Patents by Inventor Aleksander Labuda
Aleksander Labuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230251284Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.Type: ApplicationFiled: March 21, 2023Publication date: August 10, 2023Inventors: Jason Bemis, David Aue, Aleksander Labuda
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Patent number: 11644478Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.Type: GrantFiled: February 2, 2022Date of Patent: May 9, 2023Assignee: Oxford Instruments Asylum Research, Inc.Inventors: Jason Bemis, David Aue, Aleksander Labuda
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Publication number: 20220244289Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.Type: ApplicationFiled: February 2, 2022Publication date: August 4, 2022Inventors: Jason Bemis, David Aue, Aleksander Labuda
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Patent number: 10705114Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: July 2, 2019Date of Patent: July 7, 2020Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20190324054Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: July 2, 2019Publication date: October 24, 2019Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Patent number: 10444258Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: GrantFiled: December 11, 2017Date of Patent: October 15, 2019Assignee: Oxford Instruments Asylum Research IncInventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Patent number: 10338096Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: October 31, 2017Date of Patent: July 2, 2019Assignee: Oxford Instruments Asylum Research IncInventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20180292432Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: ApplicationFiled: December 11, 2017Publication date: October 11, 2018Inventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Patent number: 10054612Abstract: An optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: GrantFiled: July 5, 2016Date of Patent: August 21, 2018Assignee: Oxford Instruments Asylum Research IncInventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20180128853Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: October 31, 2017Publication date: May 10, 2018Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Patent number: 9841436Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: GrantFiled: September 26, 2016Date of Patent: December 12, 2017Assignee: Oxford Instruments Asylum Research IncInventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Patent number: 9804193Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: November 3, 2015Date of Patent: October 31, 2017Assignee: Oxford Instruments Asylum Research, IncInventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Patent number: 9671424Abstract: Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models.Type: GrantFiled: March 13, 2013Date of Patent: June 6, 2017Assignee: The Royal Institution of the Advancement of Learning/McGill UniversityInventors: Aleksander Labuda, Peter Grutter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil
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Publication number: 20170131322Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: ApplicationFiled: September 26, 2016Publication date: May 11, 2017Inventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Publication number: 20160313368Abstract: An optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: ApplicationFiled: July 5, 2016Publication date: October 27, 2016Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Patent number: 9453857Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: GrantFiled: April 23, 2015Date of Patent: September 27, 2016Assignee: Oxford Instruments Asylum Research, IncInventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Patent number: 9383386Abstract: This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: GrantFiled: March 12, 2014Date of Patent: July 5, 2016Assignee: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20160169937Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: November 3, 2015Publication date: June 16, 2016Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20150309071Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.Type: ApplicationFiled: April 23, 2015Publication date: October 29, 2015Inventors: Roger Proksch, Jason Bemis, Aleksander Labuda
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Patent number: 9075235Abstract: Optical microscopy of biological specimens, particularly live cells, is difficult as they generally lack sufficient contrast to be studied successfully as typically the internal structures of the cell are colorless and transparent. Commonly, contrast is increased by staining the different structures with selective dyes, but this involves killing and fixing the sample. Staining may also introduce artifacts, apparent structural details caused by the processing of the specimen and are thus not a legitimate feature of the specimen. Further, microscopy of different elements of these biological specimens typically requires multiple microscopy techniques on multiple specimens. According to embodiments of the invention simultaneous imaging techniques are applied to a biological specimen such as fluorescent imaging and dark field imaging by designing an experimental evaluation system and associated illumination system addressing the conflicting demands of these approaches.Type: GrantFiled: October 1, 2012Date of Patent: July 7, 2015Assignee: THE ROYAL INSTITUTION FOR THE ADVANCEMENT OF LEARNING / MCGILL UNIVERSITYInventors: Dilson Rassier, Albert Kalganov, Aleksander Labuda