Patents by Inventor Andreas Ortner

Andreas Ortner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Composite Element and Use Thereof
    Publication number: 20160136929
    Abstract: A lightweight composite panel is provided that includes at least one mineral glass or glass-ceramic panel and at least one organic layer. The weight per unit area of the lightweight composite panel is in the range from 0.5 kg/m2 to 5.5 kg/m2, the ratio of the total thickness of the one or more mineral glass or glass-ceramic panels to the total thickness of all of the organic layers is from 1:0.01 to 1:1 and the total thickness of all of the organic layers is less than or equal to 350 ?m. The lightweight composite panel complies with the thermal safety requirements of the air travel authorities and its “Total Heat Release,” measured in accordance with JAR/FAR/CS 25, App. F, Part IV & AITM 2.0006, is less than 65 kW×min/m2 and its flame time after removal of the flame in the “Vertical Bunsen Burner Test”, measured in accordance with FAR/JAR/CS 25, App. F, Part 1 & AITM 2.0002A, is less than 15 s.
    Type: Application
    Filed: January 26, 2016
    Publication date: May 19, 2016
    Applicant: SCHOTT AG
    Inventors: Jens MEISS, Clemens OTTERMANN, Hauke ESEMANN, Joerg Hinrich FECHNER, Andreas ORTNER, Rainer LIEBALD, Klaus-Peter KUREK, Markus HEISS-CHOUQUET
  • SEPARATION OF TRANSPARENT WORKPIECES
    Publication number: 20160031745
    Abstract: A method is provided for preparing transparent workpieces for separation. The method includes generating aligned filament formations extending transversely through the workpiece along an intended breaking line using ultra-short laser pulses.
    Type: Application
    Filed: May 14, 2015
    Publication date: February 4, 2016
    Inventors: Andreas Ortner, Andreas Habeck, Klaus Gerstner, Georg Haselhorst
  • Method and device for detecting cracks in semiconductor substrates
    Patent number: 9157869
    Abstract: A method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells, are provided. The method and apparatus are based on the detection of light deflected at a crack.
    Type: Grant
    Filed: August 13, 2010
    Date of Patent: October 13, 2015
    Assignee: SCHOTT AG
    Inventors: Andreas Ortner, Klaus Gerstner, Hilmar Von Campe, Michael Stelzl
  • METHOD AND DEVICE FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES
    Publication number: 20120307236
    Abstract: The invention relates to a method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells. The method and apparatus are based on the detection of light deflected at a crack.
    Type: Application
    Filed: August 13, 2010
    Publication date: December 6, 2012
    Applicant: SCHOTT AG
    Inventors: Andreas Ortner, Klaus Gerstner, Hilmar Von Campe, Michael Stelzl
  • METHOD FOR THE THERMOGRAPHIC INSPECTION OF NONMETALLIC MATERIALS, PARTICULARLY COATED NONMETALLIC MATERIALS, AS WELL AS METHOD FOR THE PRODUCTION THEREOF AND AN OBJECT PRODUCED ACCORDING TO THE METHOD
    Publication number: 20110189379
    Abstract: A method for the thermographic inspection of nonmetallic materials, particularly coated nonmetallic materials, is provided. The method includes heating at least one part of the surface of the nonmetallic material, preferably a part of the surface furnished with a nonmetallic coating, by a short energy pulse, preferably a light pulse, or by periodic input of heat, and recording the temporal and spatial temperature profile at least at a plurality of successive time points.
    Type: Application
    Filed: April 13, 2009
    Publication date: August 4, 2011
    Inventors: Andreas Ortner, Klaus Gerstner, Ralph Neubecker