Abstract: Various novel apparatuses and methods for generating X-rays are disclosed. In some embodiments, for example, an apparatus may be configured and arranged so that, for at least one interception point on a particular portion of a scan path on a surface of a target along which a steering element steers an accelerated electron beam (e-beam), both an angle and its complement between a line corresponding to a direction in which the accelerated e-beam is traveling at the interception point and a line oriented normal to the surface of the target at such interception point are greater than forty five degrees.

Abstract: A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Abstract: A distribution of heavy particle stopping power is be determined. A distribution of effective atomic number of a three-dimensional space is accessed, and a distribution of an x-ray stopping power of the three-dimensional space is accessed. A conversion is applied to the distribution of the effective atomic number and the distribution of x-ray stopping power. A distribution of the heavy particle stopping power of the three-dimensional space is generated based on the conversion, the heavy particle stopping power being an indication of a depth of penetration for a heavy particle incident on the three-dimensional space.

Abstract: A method for operating an inspection system is disclosed in which an item under inspection may be moved between radiation sources and detectors illuminated by the sources. The radiation sources may be positioned such that radiation from at least some of the sources impinge on the radiation detectors, forming acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection. The processing may be performed using an algebraic reconstruction technique using an inverse system matrix. The inverse matrix can be derived without first computing a transpose of the system matrix.

Abstract: A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Abstract: A dual energy X-ray source for use in an explosive detection system includes only a single power supply and only a single X-ray tube. The X-ray tube includes only two electron guns and only a single anode. Each electron gun has its own grid and cathode. The X-ray source switches between producing a higher energy X-ray and producing a lower energy X-ray at a frequency of at least 4000 Hz.

Abstract: X-ray radiation is generated at a target that emits x-ray radiation in response to being struck by accelerated electrons, the electrons being emitted by a cathode that emits electrons in response to being illuminated by electromagnetic radiation from a source, and the x-ray radiation is moved by orienting a surface that directs the electromagnetic radiation from the source toward the cathode.

Abstract: A dual energy X-ray source for use in an explosive detection system includes only a single power supply and only a single X-ray tube. The X-ray tube includes only two electron guns and only a single anode. Each electron gun has its own grid and cathode. The X-ray source switches between producing a higher energy X-ray and producing a lower energy X-ray at a frequency of at least 4000 Hz.

Abstract: Various novel apparatuses and methods for generating X-rays are disclosed. In some embodiments, for example, an apparatus may be configured and arranged so that, for at least one interception point on a particular portion of a scan path on a surface of a target along which a steering element steers an accelerated electron beam (e-beam), both an angle and its complement between a line corresponding to a direction in which the accelerated e-beam is traveling at the interception point and a line oriented normal to the surface of the target at such interception point are greater than forty five degrees.

Abstract: A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Abstract: A method for operating an inspection system is disclosed in which an item under inspection may be moved in a first direction relative to and at least partially between at least one radiation source and at least some radiation detectors illuminated by the at least one radiation source. The radiation source and detectors may be operated such that ray paths extending linearly between the at least one radiation source and at least some of the radiation detectors form acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection.

Abstract: An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

Abstract: A radiation (e.g., X-ray) source and collimator assembly with no moving parts provides a swept-line scan of radiation suitable for imaging or analyzing radiation scattered from an object. Scatter radiation is sensed by (e.g., scintillation devices) to produce a signal which is then able to be processed to produce an image, or to be analyzed.

Abstract: A novel pressure sensor mechanism is provided which includes both a novel pressure sensor assembly and a novel handle for use therewith. The pressure sensor assembly has at least one pressure sensor at its distal end, the pressure sensor having electrodes which are connected through spaced leads to output terminals at a proximal end of the assembly. Even though sensor electrodes and leads may be on facing substrate sections of the assembly, the assembly is designed so as to permit all output terminals to be electrically accessed from the same side of the sensor assembly. An additional output terminal may be provided for preferred embodiments, which terminal is accessible from the same side of the sensor assembly as the other two output terminals, is substantially smaller than the other two output terminals and is connected to one of the other two output terminals by a sensor-ok lead or trace.

Abstract: This invention relates to apparatus for detecting the contact or nip width between two contacting surfaces. The apparatus includes first and second insulating substrates each of which has a pattern of conductive material formed on a facing inner surface thereof, which substrates are adapted to be fitted between the contacting surfaces. For a first embodiment, the pattern of conductive material on one substrate includes a pair of conductive terminals spaced by a distance greater than the contact width to be measured and the conductive pattern on the other substrate includes a conductor which extends over at least a distance greater than the maximum width W to be measured.

Abstract: A pressure sensitive element or array is provided which includes at least one first conductor on a first substrate and at least one second conductor on a second substrate, with a first conductor and a second conductor intersecting adjacent to each other at a sensor point and a pressure sensitive material being between the first and second conductors at each such sensor point. A mechanism is also provided which applies a predetermined prepressure to the substrates at least at selected ones of the sensor points. The prepressure for a preferred embodiment is provided by joining the substrates with an air-tight seal around a periphery of at least the pressure point to which prepressure is to be applied and by creating a reduced pressure area between the substrates within the sealed periphery. For preferred embodiments, the reduced pressure is a substantial vacuum, causing substantially atmospheric pressure to be applied to the sensor points.

Abstract: A circuit is provided for scanning and outputting a pressure sensor having at least one sensor point which sensor point is formed at each intersection of at least one first electrode and at least one second electrode, there being a pressure sensitive resistance between the electrodes at each sensor point. The circuit includes a reference potential generator the output from which is applied at an output end of each second electrode, a first potential source which is connected to each first electrode when a sensor point intersected by the first electrode is to be scanned and a ratiometric A/D converter which has as inputs a second potential source, an output derived from the second electrode intersecting the sensor point being scanned and the reference potential. The output from the converter is the circuit output.

Abstract: A circuit and various sensor arrays are provided which facilitate the scanning of an array of pressure responsive points at higher speed than is possible with currently available circuits and sensor arrays and also provides greater flexibility in selecting scanning speed and in making a tradeoff between scanning speed and resolution. These objectives are achieved by providing a sensor array having T sets of drive electrodes, with pressure points in a predetermined pattern intersected by drive electrodes of each set and a sense electrode for each pressure point of a set.

Abstract: A scanning circuit for an array of pressure responsive sensor points which permits the sensitivity of the circuit to be controlled. In particular, the sensitivity of the circuit may be controlled by controlling a test and/or reference voltage used with the circuit and different sensitivity or resolutions may be provided for different areas of the array. The circuit also provides enhanced interelectrode isolation, permitting a single test voltage to be utilized to scan all sensor points on a given input electrode and further reduces the time required to scan the array by reducing trace capacitance discharge time and by inhibiting processing for sensor points which are not of interest. The accuracy of pressures being sensed is also enhanced by adjusting the test voltage to compensate for load variations.