Abstract: Methodologies, systems, apparatus, and non-transitory computer-readable media are described herein to facilitate acquisition of volumetric data and volumetric image reconstruction. An imaging system can be configured to transport an object at a speed relative to the scan path of an X-ray source such that insufficient measurement data is collected for classically complete geometrical coverage. Iterative image reconstruction techniques may be used to generate volumetric images based on measured volumetric data of at least a portion of the object.

Abstract: Methodologies, systems, apparatus, and non-transitory computer-readable media are described herein to facilitate acquisition of volumetric data and volumetric image reconstruction. An imaging system can be configured to transport an object at a speed relative to the scan path of an X-ray source such that insufficient measurement data is collected for classically complete geometrical coverage. Iterative image reconstruction techniques may be used to generate volumetric images based on measured volumetric data of at least a portion of the object.

Abstract: A system and method for imaging objects with a sparse detector array that includes fewer detectors than conventional x-ray scanning systems. The sparse detector array is positioned to receive x-ray radiation from the at least one x-ray source after passing through an inspection area. The sparse detector array includes a plurality of rows of detector elements, wherein at least some of the plurality of rows are separated by gaps such that the at least some of the plurality of rows are non-contiguous. An iterative reconstruction process is used to determine a volumetric image of the object from the radiation measurements recorded by the detectors in the sparse detector array.

Abstract: An inspection system that makes dual energy measurements with a detector array that has selective placement of filter elements adjacent a subset of detectors in the array to provide at least two subsets of detector elements sensitive to X-rays of different energies. Dual energy measurements may be made on objects of interest within an item under inspection by forming a volumetric image using measurements from detectors in a first of the subsets and synthetic readings computed from measurements made with detectors in the array, including those that are filtered. The volumetric image may be used to identify the objects of interest to and source points that, for each object of interest, provide a low interference path to one of the detectors in the second of the subsets. Measurements made with radiation emanating from those source points are used for dual energy analysis of the objects of interest.

Abstract: A signal is reconstructed from multiple radiation sources. Data detected by a detector is accessed. The data includes a combined representation of radiation emitted concurrently from two sources of radiation. A representation of the radiation emitted from one of the two sources of radiation is determined from the data.

Abstract: A system and method for forming volumetric images of an imaged object based on multiple radiation measurements of the object taken from different angles. A first volumetric image of the object may be calculated using a direct reconstruction method from a plurality of radiation measurements of the object. At least one iteration of an iterative reconstruction method may be performed to compute a second volumetric image of the object. The iterative reconstruction method may be initialized with the first volumetric image of the object.

Abstract: A system and method for imaging objects with a sparse detector array that includes fewer detectors than conventional x-ray scanning systems. The sparse detector array is positioned to receive x-ray radiation from the at least one x-ray source after passing through an inspection area. The sparse detector array includes a plurality of rows of detector elements, wherein at least some of the plurality of rows are separated by gaps such that the at least some of the plurality of rows are non-contiguous. An iterative reconstruction process is used to determine a volumetric image of the object from the radiation measurements recorded by the detectors in the sparse detector array.

Abstract: A dual energy inspection system that generates X-rays with an electron beam scanned over targets. A switchable voltage source that can be change its voltage output may cause X-rays to be generated at different energies. This X-ray generation subsystem is controlled by a sequencer that provides beam steering and shaping control inputs that may be dependent on the voltage provided by the voltage source. In another aspect, the dual energy inspection system may use multiple types of detectors, each sensitive to X-rays of a different energy. A relatively small number of detectors sensitive to one energy level is provided. Nonetheless, dual energy measurements may be made on objects within an item under inspection by identifying points that, for each object of interest, provide a low interference path to one of those detectors. Measurements made with radiation emanating from those points are used for dual energy analysis of those objects.

Abstract: A system and method for forming volumetric images of an imaged object based on multiple radiation measurements of the object taken from different angles. A first volumetric image of the object may be calculated using a direct reconstruction method from a plurality of radiation measurements of the object. At least one iteration of an iterative reconstruction method may be performed to compute a second volumetric image of the object. The iterative reconstruction method may be initialized with the first volumetric image of the object.

Abstract: In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

Abstract: In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

Abstract: A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Abstract: A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Abstract: Apparatus for scanning large cargo to detect concealed contents include a mobile platform configured to carry and position at least one X-ray or gamma-ray source and at least one detector array at a plurality of positions with respect to a stationary cargo. The detector array may be mounted on a boom moveably affixed to the mobile platform. Multiple measurements of radiation passing through the cargo for various source-detector orientations can be used to compute volumetric images of concealed content within the cargo.

Abstract: A distribution of heavy particle stopping power is be determined. A distribution of effective atomic number of a three-dimensional space is accessed, and a distribution of an x-ray stopping power of the three-dimensional space is accessed. A conversion is applied to the distribution of the effective atomic number and the distribution of x-ray stopping power. A distribution of the heavy particle stopping power of the three-dimensional space is generated based on the conversion, the heavy particle stopping power being an indication of a depth of penetration for a heavy particle incident on the three-dimensional space.

Abstract: A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Abstract: X-ray radiation is generated at a target that emits x-ray radiation in response to being struck by accelerated electrons, the electrons being emitted by a cathode that emits electrons in response to being illuminated by electromagnetic radiation from a source, and the x-ray radiation is moved by orienting a surface that directs the electromagnetic radiation from the source toward the cathode.

Abstract: A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Abstract: A dual energy inspection system that generates X-rays with an electron beam scanned over targets. A switchable voltage source that can be change its voltage output may cause X-rays to be generated at different energies. This X-ray generation subsystem is controlled by a sequencer that provides beam steering and shaping control inputs that may be dependent on the voltage provided by the voltage source. In another aspect, the dual energy inspection system may use multiple types of detectors, each sensitive to X-rays of a different energy. A relatively small number of detectors sensitive to one energy level is provided. Nonetheless, dual energy measurements may be made on objects within an item under inspection by identifying points that, for each object of interest, provide a low interference path to one of those detectors. Measurements made with radiation emanating from those points are used for dual energy analysis of those objects.

Abstract: An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.