Abstract: There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state.

Abstract: There is provided a method of placing a plurality of operational cells of a semiconductor device within a semiconductor layout, comprising determining timing data for each of the plurality of operational cells, determining switching activity from RTL or design constraints for each of the plurality of operational cells, determining power grid switch locations relative to each of the plurality of operational cells, deriving a cost function based upon the determined timing data, determined switching activity from RTL/design constraints and determined relative power grid switch locations and initially placing the plurality of operational cells according to the derived cost function.

Abstract: A method generates scan patterns for testing an electronic device called DUT having a scan path. A scan tester is arranged for executing a scan shift mode and a capture mode. A scan test interface has a clock control unit for stretching a shift cycle of the scan clock in dependence of a scan clock pattern. The method determines at least one power shift cycle which is expected to cause a voltage drop of a supply voltage exceeding a predetermined threshold during respective shift cycles of the scan shift mode, and generates, in addition to the scan pattern, a scan clock pattern indicative of stretching the power shift cycle. Advantageously, a relatively high scan shift frequency may be used while avoiding detrimental effects of said voltage drop by extending the respective power shift cycle, whereby test time and yield loss are reduced.

Abstract: A There is proposed a method and device for simulating a semiconductor IC is provided, which comprises generating a high level description of the IC, generating a low level description of the IC comprising a plurality of instances describing the operation of the IC, conducting a low level function analysis of the IC based on metrics values associated with the instances, and performing a design optimization scheme. The scheme comprises mapping the metric values of instances describing functional units different from standard cells, to standard cells logically connected to said instances, by dividing each of the instance metrics values between a group of standard cells logically connected to the corresponding instance and adding each resulting portion of said instance metric value to the metric value of each of the group of standard cells, respectively.

Abstract: A method and apparatus for selecting data path elements for cloning within an integrated circuit (IC) design is described. The method comprises performing timing analysis of at least one data path within the IC design to determine at least one timing slack value for the at least one data path, calculating at least one annotated delay value for cloning a candidate element within the at least one data path, calculating at least one modified slack value for the at least one data path in accordance with the at least one calculated annotated delay value, and validating the cloning of the candidate element based at least partly on the at least one modified slack value.

Abstract: A mechanism for generating gate-level activity data for use in clock gating efficiency analysis of an integrated circuit (IC) design is provided. Generating the gate-level activity data includes generating a signal behaviour description for inter-register signals, generating a gate-level netlist for the IC design, generating gate-level stimuli based at least partly on the generated signal behaviour description, and performing gate-level simulation using the generated gate-level stimuli to generate gate-level activity data for the IC design. In one embodiment, generating the signal behaviour description includes performing Register Transfer Level (RTL) simulation of the IC design, and generating the gate-level netlist includes performing RTL synthesis. The RTL simulation and RTL synthesis are performed on RTL data for the IC design.

Abstract: There is provided a method of placing a plurality of operational cells of a semiconductor device within a semiconductor layout, comprising determining timing data for each of the plurality of operational cells, determining switching activity from RTL or design constraints for each of the plurality of operational cells, determining power grid switch locations relative to each of the plurality of operational cells, deriving a cost function based upon the determined timing data, determined switching activity from RTL/design constraints and determined relative power grid switch locations and initially placing the plurality of operational cells according to the derived cost function.

Abstract: A mechanism for generating gate-level activity data for use in clock gating efficiency analysis of an integrated circuit (IC) design is provided. Generating the gate-level activity data includes generating a signal behaviour description for inter-register signals, generating a gate-level netlist for the IC design, generating gate-level stimuli based at least partly on the generated signal behaviour description, and performing gate-level simulation using the generated gate-level stimuli to generate gate-level activity data for the IC design. In one embodiment, generating the signal behaviour description includes performing Register Transfer Level (RTL) simulation of the IC design, and generating the gate-level netlist includes performing RTL synthesis. The RTL simulation and RTL synthesis are performed on RTL data for the IC design.

Abstract: The invention pertains to a method for ranking paths for power optimization of an integrated circuit design, comprising identifying a plurality of paths of the integrated circuit design, each path comprising one or more instances of electronic devices providing an instance power estimate for each instance in the identified paths providing, for each identified path, at least one weighted power estimate based on the instance power estimates for instances in the path, and providing a ranking of the paths based on the least one weighted power estimate. The invention also pertains to a corresponding computer program product.