Abstract: Bone anchor assemblies are disclosed herein that can provide for improved fixation as compared with traditional bone anchor assemblies. An exemplary assembly can include a bracket or wing that extends down from the receiver member. The distal portion of the wing can define a bone anchor opening through which one or more auxiliary bone anchors can be disposed to augment the fixation of the assembly's primary bone anchor. A distal surface of the distal portion of the wing can be obliquely angled relative to a proximal-distal axis of the spanning portion to face one of a caudal direction or a cephalad direction. A distal surface of the distal portion of the wing can be obliquely angled relative to the proximal-distal axis of the spanning portion to face one of a medial direction or a lateral direction. Surgical methods using the bone anchor assemblies described herein are also disclosed.

Abstract: Bone anchor assemblies are disclosed herein that can provide for improved fixation as compared with traditional bone anchor assemblies. An exemplary assembly can include a bracket or wing that extends down from the receiver member. The distal portion of the wing can define a bone anchor opening through which one or more auxiliary bone anchors can be disposed to augment the fixation of the assembly's primary bone anchor. A distal surface of the distal portion of the wing can be obliquely angled relative to a proximal-distal axis of the spanning portion to face one of a caudal direction or a cephalad direction. A distal surface of the distal portion of the wing can be obliquely angled relative to the proximal-distal axis of the spanning portion to face one of a medial direction or a lateral direction. Surgical methods using the bone anchor assemblies described herein are also disclosed.

Abstract: An elevated tank tower includes a foundation, and a support structure including a plurality of stacked segments. One or more of the plurality segment is unitarily constructed from precast concrete configured to extend around the entirety of an outer perimeter of the support structure. Each of the stacked segments is connected to an adjacent segment with one or more spanning plates connected to the adjacent segments. A superstructure is positioned atop of the support structure and operably connected to an uppermost segment of the plurality of segments. A containment tank is positioned atop the superstructure.

Abstract: A detector for detecting terahertz electromagnetic radiation comprises a substrate and a pair of electrically isolated detector elements supported thereon. Each detector element comprises a pair of antenna elements having a gap therebetween and a switch element comprising one or more pieces of photoconductive semiconductor material connected between the antenna elements across the gap. The pairs of antenna elements of the respective detector elements are configured so that, when the switch element is conductive, current is generated between the antenna elements by polarisation components of incident terahertz electromagnetic radiation having polarisation directions in respective sensing directions that are perpendicular, thereby providing simultaneous detection of perpendicular polarisation components of incident terahertz electromagnetic radiation.

Abstract: Bone anchor assemblies are disclosed herein that can provide for improved fixation as compared with traditional bone anchor assemblies. An exemplary assembly can include a bracket or wing that extends down from the receiver member. The distal portion of the wing can define a bone anchor opening through which one or more auxiliary bone anchors can be disposed to augment the fixation of the assembly's primary bone anchor. A distal surface of the distal portion of the wing can be obliquely angled relative to a proximal-distal axis of the spanning portion to face one of a caudal direction or a cephalad direction. A distal surface of the distal portion of the wing can be obliquely angled relative to the proximal-distal axis of the spanning portion to face one of a medial direction or a lateral direction. Surgical methods using the bone anchor assemblies described herein are also disclosed.

Abstract: Bone anchor assemblies are disclosed herein that can provide for improved fixation as compared with traditional bone anchor assemblies. An exemplary assembly can include a bracket or wing that extends down from the receiver member. The distal portion of the wing can define a bone anchor opening through which one or more auxiliary bone anchors can be disposed to augment the fixation of the assembly's primary bone anchor. A distal surface of the distal portion of the wing can be obliquely angled relative to a proximal-distal axis of the spanning portion to face one of a caudal direction or a cephalad direction. A distal surface of the distal portion of the wing can be obliquely angled relative to the proximal-distal axis of the spanning portion to face one of a medial direction or a lateral direction. Surgical methods using the bone anchor assemblies described herein are also disclosed.

Abstract: An insert for a radiant tube of a furnace including a first section adapted to absorb heat from combustion gases passing through the radiant tube and radiantly transfer the heat to a wall of the radiant tube and a second section for directing heat and gases in the radiant tube toward the first section of the insert and a system including a radiant tube and one or more such inserts. Also, a method of improving heat transfer from a radiant tube of a furnace to the material being heated including supplying an insert as described above and placing the insert into the radiant tube such that the first section corresponds to a portion of the radiant tube that is closest to the material being heated. Also, an insert for a radiant tube of a furnace including a ceramic body and a metal deposited on the surface of the ceramic body.

Abstract: An insert for a radiant tube of a furnace including a first section adapted to absorb heat from combustion gases passing through the radiant tube and radiantly transfer the heat to a wall of the radiant tube and a second section for directing heat and gases in the radiant tube toward the first section of the insert and a system including a radiant tube and one or more such inserts. Also, a method of improving heat transfer from a radiant tube of a furnace to the material being heated including supplying an insert as described above and placing the insert into the radiant tube such that the first section corresponds to a portion of the radiant tube that is closest to the material being heated. Also, an insert for a radiant tube of a furnace including a ceramic body and a metal deposited on the surface of the ceramic body.

Abstract: An insert for a radiant tube of a furnace including a first section adapted to absorb heat from combustion gases passing through the radiant tube and radiantly transfer the heat to a wall of the radiant tube and a second section for directing heat and gases in the radiant tube toward the first section of the insert and a system including a radiant tube and one or more such inserts. Also, a method of improving heat transfer from a radiant tube of a furnace to the material being heated including supplying an insert as described above and placing the insert into the radiant tube such that the first section corresponds to a portion of the radiant tube that is closest to the material being heated. Also, an insert for a radiant tube of a furnace including a ceramic body and a metal deposited on the surface of the ceramic body.

Abstract: A system and method for supporting and transferring a substrate relative to a plurality of testing columns are provided. The system includes a testing table adapted to support and move the substrate relative to the plurality of testing columns. The testing table may include an end effector disposed therein to transfer the substrate relative to an upper surface of the testing table. The method includes transferring the substrate to the testing table and moving the substrate relative to the plurality of testing columns. Signals indicative of electronic device performance are sensed to determine operability of the devices on the substrate.

Abstract: A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.

Abstract: Systems and methods for debris extraction reduce the lifting force on the workpiece through a supply air feature. The supply air feature can be implemented through an extraction nozzle, which has an outer supply duct surrounding an inner exhaust duct. Further reduction of the lifting force can be realized through the use of multiple extraction nozzles which limit exhaust airflow to areas of the workpiece with active laser scribing.

Abstract: Methods, systems and apparatus are provided for use with an inkjet printing system. In some embodiments, an apparatus is provided, comprising an adapter including one or more supply lines, wherein the one or more supply lines are adapted to transmit at least one of ink and solvent to a print head. Numerous other aspects are provided.

Abstract: A system and method for supporting and transferring a substrate relative to a plurality of testing columns are provided. The system includes a testing table adapted to support and move the substrate relative to the plurality of testing columns. The testing table may include an end effector disposed therein to transfer the substrate relative to an upper surface of the testing table. The method includes transferring the substrate to the testing table and moving the substrate relative to the plurality of testing columns. Signals indicative of electronic device performance are sensed to determine operability of the devices on the substrate.

Abstract: An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame. The electrical pins may be movable along the axial length of the prober bars, or may be selectively pushed down to contact selected contact pads on the substrate.

Abstract: A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.

Abstract: A substrate table and method for supporting and transferring a substrate are provided. The substrate table includes a segmented stage having an upper surface for supporting a substrate, and an end effector. The end effector includes two or more spaced apart fingers and an upper surface for supporting a substrate. The end effector is at least partially disposed and moveable within the segmented stage such that the fingers of the end effector and the segmented stage interdigitate to occupy the same horizontal plane. The segmented stage is adapted to raise and lower about the end effector.

Abstract: An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame.

Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.

Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.