Abstract: An apparatus of performing a clock skew adjustment between at least first and second clock signals includes first and second skew sensors and a skew controller. The first skew sensor receives a third clock signal obtained by delaying the first clock signal by a first delay and a fourth clock signal obtained by delaying the second clock signal by a second delay, and generates first information based on the third and fourth clock signals. The second skew sensor receives a fifth clock signal obtained by delaying the first clock signal by a third delay and a sixth clock signal obtained by delaying the second clock signal by a fourth delay, and generates second information based on the fifth and sixth clock signals. Each of the first and second information varies depending on the clock skew. The skew controller performs the clock skew adjustment based on the first and second information.

Abstract: A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.

Abstract: A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.

Abstract: An apparatus of performing a clock skew adjustment between at least first and second clock signals includes first and second skew sensors and a skew controller. The first skew sensor receives a third clock signal obtained by delaying the first clock signal by a first delay and a fourth clock signal obtained by delaying the second clock signal by a second delay, and generates first information based on the third and fourth clock signals. The second skew sensor receives a fifth clock signal obtained by delaying the first clock signal by a third delay and a sixth clock signal obtained by delaying the second clock signal by a fourth delay, and generates second information based on the fifth and sixth clock signals. Each of the first and second information varies depending on the clock skew. The skew controller performs the clock skew adjustment based on the first and second information.

Abstract: Reducing dynamic clock skew and/or slew in an electronic circuit is provided by: referencing a layout database and/or netlist of a design for the electronic circuit; identifying a set of neighboring buffer pairs with active buffers and adjacent sub-meshes, which are connected by a shorting bar; for each neighboring buffer pair of the set: placing a dummy buffer for each of their active buffers in the adjacent sub-meshes close to the active buffers; routing an input of a first dummy buffer located in a first sub-mesh to an output of an active buffer in a second sub-mesh; routing an input of a second dummy buffer located in the second sub-mesh to an output of an active buffer in the first sub-mesh; and connecting inputs of the first and second dummy buffers to the shorting bar.

Abstract: Reducing dynamic clock skew and/or slew in an electronic circuit is provided by: referencing a layout database and/or netlist of a design for the electronic circuit; identifying a set of neighboring buffer pairs with active buffers and adjacent sub-meshes, which are connected by a shorting bar; for each neighboring buffer pair of the set: placing a dummy buffer for each of their active buffers in the adjacent sub-meshes close to the active buffers; routing an input of a first dummy buffer located in a first sub-mesh to an output of an active buffer in a second sub-mesh; routing an input of a second dummy buffer located in the second sub-mesh to an output of an active buffer in the first sub-mesh; and connecting inputs of the first and second dummy buffers to the shorting bar.

Abstract: The present disclosure regards adjusting a duty cycle, which includes generating a duty cycle signal having a voltage representing a duty cycle of a clock signal; adjusting a reference voltage generated by an adjustable reference voltage generator to match the duty cycle signal to produce a first matched value; inverting voltage sources of the reference voltage generator; adjusting, while the voltage sources are inverted, the reference voltage to produce a second matched value; and calculating a duty cycle value based on the first and second matched values.

Abstract: The present disclosure regards adjusting a duty cycle, which includes generating a duty cycle signal having a voltage representing a duty cycle of a clock signal; adjusting a reference voltage generated by an adjustable reference voltage generator to match the duty cycle signal to produce a first matched value; inverting voltage sources of the reference voltage generator; adjusting, while the voltage sources are inverted, the reference voltage to produce a second matched value; and calculating a duty cycle value based on the first and second matched values.

Abstract: A method for detecting rising and falling transitions of internal signals of an array or integrated circuit. An apparatus used in the method comprises a delay line with a plurality of first to Nth delay elements, latches, and first to Nth groups of logic gates. Each of the first to Nth groups of the logical gates includes an AND gate and a NOR gate. The method determines rising and falling signals based on output signals of the logic gates in the apparatus; in odd numbered groups of the logic gates, the AND gate detects the rising transition and the NOR gate detects the falling transition; in even numbered groups of the logic gates, the AND gate detects the falling transition and the NOR gate detects the rising transition.

Abstract: A method and apparatus for detecting rising and falling transitions of internal signals of an array or integrated circuit. The apparatus comprises a delay line with a plurality of first to Nth delay elements, latches, and first to Nth groups of logic gates. Each of the first to Nth groups of the logical gates includes an AND gate and a NOR gate. The method and apparatus determines rising and falling signals based on output signals of the logic gates; in odd numbered groups of the logic gates, the AND gate detects the rising transition and the NOR gate detects the falling transition; in even numbered groups of the logic gates, the AND gate detects the falling transition and the NOR gate detects the rising transition.

Abstract: A computer identifies a metal layer, in a design, which contains routing track segregated by blockages. The sections of segregated routing track are removed and new routing track are added along the periphery of the blockage. It is determined if contact can be created between the component and the new routing track with the addition of a vertical interconnect access (VIA) structure. If contact can be created, then the VIA structures are added to create contact. If no contact can be created then another new routing track is added with (VIA) structures such that contact is created. Further routing track and VIA structures are added to higher metal layers to form a connection between a routing terminus located on a top metal layer and the new routing track and component.

Abstract: A computer readable medium, system and associated method is provided for designing an integrated circuit with inserted loops. The method comprises the steps of inserting a loop with tagged wire segments and/or vias in a fully routed and DCR clean integrated circuit; performing a DRC; and fixing DRC violations by removing tagged wire segments and/or vias which contribute to a violation.

Abstract: The present invention relates to a method for routing data paths in a semiconductor chip with a plurality of layers. The inventive method comprises the steps of wiring a launching clock path and a receiving clock path on one or more layers according to at least one predetermined condition, performing one or more timing tests for determining any critical paths, and determining a weight function for every layer of each critical path. Said weight function is defined as the difference between a property of the launching clock tree and the same property of the receiving clock tree on said layer. If said weight function is positive for any layer, the wiring of the data path is not allowed on said layer. Preferably the remaining layers are chosen in such a way that a local variation of the delay on said layer is minimal.

Abstract: A computer readable medium, system and associated method is provided for designing an integrated circuit with inserted loops. The method comprises the steps of inserting a loop with tagged wire segments and/or vias in a fully routed and DCR clean integrated circuit; performing a DRC; and fixing DRC violations by removing tagged wire segments and/or vias which contribute to a violation.

Abstract: An integrated chip die comprises a data source connected to a data sink by way of a signal path wherein one or more pipeline latches are automatically inserted into the signal path at predetermined intervals when the length of the signal path is greater than a predetermined maximum signal propagation length.

Abstract: The present invention relates to a method for routing data paths in a semiconductor chip with a plurality of layers. The inventive method comprises the steps of wiring a launching clock path and a receiving clock path on one or more layers according to at least one predetermined condition, performing one or more timing tests for determining any critical paths, and determining a weight function for every layer of each critical path. Said weight function is defined as the difference between a property of the launching clock tree and the same property of the receiving clock tree on said layer. If said weight function is positive for any layer, the wiring of the data path is not allowed on said layer. Preferably the remaining layers are chosen in such a way that a local variation of the delay on said layer is minimal.