Patents by Inventor Anton Schick
Anton Schick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11307022Abstract: Various embodiments may include a measuring device for three-dimensionally sensing elongate cut-outs comprising: an assembly for positioning and fixing on an elongate cut-out of a body; and a 3-D measuring head connectable to the assembly to be aligned with the elongate cut-out for the respective 3-D surface measurement of the elongate cut-out.Type: GrantFiled: December 7, 2016Date of Patent: April 19, 2022Assignee: SIEMENS ENERGY GLOBAL GMBH & CO. KGInventors: Martin Kördel, Helmuth Euler, Anton Schick, Wolfgang Heine, Werner Gergen, Uwe Philippi
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Patent number: 10957042Abstract: A computer-implemented method for analyzing digital holographic microscopy (DHM) data for hematology applications includes receiving a DHM image acquired using a digital holographic microscopy system. The DHM image comprises depictions of one or more cell objects and background. A reference image is generated based on the DHM image. This reference image may then be used to reconstruct a fringe pattern in the DHM image into an optical depth map.Type: GrantFiled: September 22, 2016Date of Patent: March 23, 2021Assignee: Siemens Healthcare GmbHInventors: Saikiran Rapaka, Ali Kamen, Noha El-Zehiry, Bogdan Georgescu, Anton Schick, Uwe Philippi, Oliver Hayden, Lukas Richter, Matthias Ugele
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Patent number: 10882152Abstract: Various embodiments include a structure for positioning a tool on an elongated recess of a workpiece, wherein the elongated recess extends along a first longitudinal axis and has end surfaces on two end faces. The structure may include a plate having a cutout extending along an axis; a centering device; and a clamping device fixedly connected to the plate and the centering device. The cutout, when the second longitudinal axis is aligned parallel to the first longitudinal axis, enframes the elongated recess. The centering device includes a centering jaw movable within the cutout along the second longitudinal axis and also movable into and out of the elongated recess. The clamping device, on the side of the plate facing the elongated recess, includes clamping jaws movable along the second longitudinal axis to come into mechanical contact with one of the end surfaces of the end faces of the elongated recess.Type: GrantFiled: December 7, 2016Date of Patent: January 5, 2021Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Martin Kördel, Helmuth Euler, Anton Schick, Wolfgang Heine
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Publication number: 20190126419Abstract: Various embodiments include a structure for positioning a tool on an elongated recess of a workpiece, wherein the elongated recess extends along a first longitudinal axis and has end surfaces on two end faces. The structure may include a plate having a cutout extending along an axis; a centering device; and a clamping device fixedly connected to the plate and the centering device. The cutout, when the second longitudinal axis is aligned parallel to the first longitudinal axis, enframes the elongated recess. The centering device includes a centering jaw movable within the cutout along the second longitudinal axis and also movable into and out of the elongated recess. The clamping device, on the side of the plate facing the elongated recess, includes clamping jaws movable along the second longitudinal axis to come into mechanical contact with one of the end surfaces of the end faces of the elongated recess.Type: ApplicationFiled: December 7, 2016Publication date: May 2, 2019Applicant: Siemens AktiengesellschaftInventors: Martin Kördel, Helmuth Euler, Anton Schick, Wolfgang Heine
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Publication number: 20190120614Abstract: Various embodiments may include a measuring device for three-dimensionally sensing elongate cut-outs comprising: an assembly for positioning and fixing on an elongate cut-out of a body; and a 3-D measuring head connectable to the assembly to be aligned with the elongate cut-out for the respective 3-D surface measurement of the elongate cut-out.Type: ApplicationFiled: December 7, 2016Publication date: April 25, 2019Applicant: Siemens AktiengesellschaftInventors: Martin Kördel, Helmuth Euler, Anton Schick, Wolfgang Heine, Werner Gergen, Uwe Philippi
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Publication number: 20190113336Abstract: Various embodiments may include a measuring apparatus for the 3D measurement of an object having a recess by means of triangulation comprising: a single capture device; and an optical device placed between the single capture device and the object. The optical device generates a plurality of separate optical paths which divide a single original field of view of the capture device into a plurality of sub-fields of view. The single capture device captures the sub-fields of view separately.Type: ApplicationFiled: October 26, 2016Publication date: April 18, 2019Inventors: Martin Kördel, Helmuth Euler, Anton Schick
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Patent number: 10247548Abstract: A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern.Type: GrantFiled: March 25, 2015Date of Patent: April 2, 2019Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Peter Rentschler, Anton Schick
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Publication number: 20180232882Abstract: A computer-implemented method for analyzing digital holographic microscopy (DHM) data for hematology applications includes receiving a DHM image acquired using a digital holographic microscopy system. The DHM image comprises depictions of one or more cell objects and background. A reference image is generated based on the DHM image. This reference image may then be used to reconstruct a fringe pattern in the DHM image into an optical depth map.Type: ApplicationFiled: September 22, 2016Publication date: August 16, 2018Inventors: Saikiran RAPAKA, Ali KAMEN, Noha EL-ZEHIRY, Bogdan GEORGESCU, Anton SCHICK, Uwe PHILIPPI, Oliver HAYDEN, Lukas RICHTER, Matthias UGELE
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Publication number: 20180189966Abstract: Systems and methods for model augmentation include receiving intra-operative imaging data of an anatomical object of interest at a deformed state. The intra-operative imaging data is stitched into an intra-operative model of the anatomical object of interest at the deformed state. The intra-operative model of the anatomical object of interest at the deformed state is registered with a pre-operative model of the anatomical object of interest at an initial state by deforming the pre-operative model of the anatomical object of interest at the initial state based on a biomechanical model. Texture information from the intra-operative model of the anatomical object of interest at the deformed state is mapped to the deformed pre-operative model to generate a deformed, texture-mapped pre-operative model of the anatomical object of interest.Type: ApplicationFiled: May 7, 2015Publication date: July 5, 2018Inventors: Ali Kamen, Stefan Kluckner, Yao-jen Chang, Tommaso Mansi, Tiziano Passerini, Terrence Chen, Peter Mountney, Anton Schick
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Publication number: 20180120097Abstract: The present disclosure relates to measuring depth of a feature or an object. Teachings thereof may be embodied in a method for optically determining the depth of an object. For example, a method may include: generating a measurement beam and a reference beam with a first coherent light source; projecting an optical pattern with the measurement beam onto a surface of the object; superposing the measurement beam reflected by the surface with the reference beam; recording a first image resulting from the superposition; recording a second image; and determining the depth of the object by evaluating the first and second images. For the recording of the second image, rather than using the first coherent light source, a second coherent light source may be used for generating the measurement beam and the reference beam, the second coherent light source incoherent with respect to the first.Type: ApplicationFiled: January 11, 2016Publication date: May 3, 2018Applicant: Siemens AktiengesellschaftInventor: Anton Schick
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Publication number: 20180113074Abstract: The present disclosure relates to measuring light emission. The teachings thereof may be embodied in emission-measuring devices. For example, a device may include: a sample region; an illumination unit for irradiating the sample region and a sample positioned therein; and a radiation detector. The illumination unit may include: a radiation source; a first dispersive element arranged downstream, decomposing the radiation into spectral components; a first micromirror field arranged downstream; and a second dispersive element arranged downstream of the first micromirror field. The second dispersive element may unify spectral components selected by the first micromirrror field into a common excitation beam.Type: ApplicationFiled: April 30, 2015Publication date: April 26, 2018Applicant: Siemens AktiengesellschaftInventors: Alexander Michael Gigler, Harry Hedler, Remigiusz Pastusiak, Anton Schick
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Publication number: 20180010907Abstract: The present disclosure relates to structured illumination. The teachings thereof may be embodied in devices for reconstruction of a three-dimensional surface of an object by means of a structured illumination for projection of measurement patterns onto the object. For example, a device may include: a projector unit for diffractive projection of a measurement pattern comprising a plurality of measurement points onto the surface; an acquisition unit for acquiring the measurement pattern from the surface; and a computer unit for reconstruction of the surface from a respective distortion of the measurement pattern. All possible positions of measurement elements are contained in the measurement pattern in repeating groups, in which a respective combination of measurement points represents a respective location in the measurement pattern.Type: ApplicationFiled: September 15, 2015Publication date: January 11, 2018Applicant: Siemens AktiengesellschaftInventors: Frank Forster, Anton Schick, Patrick Wissmann
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Publication number: 20170366773Abstract: A projector in an endoscope is used to project visible light onto tissue. The projected intensity, color, and/or wavelength vary by spatial location in the field of view to provide an overlay. Rather than relying on a rendered overlay alpha-blended on a captured image, the illumination with spatial variation physically highlights one or more regions of interest or physically overlays on the tissue.Type: ApplicationFiled: June 21, 2016Publication date: December 21, 2017Inventors: Atilla Kiraly, Ali Kamen, Thomas Pheiffer, Anton Schick
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Patent number: 9702820Abstract: An arrangement for attenuated total reflectance (ATR) infrared spectroscopy uses a reflection matrix for location-resolved spectroscopy of aqueous and/or powdery samples with a high signal-to-noise ratio and without previous complex preparation of the samples. The method of using the reflection matrix produces imaging of the sample with a high signal strength.Type: GrantFiled: March 5, 2014Date of Patent: July 11, 2017Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Florian Benedikt Geiger, Martin Kördel, Anton Schick
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Patent number: 9693027Abstract: An arrangement is disclosed for increasing dynamics in color-coded triangulation by using an adapted narrow band color filter. Spectral passage ranges of the color filter overlap with sensitive spectral ranges of a camera sensor. However, the spectral passage ranges are, in contrast to the sensitive spectral ranges of the camera sensor, spectrally disjunct, and the transmitted colors can therefore be clearly identified.Type: GrantFiled: June 11, 2014Date of Patent: June 27, 2017Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Helmuth Euler, Peter Rentschler, Anton Schick
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Publication number: 20170030710Abstract: A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern.Type: ApplicationFiled: March 25, 2015Publication date: February 2, 2017Applicant: Siemens AktiengesellschaftInventors: Peter Rentschler, Anton Schick
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Publication number: 20170020393Abstract: An endoscope for determining the depth of a partial area of a cavity by a triangulation analysis may include a projection channel for projecting a pattern onto a surface of the cavity and an imaging channel provided for imaging an image of the projected pattern reflected by the surface of the cavity. The projection channel may have at least one diffractive optical element for producing the pattern, a collimator, and a focusing lens. The focusing lens may be arranged between the collimator and the diffractive optical element.Type: ApplicationFiled: February 26, 2015Publication date: January 26, 2017Applicant: Siemens AktiengesellschaftInventors: Peter Rentschler, Anton Schick
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Publication number: 20170014030Abstract: An endoscope for determining the depth of a subregion of a cavity may include at least one imaging channel having a first optical axis, with at least one first optical deflection device arranged in the at least one imaging channel. The optical deflection device may be designed to transversely offset the first optical axis parallel to the first optical axis.Type: ApplicationFiled: February 26, 2015Publication date: January 19, 2017Applicant: Siemens AktiengesellschaftInventors: Peter Rentschler, Anton Schick
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Patent number: 9410999Abstract: Electrically conductive structures produced on or in a substrate, or produced such that the structures are floating in a substrate undergo simple and reliable capacitive contactless and non-destructive inspection using a capacitive sensor having at least two sensor electrode surfaces which are arranged at different constant distances from one another parallel to a surface of the substrate and are arranged beside one another relative to the surface of the substrate.Type: GrantFiled: August 2, 2012Date of Patent: August 9, 2016Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Fatih Alatas, Martin Kördel, Anton Schick
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Patent number: 9404741Abstract: A device and a method for determining three dimensional surface coordinates of an object by means of optical color triangulation are proposed, wherein all lines of a color fringe pattern in each case have a width (BR) set in such a way that, in a recorded image of the line, all contrast maxima (CMax), of all spectral components of a line are equal to a minimum contrast value (CMin) is provided. Proceeding from an invariable smallest width of a pattern line with a spectral component of highest contrast, further lines can be correspondingly widened. The invention is particularly advantageously suitable for a 3D measurement for biological tissue.Type: GrantFiled: April 26, 2013Date of Patent: August 2, 2016Assignee: SIEMENS AKTIENGESELLSCHAFTInventor: Anton Schick