Abstract: The present disclosure provides a memory device, which includes a memory array, a read-clock generation circuit, and a local input/output circuit. The read-clock generation circuit receives a sense amplifier enable signal, a first sense amplifier pre-charge signal, and a latched write enable signal to generate a first read enable signal. The local input/output circuit includes multiple pairs of column-address pass gates, and a pair of read pass gates. The plurality of pairs of column-address pass gates are configured to receive data from a bit-line pair of the memory cells in a row selected by an address signal. The pair of read pass gates connects a read bit-line pair to the bit-line pair in response to the first read enable signal being in a low-logic state. The first read enable signal is de-asserted after the read bit-line pair connected to the pair of read pass gates are pre-charged.

Abstract: Systems, methods, and devices are described herein for a word line interlock circuit. A device includes a first logic gate, an interlock circuit, and a delay circuit. The first logic gate is configured to receive a reset signal. The interlock circuit is coupled to an output of the first logic gate and is configured to generate a first signal and selectively operate the first logic gate. The delay circuit is coupled to an output of the interlock circuit and is configured to receive the first signal from the interlock circuit and delay the first signal to generate a clock pulse width signal that is fed back to the interlock circuit. In response to the reset signal changing logic states, the selective operation of the first logic gate prevents changing edges of the reset signal from being transmitted to the delay circuit.

Abstract: Systems and methods are provided for controlling a wake-up operation of a memory circuit. The memory circuit is configured to precharge the bit lines of a memory array sequentially during wakeup. A sleep signal is received by the first bit line of a memory cell and then a designed delay occurs prior to the precharge of a second complementary bit line. The sleep signal may then precharge the bit lines of a second memory cell with further delay between the precharge of each bit line. The memory circuit is configured to precharge both bit lines of a memory cell at the same time when an operation associated with that cell is designated.

Abstract: A memory circuit includes a first memory cell operatively accessible through a first access line and a second access line; a first read pass-gate transistor and a second read pass-gate transistor coupled to the first access line and second access line, respectively; a first sense amplifier coupled to the first access line and the second access line; a first read enable control circuit configured to generate a first read enable signal based on a clock signal; and a second read enable control circuit configured to generate a second read enable signal. The first read enable signal selectively transitions to a different logic state based on a first sense enable signal. The second read enable signal is configured to activate or deactivate both the first and second read pass-gate transistors, and the first sense enable signal is configured to activate or deactivate the first sense amplifier.

Abstract: Circuits and methods are provided for a clock generation circuit that includes a first transistor, wherein a gate of the first transistor is connected to a clock signal, a second transistor, connected in parallel to the first transistor, and a driving circuit, coupled to the second transistor, and comprising an input and an output, wherein the input of the driving circuit is connected to the clock signal, the output of the driving circuit is connected to a gate of the second transistor, and the driving circuit is configured to reduce a slew of the clock signal.

Abstract: A memory circuit may comprise a memory array, a first tracking cell, a second tracking cell, a first tracking circuit, and a second tracking circuit. A first portion of the memory array may comprise a plurality of first nominal memory cells coupled to a first bit line segment extending along a first lateral direction. A second portion of the memory array may comprise a plurality of second nominal memory cells coupled to a second bit line segment and a third bit line segment both extending along the first lateral direction. The first tracking circuit can be configured to activate the first tracking cell, in response to at least one of the first nominal memory cells being selected. The second tracking circuit can be configured to activate the second tracking cell, in response to at least one of the second nominal memory cells being selected.

Abstract: Devices, circuits, and methods are provided. A circuit comprises a tracking word line circuit that is configured to receive an internal clock signal, a turbo signal, and a read enable signal, and to generate a first tracking reading signal and a first tracking writing signal in response to the internal clock signal the turbo signal, and the write enable signal. The circuit also comprises a tracking bit line circuit configured to receive the first tracking reading signal and the first tracking writing signal, wherein the tracking bit line circuit is configured to generate a tracking bit line signal in response to the first tracking reading signal and the first tracking writing signal, wherein the tracking word line circuit is configured to generate a reset signal in response to the tracking bit line signal and transmit the reset signal to the clock generator.

Abstract: A memory device includes an array of memory cells, a bit line connected to the memory cells, and a power supply voltage input terminal configured to receive a power supply voltage at a first voltage level to operate the memory cells at the first voltage level. A bit line precharge circuit has an input terminal configured to receive the power supply voltage at the first voltage level, and the bit line precharge circuit is configured to precharge the bit lines to a second voltage level lower than the first voltage level.

Abstract: Memory clock drivers, memories, and methods of operating memory clock drivers are provided. A memory device contains two memory clock drivers disposed opposite each other across an array of rows of memory cells. The memory clock drivers contain decoders, which decode an address corresponding to one or more rows of memory cells. The decoders are configured to decode the address to provide a plurality of word line signals to the corresponding rows of memory cells. The memory device also includes a row select circuit, which receives a row select address and activates a corresponding row of memory cells. The memory device includes control circuitry to control the arrays of memory cells at a local and a global level, as well as I/O modules to send signals to different parts of the memory device and integrate the memory device into external devices.

Abstract: Disclosed herein are related to a memory device. In one aspect, the memory device includes a memory cell, a precharge circuit, a reset voltage control circuit, and a logic control circuit. In one aspect, the precharge circuit is configured to set a voltage of the bit line to a first voltage level. In one aspect, the reset voltage control circuit includes a transistor coupled to the bit line to set the voltage of the bit line to a second voltage level. The transistor can be arranged or operate as a diode. In one aspect, the logic control circuit is configured to cause the reset voltage control circuit to set the voltage of the bit line to the second voltage level during a reset phase and cause the precharge circuit to set the voltage of the bit line to the first voltage level during a precharge phase after the reset phase.

Abstract: A semiconductor device includes a memory bank and first and second clock generators. The first clock generator includes a first transistor configured to receive an external clock signal. The first clock generator is configured to generate a global clock signal that is based on the external clock signal and that controls writing to and reading from the memory bank. The second clock generator includes a first transistor configured to receive the external clock signal. The second clock generator is configured to generate a pipeline clock signal that is based on the external clock signal and that controls a pipeline operation of reading from the memory bank. Methods of operating the first and second clock generators are also disclosed.

Abstract: Disclosed herein are related to reducing power consumption of a memory device when transitioning from a sleep state to an operational state. In one aspect, the memory device includes a memory cell to store data. In one aspect, the memory device includes an output driver configured to: generate an output signal indicating the stored data, in response to a sleep tracking signal indicating that the memory cell is in the operational state, and generate the output signal having a predetermined voltage irrespective of the stored data, in response to the sleep tracking signal indicating that the memory cell is in the sleep state. In one aspect, the sleep tracking signal is delayed from a sleep control signal causing the memory cell to operate in the sleep state or the operational state.

Abstract: Systems and methods are provided for controlling a wake-up operation of a memory circuit. The memory circuit is configured to precharge the bit lines of a memory array sequentially during wakeup. A sleep signal is received by the first bit line of a memory cell and then a designed delay occurs prior to the precharge of a second complementary bit line. The sleep signal may then precharge the bit lines of a second memory cell with further delay between the precharge of each bit line. The memory circuit is configured to precharge both bit lines of a memory cell at the same time when an operation associated with that cell is designated.

Abstract: A memory circuit includes a set of memory cells configured to store data, and a local input output (LIO) circuit coupled to a global bit line and the set of memory cells. The LIO circuit includes a driver circuit configured to generate a global bit line signal in response to a first signal or an inverted first signal, and a booster circuit coupled to the driver circuit and the global bit line, and configured to adjust the global bit line signal in response to a delayed global bit line signal. The booster circuit includes a first inverter configured to generate a second signal in response to the global bit line signal, a delay circuit configured to generate a delayed second signal in response to the second signal, and a second inverter configured to generate a third signal in response to the delayed second signal.

Abstract: Systems, methods, and devices are described herein for a word line interlock circuit. A device includes a first logic gate, an interlock circuit, and a delay circuit. The first logic gate is configured to receive a reset signal. The interlock circuit is coupled to an output of the first logic gate and is configured to generate a first signal and selectively operate the first logic gate. The delay circuit is coupled to an output of the interlock circuit and is configured to receive the first signal from the interlock circuit and delay the first signal to generate a clock pulse width signal that is fed back to the interlock circuit. In response to the reset signal changing logic states, the selective operation of the first logic gate prevents changing edges of the reset signal from being transmitted to the delay circuit.

Abstract: Disclosed herein are related to a memory device. In one aspect, the memory device includes a memory cell, a precharge circuit, a reset voltage control circuit, and a logic control circuit. In one aspect, the precharge circuit is configured to set a voltage of the bit line to a first voltage level. In one aspect, the reset voltage control circuit includes a transistor coupled to the bit line to set the voltage of the bit line to a second voltage level. The transistor can be arranged or operate as a diode. In one aspect, the logic control circuit is configured to cause the reset voltage control circuit to set the voltage of the bit line to the second voltage level during a reset phase and cause the precharge circuit to set the voltage of the bit line to the first voltage level during a precharge phase after the reset phase.

Abstract: A semiconductor device includes a memory bank and first and second clock generators. The first clock generator includes a first transistor configured to receive an external clock signal. The first clock generator is configured to generate a global clock signal that is based on the external clock signal and that controls writing to and reading from the memory bank. The second clock generator includes a first transistor configured to receive the external clock signal. The second clock generator is configured to generate a pipeline clock signal that is based on the external clock signal and that controls a pipeline operation of reading from the memory bank. Methods of operating the first and second clock generators are also disclosed.

Abstract: Signal edge sharpener circuitry is operably connected to the word lines in a memory array to pull up a rising edge of a signal on the word line and/or to pull down a falling edge of the signal on the word line. Pulling the signal up and/or down reduces the amount of time the word line is asserted and reduces the amount of time between precharge operations.

Abstract: In some aspects of the present disclosure, a memory device is disclosed. In some aspects, the memory device includes a plurality of memory cells arranged in an array, an input/output (I/O) interface connected to the plurality of memory cells to output data signal from each memory cell, and a control circuit. In some embodiments, the control circuit includes a first clock generator to generate a first clock signal and a second clock signal according to an input clock signal and a chip enable (CE) signal and provide the first clock signal to the plurality of memory cells. In some embodiments, the control circuit includes a second clock generator to generate a third clock signal according to the input clock signal and a DFT (design for testability) enable signal. In some embodiments, the control circuit generates an output clock signal according to the second clock signal or the third clock signal.

Abstract: Systems and methods are provided for controlling a wake-up operation of a memory circuit. The memory circuit may include a memory array with a plurality of memory cells, first logic circuitry, first switching circuitry, first latch circuitry, and second switching circuitry. The first logic circuitry may be configured to generate a first bit line pre-charge signal for a first memory cell of the plurality of memory cells, where the first bit line pre-charge signal is generated in response to a sleep signal. The first switching circuitry may be configured to provide power to one or more bit line of the first memory cell in response to the first bit line pre-charge signal. The first latch circuit may receive the sleep signal and the first bit line pre-charge signal and generate a delayed sleep signal.