X-ray analysis device

- Rigaku Corporation
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Description

FIG. 1 is a front elevational view of an x-ray analysis device showing our new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a left side elevational view thereof;

FIG. 7 is a perspective view thereof, showing a front door being opened to a fully opened position;

FIG. 8 is a front elevational view showing a front door being opened to a middle position; and,

FIG. 9 is a front elevational view showing a front door being opened to a fully open position.

Claims

The ornamental design for an x-ray analysis device, as shown and described.

Referenced Cited
U.S. Patent Documents
D332273 January 5, 1993 Maliszewski et al.
D334980 April 20, 1993 Pritchard
D380273 June 24, 1997 Emerson et al.
D408915 April 27, 1999 Ogiwara
D491272 June 8, 2004 Alden et al.
6826253 November 30, 2004 Greenbank et al.
Patent History
Patent number: D566278
Type: Grant
Filed: Jan 25, 2006
Date of Patent: Apr 8, 2008
Assignee: Rigaku Corporation (Tokyo)
Inventors: Akira Echizenya (Tokyo), Aya Kuribayashi (Tokyo), Toru Mitsunaga (Tokyo), Mari Ookawa (Tokyo)
Primary Examiner: Ian Simmons
Assistant Examiner: Anhdao Doan
Attorney: Buchanan Ingersoll & Rooney, PC
Application Number: 29/252,553
Classifications