Abstract: The device and process of this invention provide for eliminating reading errors caused by over-erased cells by subsequently applying alternating erasing and programming pulses to the cells of an EEPROM array, starting with relatively high-energy-level erasing and programming voltages, decreasing the energy-level of each of the alternating erasing and programming voltages. The initial, relatively high-energy-level pulses should have sufficient energy to cause all of the cells to be programmed and to cause all of the cells to be over-erased. The energy-levels are decreased until electron transfer between floating gate and a source or drain region ceases. As the energy-levels are decreased, the threshold voltage range of the memory cells is compacted. The final threshold voltages are distributed within a preselected narrow range of positive values that are less than a predetermined wordline select voltage.

Abstract: An integrated-circuit memory-array configuration for providing less total access time when used in conjunction with a microprocessor. The configuration includes a line buffer with perhaps 256 latches for storing data, and first and second pipeline circuits for sensing linearity and locality of access information pertaining to the requested data. When used with a microprocessor that is programmed with repeated requests for the same data, a majority of the data requests will be transmitted quickly from the line buffer. If the data requests are not in the line buffer, the configuration furnishes a signal to the microprocessor and the requested data are moved from the floating-gate memory cell array to the line buffer for subsequent transmittal to the microprocessor.

Abstract: A zero-power bit circuit comprised in part of a pair of single-level poly transistors having opposite impurity-type channels, the pair connected to accomplish the programming function of a floating-gate transistor. The circuit includes sensing transistors for sensing the presence of absence of charge on the commonly connected gates of a transistor quadruplet comprised of the programming pair and sensing transistors. A diode-connected transistor, an isolation transistor and an inverter-buffer are also included in the bit circuit.

Abstract: A zero-power bit circuit comprised in part of a pair of single-level poly transistors with opposite impurity-type channels, the pair connected to accomplish the programming function of a floating-gate transistor. The circuit includes three programming/isolating transistors and an inverter-buffer.

Abstract: A zero-power programmable bit circuit comprised of a programmable-inverter means with an isolation transistor and with an inverter-buffer. The programmable-inverter means is includes at least one enhancement-mode transistor pair with common floating gates and includes a diode-connected transistor. The isolation transistor protects the inverter-buffer from programming voltages. The inverter-buffer may be comprised of an inverter with a feedback transistor.