Patents by Inventor An Chang

An Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11428618
    Abstract: Systems and methods for monitoring air particulate matter are provided herein that capture particles from the air for analysis. Particles are captured using electrostatic and/or mechanical means to deflect particles toward a substrate. Electrostatic precipitation causes charged carriers to deflect towards a charged substrate. Filtration-based means employ filters and/or fibers to capture particles from air flowing therethrough. A sensor such as a camera is used to read the captured particles. An illumination source directs light towards the substrate, causing the particles to scatter light, which the sensor can detect and derive information or imaging therefrom, which can also be used for further particle or pollution analyses. The substrate can be replenished using electrostatic techniques such as reverse electrostatic force, or mechanical means such as cleaning using a brush or replacing a tape substrate.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: August 30, 2022
    Assignee: Massachusetts Institute of Technology
    Inventors: Rohit Nandkumar Karnik, An Chang
  • Publication number: 20190346356
    Abstract: Systems and methods for monitoring air particulate matter are provided herein that capture particles from the air for analysis. Particles are captured using electrostatic and/or mechanical means to deflect particles toward a substrate. Electrostatic precipitation causes charged carriers to deflect towards a charged substrate. Filtration-based means employ filters and/or fibers to capture particles from air flowing therethrough. A sensor such as a camera is used to read the captured particles. An illumination source directs light towards the substrate, causing the particles to scatter light, which the sensor can detect and derive information or imaging therefrom, which can also be used for further particle or pollution analyses. The substrate can be replenished using electrostatic techniques such as reverse electrostatic force, or mechanical means such as cleaning using a brush or replacing a tape substrate.
    Type: Application
    Filed: December 19, 2017
    Publication date: November 14, 2019
    Inventors: Rohit Nandkumar Karnik, An Chang