Patents by Inventor Benoit Lepage

Benoit Lepage has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11029289
    Abstract: Disclosed is an apparatus and method for TFM post-processing of a FMC or HMC matrix acquired with an ultrasonic array probe. Post-processing is performed by calculating TFM beam forming amplitudes using round-trip delays to a focal point lying at depth d on a line at angle ? within the test object. Based on the beam forming amplitudes over a range of values of d within the imaging volume, a calculated A-scan is derived, which is equivalent to the response A-scan produced in conventional phased array imaging, but has the advantage of being focused at all points along the line. By post-calculation of calculated A-scans over a range of angles ? within the imaging volume, an imaging method is derived which is readily adapted to existing codes based on conventional A-scan imaging.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: June 8, 2021
    Assignee: Olympus America Inc.
    Inventors: Jason Habermehl, Benoit Lepage
  • Publication number: 20210132004
    Abstract: An acoustic technique can be used for performing non-destructive testing. For example, a method for acoustic evaluation of a target can include generating respective acoustic transmission events via selected transmitting ones of a plurality of electroacoustic transducers, and in response to the respective acoustic transmission events, receiving respective acoustic echo signals using other receiving ones of the plurality of electroacoustic transducers, and coherently summing representations of the respective received acoustic echo signals to generate a pixel or voxel value corresponding to a specified spatial location of the target. Such summation can include weighting contributions from the respective representations to suppress contributions from acoustic propagation paths outside a specified angular range with respect to a surface on or within the target, such as to provide an acoustic path-filtered total focusing method (PF-TFM).
    Type: Application
    Filed: March 31, 2020
    Publication date: May 6, 2021
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Publication number: 20210088480
    Abstract: Example embodiments of the present invention relate to methods, systems, and a computer program product for acquiring phased array ultrasonic testing data leveraging a sliding receiver aperture defined according to a principle of acoustic reciprocity. The method includes triggering each of a set of ultrasonic probe elements to pulse as a pulser element. For each pulser element, a respective subset of the ultrasonic probe elements may be defined as the sliding receiver aperture according to a principle of acoustic reciprocity to act as receiver elements to receive response signals. Data corresponding to the respective response signals for each pair of pulser element and receiver element then may be stored.
    Type: Application
    Filed: September 19, 2019
    Publication date: March 25, 2021
    Applicant: Olympus Scientific Solutions Americas Corp.
    Inventor: Benoit Lepage
  • Patent number: 10908122
    Abstract: Disclosed is a phased array ultrasound total focusing method in which the ultrasound energy is transmitted as plane waves and the response signals are processed as plane waves. The processing is adaptively corrected to account for geometric variations in the probes and the part being inspected. Methods are disclosed for measuring the geometric variations of the probes and the part.
    Type: Grant
    Filed: March 29, 2017
    Date of Patent: February 2, 2021
    Assignee: Olympus America Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April, Jason Habermehl
  • Publication number: 20210010975
    Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.
    Type: Application
    Filed: September 28, 2020
    Publication date: January 14, 2021
    Inventor: Benoit Lepage
  • Patent number: 10775346
    Abstract: Disclosed is an apparatus and method for generating virtual inspection channels mid-way between the physical inspection channels of an eddy current array probe, thereby reducing the coverage loss and improving defect sizing and imaging. The method is based upon a calibration to determine the mid-channel coverage loss for parallel defects having their long axis parallel to the scanning direction. Based on the coverage loss measurement, a vector analysis system is constructed enabling generation of virtual channel signals which are available for processing in the same way as physical channels, with impedance plane representation including real and/or imaginary signal components. The system differentiates between parallel and perpendicular defects and employs different algorithms to generate virtual channel signals for parallel and perpendicular defect orientations.
    Type: Grant
    Filed: January 30, 2017
    Date of Patent: September 15, 2020
    Assignee: OLYMPUS AMERICA INC.
    Inventor: Benoit Lepage
  • Publication number: 20200278323
    Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving a plurality of scan plan parameters associated with generating an image of at least one flaw within a specimen based on acoustic echo data obtained using full matrix capture (FMC); applying the plurality of scan plan parameters to an acoustic model, the acoustic model configured to determine a two-way pressure response of a plurality of inspection modes based on specular reflection and diffraction phenomena; generating, by the acoustic model based on the plurality of scan plan parameters, an acoustic region of influence (AROI) comprising an acoustic amplitude sensitivity map for a first inspection mode amongst the plurality of inspection modes; and generating, for display, a first image comprising the AROI associated with the first inspection mode for capturing or inspecting the image of the at least one flaw.
    Type: Application
    Filed: February 24, 2020
    Publication date: September 3, 2020
    Inventors: Chi-Hang Kwan, Nicolas Badeau, Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 10578589
    Abstract: Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: March 3, 2020
    Assignee: Olympus Scientific Solutions Americas Inc.
    Inventors: Nicolas Badeau, Guillaume Painchaud-April, Benoit Lepage
  • Patent number: 10561404
    Abstract: Disclosed is a calibration system and method for a phased array ultrasound pipe inspection system, in which reliable calibration is obtained for notches at all angles using only a small number of notches for the calibration. The method comprises a one-time normalization step and a system calibration step which may be performed at regular intervals. Ultrasound transmission is in a single diverging beam for each aperture, while reception is selective for multiple well-defined reception angles. During the normalization step, plots of maximum response vs reception angle are plotted for each notch, and a normalization curve is constructed by fitting the maxima of these plots. The normalization curve is used to derive calibration targets at specific reception angles for specific calibration notches, which are then used for the system calibrations.
    Type: Grant
    Filed: June 2, 2017
    Date of Patent: February 18, 2020
    Assignee: Olympus Scientific Solutions Americas Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April, Christophe Imbert, Charles Grimard
  • Publication number: 20200049670
    Abstract: Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the ?6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.
    Type: Application
    Filed: October 18, 2019
    Publication date: February 13, 2020
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Patent number: 10309934
    Abstract: Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.
    Type: Grant
    Filed: March 29, 2017
    Date of Patent: June 4, 2019
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC
    Inventors: Cécile Brütt, Guillaume Painchaud-April, Chi-Hang Kwan, Benoit Lepage
  • Patent number: 10156548
    Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: December 18, 2018
    Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
  • Publication number: 20180348170
    Abstract: Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.
    Type: Application
    Filed: May 31, 2018
    Publication date: December 6, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Nicolas Badeau, Guillaume Painchaud-April, Benoit Lepage
  • Patent number: 10101304
    Abstract: Disclosed is a calibration method and system for non-destructive testing and inspection (NDT/NDI). The method and system involve establishment of a reference database by conducting FMC acquisition on a first calibration block having standardly known indications with a first series of depths and under a laboratory standard calibration condition. Then phased-array operation is conducted on a second calibration block, which is substantially the same as the first block, having indications with a series of corresponding user measured depths and under a second calibration condition as close to the laboratory condition as possible. The calibration is then made with the gain compensation calculated based on the response signals from the indications of the second block, the first series of gain data from the reference database, and the user measured depths for the corresponding indications under the second calibration condition.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: October 16, 2018
    Inventors: Jinchi Zhang, Benoit Lepage
  • Publication number: 20180284069
    Abstract: Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.
    Type: Application
    Filed: March 29, 2017
    Publication date: October 4, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Cécile BRÜTT, Guillaume Painchaud-April, Chi-Hang Kwan, Benoit Lepage
  • Publication number: 20180231508
    Abstract: Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the ?6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.
    Type: Application
    Filed: February 10, 2017
    Publication date: August 16, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Publication number: 20180217099
    Abstract: Disclosed is an apparatus and method for generating virtual inspection channels mid-way between the physical inspection channels of an eddy current array probe, thereby reducing the coverage loss and improving defect sizing and imaging. The method is based upon a calibration to determine the mid-channel coverage loss for parallel defects having their long axis parallel to the scanning direction. Based on the coverage loss measurement, a vector analysis system is constructed enabling generation of virtual channel signals which are available for processing in the same way as physical channels, with impedance plane representation including real and/or imaginary signal components. The system differentiates between parallel and perpendicular defects and employs different algorithms to generate virtual channel signals for parallel and perpendicular defect orientations.
    Type: Application
    Filed: January 30, 2017
    Publication date: August 2, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Publication number: 20180180578
    Abstract: Disclosed is an apparatus and method for TFM post-processing of a FMC or HMC matrix acquired with an ultrasonic array probe. Post-processing is performed by calculating TFM beam forming amplitudes using round-trip delays to a focal point lying at depth d on a line at angle ? within the test object. Based on the beam forming amplitudes over a range of values of d within the imaging volume, a calculated A-scan is derived, which is equivalent to the response A-scan produced in conventional phased array imaging, but has the advantage of being focused at all points along the line. By post-calculation of calculated A-scans over a range of angles ? within the imaging volume, an imaging method is derived which is readily adapted to existing codes based on conventional A-scan imaging.
    Type: Application
    Filed: December 20, 2017
    Publication date: June 28, 2018
    Inventors: Jason Habermehl, Benoit Lepage
  • Publication number: 20180143161
    Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.
    Type: Application
    Filed: January 16, 2018
    Publication date: May 24, 2018
    Inventor: Benoit Lepage
  • Publication number: 20180113100
    Abstract: Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.
    Type: Application
    Filed: October 25, 2016
    Publication date: April 26, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Martin St-Laurent, Jason Habermehl, Pierre Langlois, Benoit Lepage