Abstract: An embodiment of the invention is a method for measuring access time where the frequency of a ring oscillator is measured with and without a device under test 1 in the ring. Those two frequencies are compared to calculate the access time of the device under test 1. Another embodiment of the invention is circuitry 25 that measures the frequency of a ring oscillator with and without a device under test 1. Again the two frequencies are compared to calculate the access time of the device under test 1.

Abstract: Configurations and methods that enable the testing of CAM-specific circuitry, even if the memory is defective, are implemented by utilizing various test modes. Accordingly, the CAM can be debugged to isolate memory failures from priority encoder failures, which significantly reduces the need for design changes. The present invention provides the ability to test the CAM functions very efficiently, thereby reducing the test time.

Abstract: A method of testing an Integrated Circuit (IC) and an IC test apparatus is provided. In one embodiment, the method of testing includes (1) applying a voltage to the IC that is not a normal operating voltage of the IC and (2) temporarily biasing a well voltage of transistors in the IC allowing screening for the normal operating voltage.

Abstract: The present invention provides a system for reducing row periphery power consumption in a semiconductor memory device, particularly during sleep mode operation. A memory device (100) according to the present invention has a row (106) of memory cells and driver circuitry (102) preceding the row of memory cells. The present invention provides an intervention circuit (114) instantiated within the driver circuitry proximal to the row of memory cells. The intervention circuit is operated to hold the row of memory cells at a desired state, while the driver circuitry (108, 110) preceding the intervention circuit is powered down.

Abstract: Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.

Abstract: The present invention provides a system for reducing row periphery power consumption in a semiconductor memory device, particularly during sleep mode operation. A memory device (100) according to the present invention has a row (106) of memory cells and driver circuitry (102) preceding the row of memory cells. The present invention provides an intervention circuit (114) instantiated within the driver circuitry proximal to the row of memory cells. The intervention circuit is operated to hold the row of memory cells at a desired state, while the driver circuitry (108, 110) preceding the intervention circuit is powered down.

Abstract: An embodiment of the invention is a method for measuring access time where the frequency of a ring oscillator is measured with and without a device under test 1 in the ring. Those two frequencies are compared to calculate the access time of the device under test 1. Another embodiment of the invention is circuitry 25 that measures the frequency of a ring oscillator with and without a device under test 1. Again the two frequencies are compared to calculate the access time of the device under test 1.

Abstract: An embodiment of the invention is circuitry 25 that contains a programmable delay 8 and a pulse generator 16 that send clock signals of a certain frequency to a device under test 1. The programmable delay 8 increases the frequency of the clock signal to the device under test 1 until the device under test fails. The cycle time measurement of the device under test 1 is the period of maximum frequency at which the device under test 1 operates properly.

Abstract: An embodiment of the invention is circuitry 25 that contains a programmable delay 8 and a pulse generator 16 that send clock signals of a certain frequency to a device under test 1. The programmable delay 8 increases the frequency of the clock signal to the device under test 1 until the device under test fails. The cycle time measurement of the device under test 1 is the period of maximum frequency at which the device under test 1 operates properly.

Abstract: An embodiment of the invention is a method for measuring access time where the frequency of a ring oscillator is measured with and without a device under test 1 in the ring. Those two frequencies are compared to calculate the access time of the device under test 1. Another embodiment of the invention is circuitry 25 that measures the frequency of a ring oscillator with and without a device under test 1. Again the two frequencies are compared to calculate the access time of the device under test 1.