Abstract: A multiple-axis imaging system having individually-adjustable optical elements and a method for individually adjusting optical elements of the system. The system comprises a plurality of optical elements having respective optical axes and being individually disposed with respect to one another to image respective sections of an object, and a plurality of individually-operable positioning devices corresponding to respective optical elements for positioning the optical elements with respect to their respective optical axes. The positioning devices are specifically adapted to adjust the axial position, lateral position and angular orientation of the optical elements with respect to their respective optical axes. The system is particularly adapted for use as a microscope array, and the positioning devices may be micro-actuators.

Abstract: The sample stage of an array microscope is tilted in the scanning direction such that the best-focus plane of the array microscope intersects the surface of the sample during the scan. As a result of the tilt, the distance from the sample surface of each miniaturized microscope spanning the array varies from point to point on the surface. Accordingly, the best focal distance for each such point on the sample surface is identified by tracking the quality of its focus as the sample surface travels across the rows of microscopes in the array. Best focus may be detected using any known technique, such as by measuring spatial frequency content and recording the scan position corresponding to maximum mid-range frequency content. This information is used to develop a best-focus axial-position map for use while performing a subsequent measurement scan.

Abstract: A single-axis illumination system for a multiple-axis imaging system, particularly an array microscope. A single-axis illumination system is used to trans-illuminate an object viewed with an array of imaging elements having multiple respective axes. The numerical apertures of the imaging elements are preferably matched to the numerical aperture of the illumination system. For Kohler illumination, the light source is placed effectively at the front focal plane of the illumination system. For critical illumination, the light source is effectively imaged onto the object plane of the imaging system. The light from a single axis source is separated by a holographic element into fields of view corresponding to respective imaging elements of the array microscope so as to match the numerical aperture thereof.

Abstract: A method and system for limiting the amount of image data to be captured by a scanning imaging array. A low-resolution preliminary image of an object is acquired. Data from the preliminary image is used to identify features of interest in the object or to perform other image analyses that do not require a high-resolution image. Thereafter a scanning imaging array may be used to acquire a high-resolution image of only limited areas of the object including the features of interest or of only limited object characteristics. In one embodiment, the preliminary image is acquired using a separate, linear scanning array extending laterally with respect to the scan direction of the scanning imaging array. In another embodiment, an under sampled portion of the imaging elements of the scanning imaging array, or detectors thereof, is used to pre-scan the object to produce the low-resolution preliminary image.

Abstract: A microscope stage providing improved optical performance. A carriage for supporting an object has a transparent portion for receiving the object and permitting trans-illumination thereof. A base supports the carriage, at least a portion of the base comprising a transparent material to permit illumination of the specimen there through. Bearings disposed between the base and the carriage support the carriage on the base and permit relative movement thereof. The base has a dovetail cross sectional shape with bearings between the top of the carriage and the base and between the sidewalls of the carriage and the base. A cover is coupled to the carriage so as to transfer force thereto without imparting a significant movement thereto. A mechanism connected to the cover for moving the carriage relative to the base is disposed at a position offset from the axis of lateral symmetry of the carriage and base.

Abstract: A method for referencing image data. Preferred methods include methods for linking, characterizing, searching, and navigating the image data, as aids to reviewing the image data.

Abstract: A multi-mode scanning imaging system. The system includes a plurality of sets of optical elements and a scanning mechanism. Each set is disposed with respect to a corresponding image plane and configured to image respective portions of an object. A scanning mechanism produces relative translation between the sets and the object so as to scan the object. Sets of image sensors corresponding to the sets of optical elements are adapted to capture image data representative of the respective portions of the object. A mode implementation system coordinates the image data according to one or more desired modes of operation of the imaging system.

Abstract: An imaging system with an integrated source and detector array. A plurality of light detectors are arranged in an array and a corresponding plurality of light sources are arranged in an array in an epi-illumination system so that light radiated from a point on the object illuminated by a given source is detected by a corresponding detector. An optical system is disposed so as to illuminate an object with light from the source array and image the object on the detector array. Ordinarily, the sources and detectors are coplanar and, preferably, are fabricated or at least mounted on the same substrate. In one embodiment the Airy pattern of the point response of the optical system encompasses both a detector and corresponding light sources. In another embodiment, the optical pathway is split by a diffractive element to produce conjugate points corresponding to light sources and their respective detectors. In a further embodiment, the pathway is split by a Wollaston prism.

Abstract: A multiple-axis imaging system having optical elements whose optimal image positions can be individually adjusted, comprising a plurality of optical array elements having respective optical axes and being individually disposed with respect to one another to image respective sections of an object; and a plurality of image position shifting devices corresponding to respective optical elements for separately establishing the image positions for a plurality of the optical array elements. The multi-axis imaging system preferably comprises a miniaturized microscope array. The shifting devices may comprise wavelength filters or optical-path-length-altering elements, such as a plane parallel plates. The devices may also comprise a pair of wedges that adjustably overlap one another, the wedges having apexes that point in opposite directions and respective corresponding planar surfaces that are parallel to one another.

Abstract: A microscope array for simultaneously imaging multiple objects. A preferred embodiment of a method according to the invention includes arranging the objects into an array, providing a microscope array having a plurality of imaging elements with respective fields of view arranged into a corresponding array such that the imaging elements are optically aligned respectively with the objects, and simultaneously imaging the objects with the microscope array to produce respective images of the objects. The invention also provides for scanning while imaging, and for stepping and repeating the imaging process.

Abstract: An imaging system with an integrated source and detector array. A plurality of light detectors are arranged in a detector array and a plurality of light sources corresponding to detectors in the detector array are arranged in a source array in an epi-illumination system so that light radiated from a point on the object illuminated by a given source is detected by a corresponding detector. An optical system is disposed with respect to the source array and the detector array so as to illuminate an object with light from the source array and image the object on the detector array. Ordinarily, the sources and detectors are coplanar and, preferably, are fabricated or at least mounted on the same substrate. One or more sources in the source array may have a corresponding plurality of detectors, and one or more detectors in the detector array may have a corresponding plurality of sources.

Abstract: An epi-illumination system for an array microscope. For Kohler illumination, illumination light sources are placed, actually or virtually, at the pupils of respective individual microscope elements of an array microscope. In one Kohler illumination embodiment, the light source is a point source comprising the tip of an optical fiber placed on the optical axis at the pupil of its corresponding microscope element. In another Kohler illumination embodiment, the illumination light is provided by a reflective boundary placed on the optical axis of a corresponding microscope element. For critical illumination the light sources are placed at locations conjugate with their respective object planes so as to image the light sources thereon.