Abstract: A controller integrated in a memory physical layer interface (PHY) can be used to control training used to configure the memory PHY for communication with an associated external memory such as a dynamic random access memory (DRAM), thereby removing the need to provide training sequences over a data pipeline between a BIOS and the memory PHY. For example, a controller integrated in the memory PHY can control read training and write training of the memory PHY for communication with the external memory based on a training algorithm. The training algorithm may be a seedless training algorithm that converges on a solution for a timing delay and a voltage offset between the memory PHY and the external memory without receiving, from a basic input/output system (BIOS), seed information that characterizes a signal path traversed by training sequences or commands generated by the training algorithm.

Abstract: A controller integrated in a memory physical layer interface (PHY) can be used to control training used to configure the memory PHY for communication with an associated external memory such as a dynamic random access memory (DRAM), thereby removing the need to provide training sequences over a data pipeline between a BIOS and the memory PHY. For example, a controller integrated in the memory PHY can control read training and write training of the memory PHY for communication with the external memory based on a training algorithm. The training algorithm may be a seedless training algorithm that converges on a solution for a timing delay and a voltage offset between the memory PHY and the external memory without receiving, from a basic input/output system (BIOS), seed information that characterizes a signal path traversed by training sequences or commands generated by the training algorithm.

Abstract: A method and apparatus for training read latency of a memory are disclosed. A memory controller includes a command FIFO configured to convey commands to a memory, a data queue coupled to receive data from the memory, and a register configured to provide a value indicative of a number of cycles of a first clock signal after which data is valid. During a startup routine, the memory controller is configured to compare data received by the data queue to a known data pattern after a specified number of cycles of the first clock signal have elapsed. The memory controller is further to configured to decrement the first value and repeat conveying and comparing if the data received matches the data pattern. If the received data does not match the data pattern for any attempted read of the memory, the memory controller is configured to program a second value into the register.

Abstract: In one form, a memory module includes a first plurality of memory devices comprising a first rank and having a first group and a second group, and first and second chip select conductors. The first chip select conductor interconnects chip select input terminals of each memory device of the first group, and the second chip select conductor interconnects chip select input terminals of each memory device of the second group. In another form, a system includes a memory controller that performs a first burst access using both first and second portions of a data bus and first and second chip select signals in response to a first access request, and a second burst access using a selected one of the first and second portions of the data bus and a corresponding one of the first and second chip select signals in response to a second access request.

Abstract: A method and apparatus for training read latency of a memory are disclosed. A memory controller includes a command FIFO configured to convey commands to a memory, a data queue coupled to receive data from the memory, and a register configured to provide a value indicative of a number of cycles of a first clock signal after which data is valid. During a startup routine, the memory controller is configured to compare data received by the data queue to a known data pattern after a specified number of cycles of the first clock signal have elapsed. The memory controller is further to configured to decrement the first value and repeat conveying and comparing if the data received matches the data pattern. If the received data does not match the data pattern for any attempted read of the memory, the memory controller is configured to program a second value into the register.

Abstract: A data processing device is configured so that, in a test mode of operation, the phase of an output signal of a second programmable delay module (PDM) is based on the phase of the input signal of the first PDM. To test the first and second PDMs, the output signal of the first PDM is set to each of a first set of phases and the corresponding phase of the output signal of the second PDM is compared to determine whether the performance of the first and second PDMs match a specification. Accordingly, the first and second PDMs are qualified based on their relative performance, reducing the need for test structures that consume an undesirably large amount of area.

Abstract: A data processing device is configured so that, in a test mode of operation, the phase of an output signal of a second programmable delay module (PDM) is based on the phase of the input signal of the first PDM. To test the first and second PDMs, the output signal of the first PDM is set to each of a first set of phases and the corresponding phase of the output signal of the second PDM is compared to determine whether the performance of the first and second PDMs match a specification. Accordingly, the first and second PDMs are qualified based on their relative performance, reducing the need for test structures that consume an undesirably large amount of area.

Abstract: A calibration and adjustment system for post-fabrication control of a delay locked loop bias-generator is provided. The calibration and adjustment system includes an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated. A representative value of the amount of adjustment desired in the bias-generator output may be stored and subsequently read to adjust the delay locked loop.

Abstract: A digital delay locked loop uses a delay array to delay an input signal by an amount indicated by a delay code. A phase of the resulting delayed signal is compared to a corresponding phase of the input signal, and dependent on the comparison, the delay code is updated to indicate whether the delay array needs to provide more delay or less delay. The digital delay locked loop also uses a detection circuit that monitors for a predetermined condition of the delay code. In response to detection of the predetermined condition, the delay code is automatically reset to a value different than a value of the delay code present at a previous reset or initial startup of the digital delay locked loop.

Abstract: An adjustment and calibration system for post-fabrication treatment of a phase locked loop input receiver is provided. The adjustment and calibration system includes at least one adjustment circuit, to which the phase locked loop input receiver is responsive, and a storage device that selectively stores control information (1) associated with a state of the adjustment circuit and/or (2) from a tester that writes such control information to the storage device, where the control information stored in the storage device is subsequently selectively read out in order to adjust the adjustment circuit to a state corresponding to the control information.

Abstract: A method and apparatus for regulating resonance in a computer system I/O interface is provided. A shunting impedance/resistance is arranged across a power supply of the I/O interface. The shunting impedance/resistance is controlled by circuitry that is arranged to detect voltage overshoot conditions in the I/O interface. The circuitry has (1) an analog front end that is arranged to detect power supply oscillations relative to a grounded terminal, (2) an amplifier (or logic conversion circuit) that is arranged to convert an output signal from the analog front end to a digital signal, and (3) a shunting apparatus arranged to modify power supply behavior in the I/O interface dependent on the digital signal.

Abstract: A method and apparatus for reducing an impedance of a power supply path of an integrated circuit is provided. The power supply path includes a first power supply line and a second power supply line to provide power to the integrated circuit. At least one resistive element connected between the first power supply line and the second power supply line is adjusted to reduce the impedance of the power supply path.

Abstract: A method for estimating jitter in a phase locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a phase locked loop is provided.

Abstract: A delay locked loop implementing design-for-test features to test for, among other, stuck-at-faults is provided. The delay locked loop uses multiplexers as design-for-test devices for controllability purposes and flip-flops as design-for-test devices for observability purposes. Such implementation of design-for-test features within a delay locked loop allows for pre-packaging delay locked loop verification and testing.

Abstract: An apparatus that uses a linear voltage regulator to reject power supply noise in a temperature sensor is provided. Further, a method for using a linear voltage regulator to reject power supply noise in a temperature sensor is provided. Further, a method and apparatus that uses a differential amplifier with a source-follower output stage as a linear voltage regulator for a temperature sensor is provided.

Abstract: A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.

Abstract: A phase locked loop that includes a receiver that is adjustable to substantially match delay of a system clock and a feedback clock at an input of the phase locked loop is provided. The receiver employs system clock path circuitry to input the system clock and feedback clock path circuitry to input the feedback clock, where current flow and load resistances associated with the system clock path circuitry and current flow and load resistances associated with the feedback clock path circuitry are responsive to one or more bias signals that are adjustable using one or more adjustment circuits that are operatively connected to the receiver. The control of the one or more bias signals via the one or more adjustment circuits facilitates the generation of substantially delay matched system and feedback clocks.

Abstract: A phase locked loop that includes a receiver circuit for matching delays of a system clock and a feedback clock at an input of the phase locked loop is provided. The receiver circuit employs system clock path circuitry to input the system clock and feedback clock path circuitry to input the feedback clock, where current flow and load resistances associated with the system clock path circuitry and current flow and load resistances associated with the feedback clock path circuitry control the generation of substantially delay matched system and feedback clocks.

Abstract: A temperature sensor adapted to produce a temperature-independent voltage and temperature-dependent voltage dependent on an internal control signal, generated within the temperature sensor, adjustable by an adjustment circuit operatively connected to the temperature sensor is provided. The adjustment circuit is controllable to adjust the internal control signal in order to modify an operating characteristic of the temperature sensor.

Abstract: A method and apparatus for regulating resonance in a computer system I/O interface is provided. A shunting impedance/resistance is arranged across a power supply of the I/O interface. The shunting impedance/resistance is controlled by circuitry that is arranged to detect voltage overshoot conditions in the I/O interface. The circuitry has (1) an analog front end that is arranged to detect power supply oscillations relative to a grounded terminal, (2) an amplifier (or logic conversion circuit) that is arranged to convert an output signal from the analog front end to a digital signal, and (3) a shunting apparatus arranged to modify power supply behavior in the I/O interface dependent on the digital signal.