Abstract: Embodiments of systems, devices, and methods relate to initiating beam transport for an accelerator system. An example method includes increasing a bias voltage of one or more electrodes of the accelerator system to a first voltage level and extracting a charged particle beam from a beam source such that the beam is transported through the accelerator system. The beam has a beam current that results in a first transient voltage drop within a threshold. The method further includes increasing the beam current at a rate that results in one or more subsequent transient voltage drops within the threshold until the accelerator system has reached nominal conditions. Another example method includes biasing one or more electrodes of an accelerator system and selectively extracting, according to a duty cycle function, a charged particle beam from a beam source such that the charged particle beam is transported through the accelerator system.

Abstract: Embodiments of systems, devices, and methods relate to exclusion of ion beam paths on the target surface to optimize neutron beam performance. A particle beam is directed along an axis so that the particle beam is incident on a target positioned on the particle beam axis. The target has a scannable surface extending over an area substantially orthogonal to the axis. The particle beam is scanned across the scannable surface of the target along a first path having a first flux. The particle beam, having a second flux, is scanned across the scannable surface of the target along a second path that is within an exclusion area of the target.

Abstract: Embodiments of systems, devices, and methods relate to a beam system. An example beam system includes a charged particle source configured to generate a beam of charged particles, a pre-accelerator system configured to accelerate the beam, and an accelerator configured to accelerate the beam from the pre-accelerator system. The pre-accelerator system can cause the beam to converge as it is propagated from the source to an input aperture of the accelerator. The pre-accelerator system can further reduce or eliminate source disturbance or damage caused by backflow traveling from the accelerator toward the source.

Abstract: Embodiments of systems, devices, and methods relating to a beam system. An example beam system includes a charged particle source configured to generate a beam of charged particles, a pre-accelerator system configured to accelerate the beam, and an accelerator configured to accelerate the beam from the pre-accelerator system. The pre-accelerator system can cause the beam to converge as it is propagated from the source to an input aperture of the accelerator. The pre-accelerator system can further reduce or eliminate source disturbance or damage caused by backflow traveling from the accelerator toward the source.

Abstract: Systems and methods are provided that facilitate forming and maintaining FRCs with superior stability as well as particle, energy and flux confinement and, more particularly, systems and methods that facilitate forming and maintaining FRCs with elevated system energies and improved sustainment utilizing neutral beam injectors with tunable beam energy capabilities.

Abstract: Embodiments of systems, devices, and methods relate to an ion beam source system. An ion source is configured to provide a negative ion beam to a tandem accelerator system downstream of the ion source, and a modulator system connected to an extraction electrode of the ion source is configured to bias the extraction electrode for a duration sufficient to maintain acceleration voltage stability of the tandem accelerator system.

Abstract: Embodiments of systems, devices, and methods relate to initiating beam transport for an accelerator system. An example method includes increasing a bias voltage of one or more electrodes of the accelerator system to a first voltage level and extracting a charged particle beam from a beam source such that the beam is transported through the accelerator system. The beam has a beam current that results in a first transient voltage drop within a threshold. The method further includes increasing the beam current at a rate that results in one or more subsequent transient voltage drops within the threshold until the accelerator system has reached nominal conditions. Another example method includes biasing one or more electrodes of an accelerator system and selectively extracting, according to a duty cycle function, a charged particle beam from a beam source such that the charged particle beam is transported through the accelerator system.

Abstract: Embodiments of systems, devices, and methods relate to a modular diagnostics interface system. An example modular diagnostics interface system includes one or more insertable measurement boards configured to communicably couple with a backplane of a modular measurement rack, and configured to collect a measured current from a component of a beamline.

Abstract: Systems and methods are provided that facilitate forming and maintaining FRCs with superior stability as well as particle, energy and flux confinement and, more particularly, systems and methods that facilitate forming and maintaining FRCs with elevated system energies and improved sustainment utilizing neutral beam injectors with tunable beam energy capabilities.

Abstract: Embodiments of systems, devices, and methods relate to fast beam position monitoring for detecting beam misalignment in a beam line. In an example, a fast beam position monitor includes a plurality of electrodes extending into an interior of a component of a beam line. The fast beam position monitor is configured to detect a position of a beam passing through the component of the beam line based on beam halo current. Embodiments of systems, devices, and methods further relate to noninvasively monitoring parameters of beams advancing along a beam line. In examples, gas is puffed into a pumping chamber along a beam line. One or more beam parameters are measured from fluorescence resulting from collisions of energetic beam particulates of a beam advancing through the beam line.

Abstract: Embodiments of systems, devices, and methods relating to a beam system. An example beam system includes a charged particle source configured to generate a beam of charged particles, a pre-accelerator system configured to accelerate the beam, and an accelerator configured to accelerate the beam from the pre-accelerator system. The pre-accelerator system can cause the beam to converge as it is propagated from the source to an input aperture of the accelerator. The pre-accelerator system can further reduce or eliminate source disturbance or damage caused by backflow traveling from the accelerator toward the source.

Abstract: Systems and methods that facilitate forming and maintaining FRCs with superior stability as well as particle, energy and flux confinement and, more particularly, systems and methods that facilitate forming and maintaining FRCs with elevated system energies and improved sustainment utilizing neutral beam injectors with tunable beam energy capabilities.

Abstract: A High Intensity Discharge (HID) lamp includes a discharge chamber disposed within an anti-oxidation envelope and protected by a shroud. The shroud encloses the anti-oxidation envelope and thereby the discharge chamber to prevent the emission of fragments in the event that the discharge chamber fails. The shroud is positioned around the anti-oxidation envelope by a compressed spring at one end of the envelope tensioned against a collar attaching the other end of the envelope to a base of the lamp.

Abstract: A High Intensity Discharge (HID) lamp (100) comprised of a discharge chamber (130) disposed within an anti-oxidation envelope (120) and protected by a shroud (110). The shroud encloses the anti-oxidation envelope and thereby the discharge chamber to prevent the emission of fragments in the event that the discharge chamber fails. The shroud is positioned around the anti-oxidation envelope by means of a compressed spring (170) at one end of the envelope tensioned against a collar (160) attaching the other end of the envelope to a base of the lamp.

Abstract: A ceramic gas discharge metal halide (CDM) lamp (23) exhibiting a high color temperature (above 4500K) has a prolate spheroid-shaped PCA discharge vessel (12) containing a fill of an inert gas, mercury and a metal halide salt mixture of at least about 62 mole percent of calcium iodide (CaI2); up to about 8 mole percent of cerium iodide (CeI3); up to about 15 mole percent of cesium iodide (CsI); and up to about 15 mole percent of other halides selected from the halides of lithium (Li), sodium (Na), indium (In), manganese (Mn), lead (Pb), praseodymium (Pr), europium (Eu), gallium (Ga) and thallium (Tl), with the amount of sodium (Na) halides being less than about 5 mole percent, and the amount of thallium (Tl) halides being less than about 5 mole percent. Such lamps are particularly useful in horticultural applications, as well as in sports lighting, aquarium lighting and other specialty lighting applications.