Patents by Inventor Benoit Lepage

Benoit Lepage has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200049670
    Abstract: Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the ?6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.
    Type: Application
    Filed: October 18, 2019
    Publication date: February 13, 2020
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Patent number: 10309934
    Abstract: Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.
    Type: Grant
    Filed: March 29, 2017
    Date of Patent: June 4, 2019
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC
    Inventors: Cécile Brütt, Guillaume Painchaud-April, Chi-Hang Kwan, Benoit Lepage
  • Patent number: 10156548
    Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: December 18, 2018
    Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
  • Publication number: 20180348170
    Abstract: Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.
    Type: Application
    Filed: May 31, 2018
    Publication date: December 6, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Nicolas Badeau, Guillaume Painchaud-April, Benoit Lepage
  • Patent number: 10101304
    Abstract: Disclosed is a calibration method and system for non-destructive testing and inspection (NDT/NDI). The method and system involve establishment of a reference database by conducting FMC acquisition on a first calibration block having standardly known indications with a first series of depths and under a laboratory standard calibration condition. Then phased-array operation is conducted on a second calibration block, which is substantially the same as the first block, having indications with a series of corresponding user measured depths and under a second calibration condition as close to the laboratory condition as possible. The calibration is then made with the gain compensation calculated based on the response signals from the indications of the second block, the first series of gain data from the reference database, and the user measured depths for the corresponding indications under the second calibration condition.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: October 16, 2018
    Inventors: Jinchi Zhang, Benoit Lepage
  • Publication number: 20180284069
    Abstract: Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.
    Type: Application
    Filed: March 29, 2017
    Publication date: October 4, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Cécile BRÜTT, Guillaume Painchaud-April, Chi-Hang Kwan, Benoit Lepage
  • Publication number: 20180231508
    Abstract: Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the ?6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.
    Type: Application
    Filed: February 10, 2017
    Publication date: August 16, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Publication number: 20180217099
    Abstract: Disclosed is an apparatus and method for generating virtual inspection channels mid-way between the physical inspection channels of an eddy current array probe, thereby reducing the coverage loss and improving defect sizing and imaging. The method is based upon a calibration to determine the mid-channel coverage loss for parallel defects having their long axis parallel to the scanning direction. Based on the coverage loss measurement, a vector analysis system is constructed enabling generation of virtual channel signals which are available for processing in the same way as physical channels, with impedance plane representation including real and/or imaginary signal components. The system differentiates between parallel and perpendicular defects and employs different algorithms to generate virtual channel signals for parallel and perpendicular defect orientations.
    Type: Application
    Filed: January 30, 2017
    Publication date: August 2, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Benoit Lepage
  • Publication number: 20180180578
    Abstract: Disclosed is an apparatus and method for TFM post-processing of a FMC or HMC matrix acquired with an ultrasonic array probe. Post-processing is performed by calculating TFM beam forming amplitudes using round-trip delays to a focal point lying at depth d on a line at angle ? within the test object. Based on the beam forming amplitudes over a range of values of d within the imaging volume, a calculated A-scan is derived, which is equivalent to the response A-scan produced in conventional phased array imaging, but has the advantage of being focused at all points along the line. By post-calculation of calculated A-scans over a range of angles ? within the imaging volume, an imaging method is derived which is readily adapted to existing codes based on conventional A-scan imaging.
    Type: Application
    Filed: December 20, 2017
    Publication date: June 28, 2018
    Inventors: Jason Habermehl, Benoit Lepage
  • Publication number: 20180143161
    Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.
    Type: Application
    Filed: January 16, 2018
    Publication date: May 24, 2018
    Inventor: Benoit Lepage
  • Publication number: 20180113100
    Abstract: Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.
    Type: Application
    Filed: October 25, 2016
    Publication date: April 26, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Martin St-Laurent, Jason Habermehl, Pierre Langlois, Benoit Lepage
  • Patent number: 9952185
    Abstract: The method of validating a calibration of a phased-array inspection instrument uses a calibration block having two reflectors located below an inspection surface at two different depths.
    Type: Grant
    Filed: July 2, 2015
    Date of Patent: April 24, 2018
    Assignee: Olympus Scientific Solutions America
    Inventors: Antoine Delhomme, Benoit Lepage
  • Publication number: 20180000460
    Abstract: Disclosed is a calibration system and method for a phased array ultrasound pipe inspection system, in which reliable calibration is obtained for notches at all angles using only a small number of notches for the calibration. The method comprises a one-time normalization step and a system calibration step which may be performed at regular intervals. Ultrasound transmission is in a single diverging beam for each aperture, while reception is selective for multiple well-defined reception angles. During the normalization step, plots of maximum response vs reception angle are plotted for each notch, and a normalization curve is constructed by fitting the maxima of these plots. The normalization curve is used to derive calibration targets at specific reception angles for specific calibration notches, which are then used for the system calibrations.
    Type: Application
    Filed: June 2, 2017
    Publication date: January 4, 2018
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April, Christophe Imbert, Charles Grimard
  • Publication number: 20170284972
    Abstract: Disclosed is a phased array ultrasound total focusing method in which the ultrasound energy is transmitted as plane waves and the response signals are processed as plane waves. The processing is adaptively corrected to account for geometric variations in the probes and the part being inspected. Methods are disclosed for measuring the geometric variations of the probes and the part.
    Type: Application
    Filed: March 29, 2017
    Publication date: October 5, 2017
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April, Jason Habermehl
  • Patent number: 9759692
    Abstract: A phased array ultrasonic inspection system configured for weld inspection includes a data analysis process with automated and optimized gating to take into account the actual distance between a phased array probe and a weld line. The system embodies a weld tracking module and a dynamic gating module. The tracking module produces dynamically corrected overlays of the weld line based on the echo signals, the dynamically corrected overlays having a series of offsets from the corresponding initial overlays. The dynamic gating module purposefully positions a plurality of data analysis gates to filter out noise signals caused by sources unrelated to the weld, and to provide dynamic target gating adjusted by at least part of the offset.
    Type: Grant
    Filed: May 27, 2015
    Date of Patent: September 12, 2017
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Martin St-Laurent, Benoit Lepage
  • Patent number: 9625424
    Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.
    Type: Grant
    Filed: February 13, 2015
    Date of Patent: April 18, 2017
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Benoit LePage, Martin St-Laurent
  • Patent number: 9523660
    Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: December 20, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 9476859
    Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: October 25, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Jason Habermehl, Benoit LePage, Guillaume Painchaud-April
  • Publication number: 20160290972
    Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.
    Type: Application
    Filed: March 31, 2015
    Publication date: October 6, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Publication number: 20160238566
    Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.
    Type: Application
    Filed: February 13, 2015
    Publication date: August 18, 2016
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Benoit LePage, Martin St-Laurent