Patents by Inventor Amir Bar-or
Amir Bar-or has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240107473Abstract: A system is configured for reconfiguration of a Synchronization Signal Block (SSB) pattern. The system is configured for obtaining data including a configuration for a Synchronization Signal Block (SSB) transmission carrying a physical broadcast channel (PBCH), the configuration specifying, for an SSB of the configuration, resource elements (REs) allocated for transmitting a primary synchronization signal (PSS) to a user equipment (UE) and REs allocated for transmitting a secondary synchronization signal (SSS) to the UE. The system is configured for selecting a set of REs that are unused in the configuration for the SSB transmission, specifying a filling sequence for extending a synchronization signal or an SSB to the set of REs that are unused in the configuration of the SSB transmission, generating data including an enhanced configuration for the SSB transmission that includes the extended synchronization signal or the extended SSBs, and transmitting the SSB transmission using the enhanced configuration.Type: ApplicationFiled: September 22, 2023Publication date: March 28, 2024Inventors: Yihong Qi, Amir Aminzadeh Gohari, Amir Farajidana, Dan Zhang, Herbert R. Dawid, Idan Bar-Sade, Keith W. Saints, Onurcan Iscan, Ruoheng Liu, Sami M. Almalfouh, Sung Eun Lee, Tudor Ninacs, Wenshu Zhang, Yuanye Wang
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Publication number: 20240107439Abstract: A system is configured for reconfiguration of a Synchronization Signal Block (SSB) pattern. The system is configured for obtaining data including a configuration for a Synchronization Signal Block (SSB) transmission carrying a physical broadcast channel (PBCH), the configuration specifying, for an SSB of the configuration, resource elements (REs) allocated for transmitting a primary synchronization signal (PSS) to a user equipment (UE) and REs allocated for transmitting a secondary synchronization signal (SSS) to the UE. The system is configured for selecting a set of REs that are unused in the configuration for the SSB transmission, specifying a filling sequence for extending a synchronization signal or an SSB to the set of REs that are unused in the configuration of the SSB transmission, generating data including an enhanced configuration for the SSB transmission that includes the extended synchronization signal or the extended SSBs, and transmitting the SSB transmission using the enhanced configuration.Type: ApplicationFiled: September 22, 2023Publication date: March 28, 2024Inventors: Yihong Qi, Amir Aminzadeh Gohari, Amir Farajidana, Dan Zhang, Herbert R. Dawid, Idan Bar-Sade, Keith W. Saints, Onurcan Iscan, Ruoheng Liu, Sami M. Almalfouh, Sung Eun Lee, Tudor Ninacs, Wenshu Zhang, Yuanye Wang
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Patent number: 11940390Abstract: A system, method and computer readable medium for examining a specimen, the method comprising: obtaining defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool, each potential defect is associated with attribute values defining a location of the potential defect in an attribute space; generating a representative subset of the group, comprising potential defects selected in accordance with a distribution of the potential defects within the attribute space, and indicating the potential defects in the representative subset as FA; and training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, wherein the trained classifier is to be applied to at least some of the potential defects to obtain an estimation of a number of expected DOIs.Type: GrantFiled: June 1, 2022Date of Patent: March 26, 2024Assignee: Applied Materials Israel Ltd.Inventors: Yotam Sofer, Shaul Engler, Boaz Cohen, Saar Shabtay, Amir Bar, Marcelo Gabriel Bacher
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Publication number: 20240086726Abstract: Systems and methods perform analytics and visualization of Big Data. A multiscale geosocial network apparatus can be used for identifying prospective customers and communities of customers with shared interests. A model and visualization of customer signatures for analyzing trends in customer behaviors and making long-term forecasts about future customer activities. An analytics and visualization tool is presented for inventory management using comprehensive event analysis. A set of methods for optimizing shipping and storage costs uses historical data from a variety of data sources including social media platforms and business records of a corporation. The system and method take, as input, data and transform that data into insights that can provide guidance for a variety of decisions including new customer acquisition, managing customer portfolios, inventory management, and optimization of logistics as well as strategic business decisions and planning.Type: ApplicationFiled: October 8, 2020Publication date: March 14, 2024Inventors: Yaneer BAR-YAM, Olga BUCHEL, Leila HEDAYATIFAR, Amir Akhavan MASOUMI, Alfredo MORALES, Chen SHEN
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Publication number: 20240079156Abstract: The present invention relates to rigid structures and composite materials thereof for providing radiation attenuation/shielding. Some embodiments pertain to a radiation shielding apparatus including: a plurality of positionable radiation-shielding stacks of tiles. The stacks are subsequently and adjacently arranged in a contiguous configuration. A tile positioning mechanism allows movement of tiles within a stack between a stacked (retracted) position and an extended position. In the extended position, the tiles of each of the plurality of radiation shielding stacks at least partially overlap tiles of subsequent and adjacent tile stack at corresponding opposing side-margins thereof.Type: ApplicationFiled: March 9, 2023Publication date: March 7, 2024Applicant: Radiaction LtdInventors: Jonathan Yifat, Yossi Bar, Amir Belson, Michael Retter
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Publication number: 20230408423Abstract: There is provided a system and method of optimizing an inspection recipe for inspecting a semiconductor specimen. The method includes obtaining test data from a test performed after inspection, the test data indicative of functional defectivity of the specimen with respect to at least one structural feature at a suspected layer; retrieving inspection data of the suspected layer including a set of inspection images and a set of defect maps of the plurality of processing steps of the suspected layer; correlating the test data and the set of defect maps of the suspected layer to identify one or more structural features of the suspected layer with unmatched defectivity; for each of the identified structural features, including at least part of the inspection images corresponding to the structural feature in a training set; and using the training set to train a machine learning (ML) model in the inspection recipe.Type: ApplicationFiled: June 21, 2022Publication date: December 21, 2023Inventors: Paz YABBO, Boaz DUDOVICH, Bhavna GHAI, Amir BAR
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Publication number: 20230377125Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.Type: ApplicationFiled: May 19, 2022Publication date: November 23, 2023Inventors: Boaz DUDOVICH, Assaf ARIEL, Amir BAR, Lior YEHIELI, Chen ITZIKOWITZ, Shiran BEN ISRAEL, Lior KATZ, Eli Oren JONI, Eyal ROT
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Patent number: 11776243Abstract: There is provided a computer implemented method for identification of an indication of visual object(s) in anatomical image(s) of a target individual, comprising: providing anatomical image(s) of a body portion of a target individual, inputting the anatomical image(s) into a classification component of a neural network (NN) and into a segmentation component of the NN, feeding a size feature into the classification component of the NN, wherein the size feature comprises an indication of a respective size of each segmented visual object identified in the anatomical image(s), the size feature computed according to segmentation data outputted by the segmentation component for each pixel element of the anatomical image(s), and computing, by the classification component of the NN, an indication of visual object(s) in the anatomical image(s).Type: GrantFiled: June 27, 2019Date of Patent: October 3, 2023Assignee: Nano-X AI Ltd.Inventor: Amir Bar
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Publication number: 20230288345Abstract: A method of automatic optimization of an examination recipe includes obtaining inspection data of a given layer of a semiconductor specimen acquired by an inspection tool during runtime examination, the inspection data including inspection images representative of defect candidates from a defect map of the given layer, extracting inspection features characterizing the inspection images, and using a classifier to classify the defect candidates based on the inspection features, giving rise to a list of defect candidates having a higher probability of being defects of interest (DOIs).Type: ApplicationFiled: May 12, 2023Publication date: September 14, 2023Inventor: Amir BAR
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Patent number: 11743366Abstract: A processor receives data corresponding to a sensor, and generates a frame having a header and a payload. A data type value is selected from a set of multiple data type values corresponding to different respective types of data, the set of multiple data type values including at least i) a first data type value corresponding to video data from a camera, and ii) a second data type value corresponding to non-video data. The header is generated to include one or more fields set to the selected data type value to indicate a type of data included in the payload, and the payload is generated to include the data received from the sensor. The processor provides the frame to an Ethernet network interface. The Ethernet network interface encapsulates the frame in an Ethernet packet, and transmits the Ethernet packet via an Ethernet link.Type: GrantFiled: October 13, 2021Date of Patent: August 29, 2023Assignee: Marvell Asia Pte LtdInventors: Amir Bar-Niv, Dance Wu
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Publication number: 20230269112Abstract: A sensor bridge, for use in an Ethernet network in a vehicle, includes a sensor interface, a mapper and a communication processor. The sensor interface is configured to receive sensor data from a sensor installed in the vehicle. The mapper is configured to form mapped sensor data by applying to the sensor data a direct mapping that maps specified parts of the sensor data to corresponding bit positions in one or more Ethernet packets. The communication processor is configured to generate the one or more Ethernet packets including the mapped sensor data, and to transmit the one or more Ethernet packets over the Ethernet network.Type: ApplicationFiled: February 23, 2023Publication date: August 24, 2023Inventors: Amir Bar-Niv, Dance Wu
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Publication number: 20230262327Abstract: An apparatus for controlling an imaging sensor in a vehicle includes an Ethernet transceiver, a sensor interface and a local processor. The Ethernet transceiver is configured to communicate over an in-vehicle Ethernet network with a remote processor. The sensor interface is configured to communicate with the imaging sensor. The local processor that is local to the apparatus and remotely located from the remote processor is configured to receive from the imaging sensor, via the sensor interface, image data and auxiliary data related to the image data, to send at least the image data to the remote processor via the Ethernet transceiver, to generate locally, based on the auxiliary data, and independently from the remote processor, control commands to control an operational aspect of the imaging sensor, and to send the control commands to the imaging sensor via the sensor interface.Type: ApplicationFiled: February 14, 2023Publication date: August 17, 2023Inventors: Dance Wu, Amir Bar-Niv
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Patent number: 11727087Abstract: There is provided a method, comprising: accessing medical images of subjects, depicting contrast phases of contrast administered to the respective subject, accessing for a first subset of the medical images, metadata indicating a respective contrast phase, wherein a second subset of the medical images are unassociated with metadata, mapping each respective contrast phase of the contrast phases to a respective time interval indicating estimated amount of time from a start of contrast administration to time of capture of the respective medical image, creating a training dataset, by labelling images of the first subset with a label indicating the respective time interval, and including the second subset as non-labelled images, and training the ML model using the training dataset for generating an outcome of a target time interval indicating estimated amount of time from the start of contrast administration, in response to an input of a target medical image.Type: GrantFiled: April 5, 2021Date of Patent: August 15, 2023Assignee: Nano-X AI Ltd.Inventors: Raouf Muhamedrahimov, Amir Bar
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Patent number: 11686689Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.Type: GrantFiled: March 17, 2022Date of Patent: June 27, 2023Assignee: Applied Materials Israel Ltd.Inventor: Amir Bar
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Patent number: 11587228Abstract: There is provided a method, comprising: providing a training dataset including, medical images and corresponding text based reports, and concurrently training a natural language processing (NLP) machine learning (ML) model for generating a NLP category for a target text based report and a visual ML model for generating a visual finding for a target image, by: training the NLP ML model using the text based reports of the training dataset and a ground truth comprising the visual finding generated by the visual ML model in response to an input of the images corresponding to the text based reports of the training dataset, and training the visual ML model using the images of the training dataset and a ground truth comprising the NLP category generated by the NLP ML model in response to an input of the text based reports corresponding to the images of the training dataset.Type: GrantFiled: August 11, 2020Date of Patent: February 21, 2023Assignee: Nano-X AI Ltd.Inventors: Amir Bar, Raouf Muhamedrahimov, Rachel Wities
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Publication number: 20220405915Abstract: There is provided a method of training a machine learning model, comprising: for each set of sample medical images depicting calcification within a target anatomical structure wherein each set includes non-contrast medical image(s) and contrast enhanced medical image(s), correlating between calcifications depicted in the target anatomical structure of the contrast enhanced image(s) with corresponding calcifications depicted in the target anatomical structure of the non-contrast medical image(s), computing calcification parameter(s) for calcification depicted in the respective target anatomical structure, labelling each contrast enhanced medical image with the calcification parameter(s), and training the machine learning model on a training dataset that includes the contrast enhanced medical images of the sets, each labelled with ground truth label of a respective calcification parameter(s), for generating an outcome indicative of a target calcification parameter(s) for calcification depicted in the target anaType: ApplicationFiled: June 17, 2021Publication date: December 22, 2022Applicant: Zebra Medical Vision Ltd.Inventors: Ronen Marc GORDON, Amir BAR, Raouf MUHAMEDRAHIMOV, Ayelet AKSELROD-BALLIN
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Publication number: 20220335184Abstract: Systems, methods, and computer-readable media for a well construction activity graph builder. An example method can include obtaining a stream of events associated with a wellbore; obtaining mapping metadata identifying data points to be included in a graph data model from a store of data associated with the wellbore; generating the graph data model based on the stream of events, the mapping metadata, and the data points identified in the mapping metadata, the graph data model including nodes representing logical entities associated with the data points, the nodes having interconnections based on data relationships defined in the mapping metadata, each logical entity corresponding to a set of data points from the data points; and generating a view of the graph data model, the view depicting at least some of the nodes and interconnections in the graph data model.Type: ApplicationFiled: September 4, 2019Publication date: October 20, 2022Applicant: LANDMARK GRAPHICS CORPORATIONInventors: Avinash WESLEY, Amir BAR, David CRAWSHAY
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Publication number: 20220318567Abstract: There is provided a method, comprising: accessing medical images of subjects, depicting contrast phases of contrast administered to the respective subject, accessing for a first subset of the medical images, metadata indicating a respective contrast phase, wherein a second subset of the medical images are unassociated with metadata, mapping each respective contrast phase of the contrast phases to a respective time interval indicating estimated amount of time from a start of contrast administration to time of capture of the respective medical image, creating a training dataset, by labelling images of the first subset with a label indicating the respective time interval, and including the second subset as non-labelled images, and training the ML model using the training dataset for generating an outcome of a target time interval indicating estimated amount of time from the start of contrast administration, in response to an input of a target medical image.Type: ApplicationFiled: April 5, 2021Publication date: October 6, 2022Applicant: Zebra Medical Vision Ltd.Inventors: Raouf MUHAMEDRAHIMOV, Amir BAR
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Publication number: 20220291138Abstract: A system, method and computer readable medium for examining a specimen, the method comprising: obtaining defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool, each potential defect is associated with attribute values defining a location of the potential defect in an attribute space; generating a representative subset of the group, comprising potential defects selected in accordance with a distribution of the potential defects within the attribute space, and indicating the potential defects in the representative subset as FA; and training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, wherein the trained classifier is to be applied to at least some of the potential defects to obtain an estimation of a number of expected DOIs.Type: ApplicationFiled: June 1, 2022Publication date: September 15, 2022Inventors: Yotam Sofer, Shaul Engler, Boaz Cohen, Saar Shabtay, Amir Bar, Marcelo Gabriel Bacher
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Publication number: 20220205928Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.Type: ApplicationFiled: March 17, 2022Publication date: June 30, 2022Inventor: Amir BAR