X-ray analysis device
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Description
Claims
The ornamental design for an x-ray analysis device, as shown and described.
Referenced Cited
Patent History
Patent number: D566278
Type: Grant
Filed: Jan 25, 2006
Date of Patent: Apr 8, 2008
Assignee: Rigaku Corporation (Tokyo)
Inventors: Akira Echizenya (Tokyo), Aya Kuribayashi (Tokyo), Toru Mitsunaga (Tokyo), Mari Ookawa (Tokyo)
Primary Examiner: Ian Simmons
Assistant Examiner: Anhdao Doan
Attorney: Buchanan Ingersoll & Rooney, PC
Application Number: 29/252,553
Type: Grant
Filed: Jan 25, 2006
Date of Patent: Apr 8, 2008
Assignee: Rigaku Corporation (Tokyo)
Inventors: Akira Echizenya (Tokyo), Aya Kuribayashi (Tokyo), Toru Mitsunaga (Tokyo), Mari Ookawa (Tokyo)
Primary Examiner: Ian Simmons
Assistant Examiner: Anhdao Doan
Attorney: Buchanan Ingersoll & Rooney, PC
Application Number: 29/252,553
Classifications
Current U.S. Class:
Image Generation Or Radiation Therapy (35) (D24/158)