Patents by Inventor Andreas Franz

Andreas Franz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030165726
    Abstract: The structured body intended for use for an anode (1) in fuel cells, comprises a structure formed by macro-pores (100) and an electrode material (5). The macro-pores form communicating spaces which are produced by means of pore forming materials. The electrode material includes skeleton-like or net-like connected structures of particles (60, 70) which are connected by sintering and which form two reticular systems (6, 7) which interengage: a first reticular system (6) made of ceramic material and a second reticular system (7) which contains metals to effect an electrical conductivity. The electrode material has the properties that, with a multiple change between oxidising and reducing conditions, substantially no major property changes occur in the ceramic reticular system, on the one hand, and an oxidisation or reduction of the metals results in the second reticular system, on the other hand.
    Type: Application
    Filed: January 31, 2003
    Publication date: September 4, 2003
    Applicant: Sulzer Hexis AG
    Inventors: Gilles Robert, Andreas Franz-Josef Kaiser, Emad Batawi
  • Publication number: 20030142293
    Abstract: A device for measuring dispersion of a link between two switching nodes of an optical network comprises a phase measuring unit PMU for determining a first phase of a data signal traveling on a first wavelength &lgr;1, and a second phase of the same data signal traveling on a second wavelength &lgr;2, received consecutively over the link under measurement. A dispersion measurement controller controls operation of the phase measuring unit and characterizes the dispersion of the link at a wavelength of interest &lgr;=(&lgr;1+&lgr;2)/2, based on the first and second phases. The PMU includes a frame detector for determining a first and a second rotation signal indicative of the digital offset between the first and second test clocks with a respective frame start, and a phase detector for measuring the phase of these test clocks with respect to a static reference. The static reference is provided by the same data signal transmitted continuously over a reference wavelength.
    Type: Application
    Filed: January 28, 2002
    Publication date: July 31, 2003
    Applicant: Innovance Networks
    Inventors: Mark Stephen Wight, Andreas Franz Ludwig Sizmann, Mei Du, Alan Glen Solheim
  • Publication number: 20030119201
    Abstract: A method for determining substrate and product concentration in liquid and/or gaseous media is disclosed. Several samples of at least one substance to be analyzed are removed in at least one sampling region by time-controlled diffusion of the analyte between the medium and a diffusion medium, which is fed to the sampling regions through fluid conduits using at least one pump and semipermeable membranes. The diffusion medium is transported to at least one detector while simultaneously new diffusion medium is fed from the sampling region, and analyzed to determine the analyte concentration. The detector provides a temporal concentration distribution or a temporal distribution of a signal proportional to the concentration. A change in the ratio of the signal maximum to the base line is ascertained in the output of the detector signal and, on the basis of this, a change in the diffusion properties of the semipermeable membrane is inferred and a correction factor ascertained.
    Type: Application
    Filed: November 22, 2002
    Publication date: June 26, 2003
    Inventors: Evelyn Wolfram, Matthias Arnold, Andreas Franz, Dirk Weuster-Botz, Christian Wandrey
  • Publication number: 20030117612
    Abstract: Dispersion is measured for an end-to-end link using two carrier wavelengths with a phase-synchronized signal modulated on each, and a single receiver that detects the BER of the combined fields. The power ratio of the two fields is chosen such that the weaker field modulates the eye of the stronger field, leading to slight periodic eye closure BER(&tgr;)≅BER(&tgr;+TB) whenever the relative group delay changes by the bit period TB. The magnitude of the relative group delay can therefore be inferred from the undulated BER response as a function of the wavelength detuning. A fit function is selected for the group delay response and the dispersion parameter D and dispersion slope S are calculated from this fit function after the function parameters are determined.
    Type: Application
    Filed: December 21, 2001
    Publication date: June 26, 2003
    Applicant: Innovance Networks
    Inventors: Mark Stephen Wight, Chung Yu Wu, Andreas Franz Ludwig Sizmann, Alan Glen Solheim
  • Publication number: 20030025598
    Abstract: A method and apparatus for monitoring service-intensive replaceable parts in an assembly in which information regarding a replaceable part (1), such as specifications, physical dimensions, physical properties, functions and/or other data for the replaceable part, is stored on a suitable memory component (5) in and/or on the replaceable part (1). The stored data is read with a reading device at a predetermined time or at predetermined time intervals and transmitted to an evaluation unit. The read data can be compared in the evaluation unit with preset data and, after evaluating the results of the comparison of the data, an appropriate change in the replaceable part or in the operation of the assembly may or may not be carried out.
    Type: Application
    Filed: July 10, 2002
    Publication date: February 6, 2003
    Applicant: Filterwerk Mann & Hummel GmbH
    Inventors: Michael Wolf, Christian Thalmann, Volker Pluecker, Torsten Oberdorfer, Klemens Dworatzek, Horst Escher, Andreas Franz, Andreas Pelz
  • Patent number: 6472658
    Abstract: An incremental position measuring system in the form of a three-grating sensor is optimized in such a way, that the degree of modulation (M) of the incremental scanning device, as well as the intensity (I) of a reference marker signal are relatively strong. To this end, a phase grating with an effective phase deviation of &lgr;/4 is embodied on a scale 2, as well as a reference marker (R) in the form of an amplitude structure. A compact structure is achieved by the divergent illumination of the grating located in front of the scale.
    Type: Grant
    Filed: April 9, 2001
    Date of Patent: October 29, 2002
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar Mayer, Wolfgang Holzapfel, Andreas Franz
  • Publication number: 20020142210
    Abstract: The porous, gas permeable layer substructure (5; 5a, 5b) for a thin, gas impervious layer (89) can in particular be used as a functional component in high temperature fuel cells (8). This layer substructure has a smooth surface (50a) which is suitable for an application of the gas impervious layer or a multi-layer system including the gas impervious layer, with the application being carried out by means of a screen printing method or other coating methods. The smooth surface is formed by a compacted edge zone (50). The edge zone and a carrier structure (51) adjacent to this are made from a uniform substance mixture of sinterable particles. The porosity of the carrier structure is greater than 30 volume percent, preferably greater than 40 volume percent. The pore size of the edge zone is smaller than 10 &mgr;m, preferably smaller than 3 &mgr;m.
    Type: Application
    Filed: January 28, 2002
    Publication date: October 3, 2002
    Applicant: Sulzer Hexis AG
    Inventors: Andreas Franz-Josef Kaiser, Kaspar Honegger, Emad Batawi
  • Publication number: 20020011559
    Abstract: An incremental position measuring system in the form of a three-grating sensor is optimized in such a way, that the degree of modulation (M) of the incremental scanning device, as well as the intensity (I) of a reference marker signal are relatively strong. To this end, a phase grating with an effective phase deviation of &lgr;/4 is embodied on a scale 2, as well as a reference marker (R) in the form of an amplitude structure. A compact structure is achieved by the divergent illumination of the grating located in front of the scale.
    Type: Application
    Filed: April 9, 2001
    Publication date: January 31, 2002
    Inventors: Elmar Mayer, Wolfgang Holzapfel, Andreas Franz
  • Patent number: 5786931
    Abstract: The phase grating of the present invention includes a substrate with a reflective, continuous layer disposed thereon on which a structured spacer layer 3 of dielectric material is applied. To form a phase grating that can be used as a scale in photoelectric position measuring instruments, a further thin reflective surface layer is located solely on the reflective, continuous surfaces, parallel to the layer, of the structured spacer layer.
    Type: Grant
    Filed: April 8, 1996
    Date of Patent: July 28, 1998
    Assignee: Johannes Heidenhain GmbH
    Inventors: Peter Speckbacher, Georg Flatscher, Michael Allgauer, Erich Bayer, Erwin Spanner, Andreas Franz
  • Patent number: 5696584
    Abstract: An uncovered unprotected phase grating includes a substrate which has a relief structure. The relief structure includes a high-refraction material so that even if soiled with impeding ambient media an adequate difference in the index of refraction exists and the diffraction effect is preserved.
    Type: Grant
    Filed: January 26, 1996
    Date of Patent: December 9, 1997
    Assignee: Johannes Heidenhain GmbH
    Inventors: Andreas Franz, Walter Huber
  • Patent number: 5631736
    Abstract: An absolute measuring interferometer having a measuring interferometer, a tunable laser emitting a laser beam and a control interferometer for adjusting the air wavelength of the laser beam. The control interferometer adjusts the air wavelength of the laser beam to a specific wavelength value at the ends of each measuring cycle. The wavelength of the tunable laser is continually tuned within the specific wavelength interval where the phase change of the interference signal is continually detected during the wavelength modulation process. An absolute measurement is determined by a simple mathematical relationship between the measured wavelength and phase changes.
    Type: Grant
    Filed: March 12, 1996
    Date of Patent: May 20, 1997
    Assignee: Dr. Johannes heidenhain GmbH
    Inventors: Jurgen Thiel, Dieter Michel, Andreas Franz
  • Patent number: 5620116
    Abstract: The invention relates to a rotary vane gate for free-flowing bulk material and Comprises a housing provided with housing covers on the end faces as well as with an inlet opening and an outlet opening and a compartmentalised wheel disposed in the housing with a rotatably mounted drive shaft, the wheel having compartments which are axially delimited by limiting plates 11. With a view to a construction which is particularly resistant to pressure shocks and is safe against penetration of flames, a sealed wear plate is provided between each limiting plate of the wheel and the neighbouring housing cover and at least one bypass chamber is provided between this wear plate and the limiting plate. The axial internal width of the inlet opening corresponds at most to the axial internal width of the compartments and the axial internal width of the outlet corresponds approximately to the overall length of the wheel including the bypass chambers.
    Type: Grant
    Filed: January 13, 1995
    Date of Patent: April 15, 1997
    Assignee: Krup Polysius AG
    Inventors: Wolfgang Kluger, Klaus Schwab, Andreas Franz, Dieter Quittek, Bernd Kollner
  • Patent number: 5609761
    Abstract: In a process for the production of a filter medium in particular in the form of a pleated bellows for a filter cartridge for dust separation, at least one surface of the filter medium is provided with an embossed structure, consisting of a multitude of raised embossed elements, preferably in the form of burls or ribs. Furthermore such surfaces of the filter medium are subjected to an additional treatment in the area of the embossed spots by application of a layer of a curable, dryable coating mass and/or heat so that an added mechanical resistance/strength/abrasion resistance is obtained in the area of these treated embossed parts. Due to this process for the production of a filter medium it is possible to create a filter medium--in particular one consisting of mechanically sensitive materials, e.g.
    Type: Grant
    Filed: September 12, 1995
    Date of Patent: March 11, 1997
    Inventor: Andreas Franz
  • Patent number: 5583798
    Abstract: A position measuring method and apparatus for obtaining signals substantially free of harmonics with the aid of a periodic graduation and a non-periodic or aperiodic scanning graduation, wherein the position of the grating lines n within the scanning graduation is determined in accordance with a statistical distribution.
    Type: Grant
    Filed: August 5, 1994
    Date of Patent: December 10, 1996
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Andreas Franz, Wolfgang Holzapfel
  • Patent number: 5576537
    Abstract: A light source which emits light in strips is provided for illuminating a scale of a photoelectric position measuring system. The light modulated by the scale is converted into a sinusoidal scanning signal by a scanning plate. The scanning plate is a semiconductor substrate structured in strips. The width (A) of the light-emitting areas and the width (B) of the interspersed non-emitting areas of the light source is such that defined harmonics are filtered out of the scanning signal. The scanning plate is of such configuration that further harmonics are suppressed.
    Type: Grant
    Filed: July 7, 1994
    Date of Patent: November 19, 1996
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Wolfgang Holzapfel, Andreas Franz
  • Patent number: 5574560
    Abstract: An interferometer having a light source that generates a beam of light. The beam of light is directed to a beam splitter where it is split into a reference beam and a measuring beam. A pair of reflectors reflect the reference and measuring beams towards an interference point. A beam merging element is positioned at the interference point so that the reference and measuring beams interfere with each other at the interference point so that at least two pairs of partial beams which are phase-shifted in relation to each other and interfere with one another are generated. The two pairs of partial beams are received by a plurality of detectors which form directionally dependent measured values.
    Type: Grant
    Filed: February 24, 1995
    Date of Patent: November 12, 1996
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Andreas Franz, Erwin Spanner
  • Patent number: 5521704
    Abstract: An apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser emitting a laser beam. The two measuring interometers each have their own measuring lines and are supplied with the beam from one and the same laser. A reference line is established from the arithmetic sum or difference of the two measuring lines and is maintained at a constant value.
    Type: Grant
    Filed: May 2, 1994
    Date of Patent: May 28, 1996
    Inventors: Jurgen Thiel, Dieter Michel, Andreas Franz
  • Patent number: 5396328
    Abstract: The interferometer comprises a light source, at least one beam splitting means, a beam combiner means, measuring and reference arms as well as wave guides for guiding the light to the beam splitting means and for guiding the light back to photodetectors. Beam splitting means and beam combiner means are formed by integrated optics elements on a substrate. The wave guides on the substrate form a measuring arm (7.sub.1) and two reference arms (6.sub.1, 8.sub.1) which have different optical path lengths for setting a phase difference. An evaluation electronics for determining correct as to signs, the change in optical path length in the measuring arm (7.sub.1) is connected to the photodetectors.
    Type: Grant
    Filed: September 21, 1992
    Date of Patent: March 7, 1995
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Dieter Jestel, Andreas Franz, Dieter Michel
  • Patent number: 5271078
    Abstract: A measurement device having a correction grating associated with a gauge and deflects two diffracted partial beams overlappingly, at a very small angle (.alpha.), onto a single coupling grating. From there, two waveguides located closely beside one another are used to introduce the beams into a coupler and the beams are superimposed and evaluated in a known manner. Thus, a position measuring device can be drastically reduced in its structural size with the aid of an integrated optical component.
    Type: Grant
    Filed: May 20, 1992
    Date of Patent: December 14, 1993
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Andreas Franz, Michael Allgauer
  • Patent number: 5217806
    Abstract: UV-stabilized formed structures from aromatic polyether ketones are coated with at least one film-forming polymer containing at least one UV absorber dissolved or dispersed in said film-forming polymer.
    Type: Grant
    Filed: March 11, 1991
    Date of Patent: June 8, 1993
    Assignee: BASF Aktiengesellschaft
    Inventors: Hans G. Matthies, Rainer Eichler, Andrea Franz