prevents or reduces crystal formation from said solution.
    Type: Application
    Filed: July 26, 2022
    Publication date: August 1, 2024
    Inventors: Sophie Louise Hollmerus, Joy Rachel McWalter, Alan Philip Rowland, Ophelie Marie-Pierre Cecile Torres, Iain Andrew Weddell
  • Publication number: 20240196094
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Application
    Filed: February 19, 2024
    Publication date: June 13, 2024
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
  • Patent number: 12010430
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Grant
    Filed: August 25, 2022
    Date of Patent: June 11, 2024
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
  • Patent number: 11902665
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Grant
    Filed: January 26, 2022
    Date of Patent: February 13, 2024
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
  • Publication number: 20230418863
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Application
    Filed: September 11, 2023
    Publication date: December 28, 2023
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Patent number: 11755639
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Grant
    Filed: September 12, 2022
    Date of Patent: September 12, 2023
    Assignee: PROTOCHIPS, INC.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Publication number: 20230049691
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Application
    Filed: September 12, 2022
    Publication date: February 16, 2023
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Publication number: 20220408024
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Application
    Filed: August 25, 2022
    Publication date: December 22, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
  • Patent number: 11514586
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Grant
    Filed: August 3, 2022
    Date of Patent: November 29, 2022
    Assignee: PROTOCHIPS, INC.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L Marthe, Jr., Benjamin Bradshaw Larson
  • Publication number: 20220377244
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: August 3, 2022
    Publication date: November 24, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
  • Patent number: 11477388
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Grant
    Filed: December 8, 2021
    Date of Patent: October 18, 2022
    Assignee: PROTOCHIPS, INC.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
  • Publication number: 20220327156
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Application
    Filed: April 7, 2022
    Publication date: October 13, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Patent number: 11455333
    Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
    Type: Grant
    Filed: April 7, 2022
    Date of Patent: September 27, 2022
    Assignee: PROTOCHIPS, INC.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Joshua Friend, Katherine Elizabeth Marusak
  • Publication number: 20220247934
    Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
    Type: Application
    Filed: January 26, 2022
    Publication date: August 4, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs, Joshua Brian Friend, Katherine Elizabeth Marusak, Nelson L. Marthe, JR., Benjamin Bradshaw Larson
  • Patent number: 11399138
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: July 26, 2022
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs
  • Publication number: 20220103755
    Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
    Type: Application
    Filed: December 8, 2021
    Publication date: March 31, 2022
    Inventors: Franklin Stampley Walden, II, John Damiano, JR., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks, Benjamin Jacobs