Patents by Inventor Benoit Lepage

Benoit Lepage has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9316618
    Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: April 19, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit LePage
  • Publication number: 20150377840
    Abstract: Disclosed is a calibration method and system for non-destructive testing and inspection (NDT/NDI). The method and system involve establishment of a reference database by conducting FMC acquisition on a first calibration block having standardly known indications with a first series of depths and under a laboratory standard calibration condition. Then phased-array operation is conducted on a second calibration block, which is substantially the same as the first block, having indications with a series of corresponding user measured depths and under a second calibration condition as close to the laboratory condition as possible. The calibration is then made with the gain compensation calculated based on the response signals from the indications of the second block, the first series of gain data from the reference database, and the user measured depths for the corresponding indications under the second calibration condition.
    Type: Application
    Filed: June 29, 2015
    Publication date: December 31, 2015
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Jinchi Zhang, Benoit Lepage
  • Publication number: 20150346164
    Abstract: A phased array ultrasonic inspection system configured for weld inspection includes a data analysis process with automated and optimized gating to take into account the actual distance between a phased array probe and a weld line. The system embodies a weld tracking module and a dynamic gating module. The tracking module produces dynamically corrected overlays of the weld line based on the echo signals, the dynamically corrected overlays having a series of offsets from the corresponding initial overlays. The dynamic gating module purposefully positions a plurality of data analysis gates to filter out noise signals caused by sources unrelated to the weld, and to provide dynamic target gating adjusted by at least part of the offset.
    Type: Application
    Filed: May 27, 2015
    Publication date: December 3, 2015
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Martin St-Laurent, Benoit Lepage
  • Publication number: 20150276679
    Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.
    Type: Application
    Filed: March 26, 2014
    Publication date: October 1, 2015
    Inventor: Benoit LePAGE
  • Patent number: 9110036
    Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: August 18, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit Lepage
  • Publication number: 20150168355
    Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.
    Type: Application
    Filed: December 16, 2013
    Publication date: June 18, 2015
    Inventors: Jason HABERMEHL, Benoit LePAGE, Guillaume PAINCHAUD-APRIL
  • Patent number: 9032802
    Abstract: A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.
    Type: Grant
    Filed: January 25, 2013
    Date of Patent: May 19, 2015
    Assignee: OLYMPUS NDT
    Inventors: Christophe Imbert, Jinchi Zhang, Benoit Lepage
  • Publication number: 20150039245
    Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.
    Type: Application
    Filed: July 31, 2013
    Publication date: February 5, 2015
    Applicant: OLYMPUS NDT INC.
    Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
  • Patent number: 8896300
    Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.
    Type: Grant
    Filed: July 8, 2010
    Date of Patent: November 25, 2014
    Assignee: Olympus NDT Inc.
    Inventor: Benoit Lepage
  • Patent number: 8816680
    Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.
    Type: Grant
    Filed: August 23, 2013
    Date of Patent: August 26, 2014
    Assignee: Olympus NDT Inc.
    Inventor: Benoit LePage
  • Patent number: 8704513
    Abstract: A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.
    Type: Grant
    Filed: February 16, 2011
    Date of Patent: April 22, 2014
    Assignee: Olympus NDT Inc.
    Inventor: Benoit Lepage
  • Patent number: 8698778
    Abstract: A touch screen is disclosed which responds to a user's touch for re-drawing, re-scaling, re-translating and re-positioning an impedance plane signal received from non-destructive testing equipment, such as an eddy current sensor. The impedance plane is manipulated by slidingne, two or more fingers simultaneously to an end position to effectuate a complete re-drawing operation of the image.
    Type: Grant
    Filed: July 30, 2012
    Date of Patent: April 15, 2014
    Assignee: Olympus NDT
    Inventors: Jason Habermehl, Benoit Lepage, Tommy Bourgelas
  • Patent number: 8700342
    Abstract: A multi-frequency bond-testing system using acoustic probes in conjunction with NDT/NDI inspection instruments. Bond-testing of test objects is carried out at multiple discrete frequencies to produce a single, combined amplitude C-scan. Alternatively, or in combination, the system provides a single, combined phase C-scan to enable proper interpretation of the C-scans. Amplitude and/or phase readings on test objects are normalized at the selected frequencies relative to tests performed on a defect-free object at those frequencies. In this manner, the non-linear behavior of a bond-testing probe over a frequency range chosen for a given inspection is compensated for. The invention enables providing more easily interpretable and sharper images which enable a more reliable and faster reading and identification of defects in the test objects.
    Type: Grant
    Filed: November 18, 2009
    Date of Patent: April 15, 2014
    Assignee: Olympus NDT Inc.
    Inventors: Benoit Lepage, Jason Habermehl
  • Publication number: 20140035568
    Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.
    Type: Application
    Filed: July 31, 2013
    Publication date: February 6, 2014
    Applicant: OLYMPUS NDT INC.
    Inventor: Benoit Lepage
  • Publication number: 20140028608
    Abstract: A touch screen is disclosed which responds to a user's touch for re-drawing, re-scaling, re-translating and re-positioning an impedance plane signal received from non-destructive testing equipment, such as an eddy current sensor. The impedance plane is manipulated by slidingne, two or more fingers simultaneously to an end position to effectuate a complete re-drawing operation of the image.
    Type: Application
    Filed: July 30, 2012
    Publication date: January 30, 2014
    Inventors: Jason Habermehl, Benoit Lepage, Tommy Bourgelas
  • Publication number: 20140002072
    Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.
    Type: Application
    Filed: August 23, 2013
    Publication date: January 2, 2014
    Applicant: Olympus NDT Inc.
    Inventor: Benoit LEPAGE
  • Publication number: 20130249540
    Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.
    Type: Application
    Filed: March 22, 2012
    Publication date: September 26, 2013
    Applicant: OLYMPUS NDT INC.
    Inventor: Benoit Lepage
  • Patent number: 8519702
    Abstract: An orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal [b1] prism. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe provides advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.
    Type: Grant
    Filed: July 30, 2010
    Date of Patent: August 27, 2013
    Assignee: Olympus NDT Inc.
    Inventor: Benoit Lepage
  • Publication number: 20130199297
    Abstract: A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.
    Type: Application
    Filed: January 25, 2013
    Publication date: August 8, 2013
    Inventors: Christophe Imbert, Jinchi Zhang, Benoit Lepage
  • Patent number: 8310229
    Abstract: An intelligent eddy current array probe comprising a plurality of coil elements and an embedded non-volatile memory element is disclosed. Prior to coupling the intelligent eddy current array probe to an NDI system, a data table describing a desired firing sequence for the array probe within a given inspection operation is created. This data table is then stored within the embedded non-volatile memory element of the intelligent eddy current array probe such that when the array probe is coupled to the NDI system, the elements of the NDI system can load and execute the stored firing sequence without operator intervention. In this way, a plurality of intelligent eddy current array probes, each with its own firing sequence, can be used interchangeably within a single NDI system without the need for mechanical adjustments to the NDI system.
    Type: Grant
    Filed: March 25, 2009
    Date of Patent: November 13, 2012
    Assignee: Olympus NDT
    Inventors: Tommy Bourgelas, Benoit Lepage