Abstract: A memory device and an erase method for the memory device are provided. The memory device includes plural blocks and a controller. The plural blocks include at least one first block and at least one second block. The erase method is controlled by the controller and includes the following steps. A first stage erase operation and a second stage erase operation are sequentially performed on the at least one first block in a first time interval and a second time interval. The first stage erase operation and the second stage erase operation are sequentially performed on the at least one second block in the second time interval and a third time interval.

Abstract: A method for increasing coding reliability includes generating a generator matrix for an extended polar code including a standard polar code part and an additional frozen part. The standard polar code part has N bit-channels, including K information bit-channels and N?K frozen bit-channels. The additional frozen part has q additional frozen bit-channels. Among the K information bit-channels, q information bit-channels are re-polarized using the q additional frozen bit-channels. The method further includes receiving an input vector including K information bits and N+q?K frozen bits, and transforming, using the generator matrix, the input vector to an output vector including N+q encoded bits. The K information bits are allocated to the K information bit-channels, and the N+q?K frozen bits are allocated to the N?K frozen bit-channels and the q additional frozen bit-channels.

Abstract: A memory sensing method is provided. The memory sensing method comprises the following steps: sensing a first memory unit to obtain a first sensing result; sensing a second memory unit to obtain a second sensing result; and looking up a one-time sensing table according to the first and second sensing results to obtain an output data.

Abstract: A memory circuit is described that includes an array of memory cells including a plurality of blocks. The circuit includes a controller including logic to execute program sequences for selected blocks in the plurality of blocks. The program sequences include patterns of program/verify cycles. The circuit includes logic to assign different patterns of program/verify cycles to different blocks in the plurality of blocks. The circuit includes logic to change a particular pattern assigned to a particular block in the plurality of blocks. The circuit includes logic to maintain statistics for blocks in the plurality of blocks, about performance of cells in the blocks in response to the patterns of program/verify cycles assigned to the blocks. The controller includes logic to apply a stress sequence to one of the selected blocks, the stress sequence including stress pulses applied to memory cells in the one of the selected blocks.

Abstract: A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.

Abstract: An operating method of a storage device is provided. The operating method comprises the following steps. First, a first data is read from a target address of a first storage unit. Then, an assisting unit checks whether the target address is corresponding to a second data stored in a second storage unit. If the target address is corresponding to the second data, the assisting unit updates the first data according to the second data to generate an updated data. Next, an Error Correction Code (ECC) performs a decoding process on the updated data to generate a decoded data.

Abstract: A memory system is provided. The memory system includes a memory controller and a first memory block. The first memory block is configured to store a first data from a top of the first memory block in a top-down fashion. The first memory block is configured to store a first metadata corresponding to the first data from a bottom of the first memory block in a bottom-up fashion. The first data forms a first data area. The first metadata forms a first metadata area. And a first continuous space is formed between a bottom of the first data area and a top of the first metadata area.

Abstract: A cache system is provided. The cache system includes a first cache and a second cache. The first cache is configured for storing a first status of a plurality of data. The second cache is configured for storing a table. The table includes the plurality of data arranged from a highest level to a lowest level. The cache system is configured to update the first status of the plurality of data in the first cache. The cache system is further configured to update the table in the second cache according to the first status of the plurality of data.

Abstract: A data processing system comprises a storage device, an interface module and a scheduler. The interface module is configured to dispatch a non-prioritized request via a first data path, and to transfer application-level information of an application via a second data path. The scheduler, coupled to the first and second data path, is configured to enable an access to the storage device according to the non-prioritized request and the application-level information respectively received from the first and second data paths.

Abstract: A multiple-bit-per-cell, page mode memory comprises a plurality of physical pages, each physical page having N addressable pages p(n). Logic implements a plurality of selectable program operations to program an addressed page. Logic select one of the plurality of selectable program operations to program an addressed page in the particular physical page using a signal that indicates a logical status of another addressable page in the particular physical page. The logical status can indicate whether the other addressable page contains invalid data. The first program operation overwrites the other addressable page, and the second program operation preserves the other addressable page. The first program operation can execute more quickly than the second program operation. The logic can also be applied for programming multiple-bit-per-cell memory not configured in a page mode.

Abstract: An operating method for a memory, the memory comprising at least one memory block including a plurality of first pages and a plurality of second pages corresponding to the first pages, the operating method including the following steps: determining whether a target first page of the first pages is valid, wherein the target first page is corresponding to a target second page of the second pages; if the target first page is valid, performing first type programming on the target second page; if the target first page is invalid, performing second type programming on the target second page.

Abstract: Technology is described that increases endurance of memory devices through heal leveling. Heal leveling is a lightweight solution to distribute healing cycles among memory blocks. Approaches described herein can accomplish heal leveling without introducing a large amount of overhead. Heal leveling significantly improves the access performance and the effective lifetime of memory blocks. By more evenly distributing the heal count it may not be necessary to directly apply wear leveling based on access counts of each block because each block will be more evenly accessed in the long run. Heal leveling may be performed by moving data that is seldom or never modified after creation, such as read-only files, to blocks having suffered the greatest number, or a high number, of healing cycles.

Abstract: A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.

Abstract: Operation methods for a memory device is provided. An operation method for the memory device comprises programming the memory device as described in follows. Data are provided. The data comprise a plurality of codes. Each number of the codes is counted. Then, a mapping rule is generated according to each number of the codes. In the mapping rule, each of the codes is mapped to one of a plurality of verifying voltage levels which are sequentially arranged from low to high. After that, the data are programmed into the memory device according to the mapping rule.

Abstract: Multiple measurements are made with one memory sense operation having a first word line sensing voltage on a memory cell. The multiple measurements include a first measurement, of whether the memory cell stores either: (a) data corresponding to a first set of one or more threshold voltage ranges below the first word line sensing voltage of the one memory sense operation, or (b) data corresponding to a second set of one or more threshold voltage ranges above the first word line sensing voltage of the one memory sense operation. The multiple measurements include a second measurement, of error correction data of the memory cell indicating relative position within a particular threshold voltage range of a stored threshold voltage in the memory cell.

Abstract: A method for memory management is provided for a memory including a plurality of pages. The method comprises assigning in-use pages to in-use buckets according to use counts. The in-use buckets include a low in-use bucket for a lowest range of use counts, and a high in-use bucket for a highest range of use counts. The method comprises assigning free pages to free buckets according to use counts. The free buckets include a low free bucket for a lowest range of use counts, and a high free bucket for a highest range of use counts. The method maintains use counts for in-use pages. On a triggering event for a current in-use page, the method determines whether the use count of the current in-use page exceeds a hot swap threshold, and if so moves data in the current in-use page to a lead page in the low free bucket.

Abstract: A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.

Abstract: A memory sensing method is provided. The memory sensing method comprises the following steps: sensing a first memory unit to obtain a first sensing result; sensing a second memory unit to obtain a second sensing result; and looking up a one-time sensing table according to the first and second sensing results to obtain an output data.

Abstract: Technology is described that increases endurance of memory devices through heal leveling. Heal leveling is a lightweight solution to distribute healing cycles among memory blocks. Approaches described herein can accomplish heal leveling without introducing a large amount of overhead. Heal leveling significantly improves the access performance and the effective lifetime of memory blocks. By more evenly distributing the heal count it may not be necessary to directly apply wear leveling based on access counts of each block because each block will be more evenly accessed in the long run. Heal leveling may be performed by moving data that is seldom or never modified after creation, such as read-only files, to blocks having suffered the greatest number, or a high number, of healing cycles.

Abstract: A method is provided for managing a memory device including a plurality of physical memory segments. A logical memory space is classified into a plurality of classifications based on usage specifications. The plurality of physical memory segments is allocated to corresponding logical addresses based on the plurality of classifications, and on usage statistics of the physical memory segments. A data structure is maintained recording translation between logical addresses in the logical memory space and physical addresses of the physical memory segments. The plurality of classifications includes a first classification and a second classification having different usage statistic requirements than the first classification. Logical addresses having the second classification can be redirected to physical segments allocated to logical addresses having the first classification, and the data structure can be updated to record redirected logical addresses.