Patents by Inventor Aya Kuribayashi

Aya Kuribayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analysis apparatus
    Patent number: 7711091
    Abstract: An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.
    Type: Grant
    Filed: July 23, 2007
    Date of Patent: May 4, 2010
    Assignee: Rigaku Corporation
    Inventors: Akito Sasaki, Aya Kuribayashi, Keiichi Morikawa, Kunio Nishi, Takao Ohara, Toshiyuki Kato, Yuji Tsuji
  • X-ray analysis apparatus
    Publication number: 20080056452
    Abstract: An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.
    Type: Application
    Filed: July 23, 2007
    Publication date: March 6, 2008
    Applicant: Rigaku Corporation
    Inventors: Akito Sasaki, Aya Kuribayashi, Keiichi Morikawa, Kunio Nishi, Takao Ohara, Toshiyuki Kato, Yuji Tsuji
  • X-ray analysis device
    Patent number: D566278
    Type: Grant
    Filed: January 25, 2006
    Date of Patent: April 8, 2008
    Assignee: Rigaku Corporation
    Inventors: Akira Echizenya, Aya Kuribayashi, Toru Mitsunaga, Mari Ookawa