Abstract: An electrically conductive contact pin which prevents a fatigue fracture in a void part by distributing stress concentration in the void part is provided. The electrically conductive contact pin includes: a first surface; a second surface facing the first surface; a lateral surface for connecting the first surface and the second surface; and a void part formed inside the electrically conductive contact pin by passing through the first surface and the second surface along the length direction of the electrically conductive contact pin. The void part includes: a center void part; and an end void part communicating with the center void part and extending toward an end side of the electrically conductive contact pin, wherein the width of the end void part is narrower than the width of the center void part.

Abstract: Proposed is an electroconductive contact pin, and the objective is to manufacture a metal molded product with a high aspect ratio, the metal molded product using a mold made of an anodized film material so that deformation of the electroconductive contact pin is prevented, and being capable of effectively improving current carrying capacity.

Abstract: Proposed is a vertical probe card capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to opposite ends thereof.

Abstract: The present invention provides an electrically conductive contact pin comprising a first end region, a second end region, and a body region positioned between them, wherein the body region includes at least two beam portions spaced apart by a slit and comprises a functional layer inside the slit to prevent local destruction of the beam and improve the current carrying capacity.

Abstract: Proposed are an electrically conductive contact pin formed by stacking a plurality of metal layers and a manufacturing method therefor, in which unintentional deformation of the electrically conductive contact pin is prevented by concentrating a pressing force pressing the electrically conductive contact pin on a tip portion having a relatively small cross-sectional area.

Abstract: The present invention relates to an electrically conductive contact pin provided with an elastic portion, wherein the elastic portion includes: a plurality of straight portions; and a plurality of curved portions connecting the straight portions adjacent to each other above and below, and further includes a slit portion for dividing the curved portions into split beam portions, a stopper for limiting an elastic deformation position, or a groove portion for forming a cut portion on the inner surface of the curved portions. The purpose of the present invention is to improve the inspection reliability of an inspection object and to prevent damage to the inspection object by facilitating elastic deformation.

Abstract: Proposed are a guide plate and a test device including the guide plate capable of being insulated from electrically conductive contact pins and capable of blocking signal interference between the electrically conductive contact pins.

Abstract: Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and/or a pitch distance ranging from 1 to 100 micrometers (?m).

Abstract: The present invention provides an inspection apparatus comprising an electrically conductive contact pin having one end contacting a connection pad of an inspection apparatus and another end contacting a connection pad of an inspection object to inspect the inspection object, and a guide plate having a guide hole into which the electrically conductive contact pin is inserted, wherein the electrically conductive contact pin comprises a body portion including a first metal layer and a second metal layer made of a metal having relatively higher electrical conductivity than the first metal layer, alternately stacked in a thickness direction, and an elastic portion including a plurality of unit elastic bodies spaced apart from each other in the thickness direction at one end, which can be easily elastically deformed by close contact and pressing by a connection object.

Abstract: Proposed are an anodic aluminum oxide mold capable of manufacturing a molded article having at least a portion with a dimensional range of several tens of ?m, and a mold structure including the same. Additionally, proposed are a method of manufacturing a molded article with a dimensional range of several tens of ?m using the anodic aluminum oxide mold, and a molded article manufactured thereby.

Abstract: Proposed are an electrically conductive contact pin and a method for manufacturing the same. The electrically conductive contact pin includes a body portion composed of a plurality of metal layers stacked in a thickness direction, and a tip portion provided on at least one of a front end portion and a base end portion of the body portion, wherein the tip portion has dimensions smaller than the dimensions of the thickness direction of the body portion, and a metal layer constituting the tip portion is formed continuously of the same material as some of the metal layers constituting the body portion.

Abstract: Proposed are an electrically conductive contact pin formed by stacking a plurality of metal layers and a manufacturing method therefor, in which unintentional deformation of the electrically conductive contact pin is prevented by concentrating a pressing force pressing the electrically conductive contact pin on a tip portion having a relatively small cross-sectional area.

Abstract: The invention provides an electrically conductive contact pin that improves test reliability for a test object and prevents separation in a side opening direction of a guide hole due to a lower catch portion.

Abstract: The present invention relates to an anodized film substrate base made of an anodized oxide film, an anodized film substrate part including a vertical conductive part provided inside the anodized film substrate base, an anodized film-based interposer having same, and a semiconductor package having same.

Abstract: Proposed are an electrically conductive contact pin, a method for manufacturing the same, an inspection apparatus, a method for manufacturing a molded product, and a molded product manufactured thereby. More specifically, proposed are: a method for manufacturing an electrically conductive contact pin, the method including the steps of providing an anodic aluminum oxide mold made of an anodic aluminum oxide film and having openings formed by etching at least partial regions of the anodic aluminum oxide mold to correspond to a shape of electrically conductive contact pins, forming a metal filler in each of the openings, and removing the anodic aluminum oxide mold; an electrically conductive contact pin including at least one micro-convex portion and a plurality of fine trenches; an inspection apparatus; a method for manufacturing a molded product; and a molded product manufactured thereby.

Abstract: The present invention relates to an electrical connector comprising a first metal layer and a second metal layer, wherein the electrical connector comprises: a plurality of beam portions consisting of the first metal layer, wherein the second metal layer is not provided between the first metal layers in the thickness direction such that the first metal layers are spaced apart from each other in the thickness direction and elastically deformed by an external force applied in the length direction; and a connecting portion in which the first metal layer and the second metal layer are stacked in the thickness direction and which connects the plurality of beam portions, thereby providing an electrical connector with an increased surface area and improved current carrying capacity (CCC).

Abstract: The present invention comprises a first contact part; a second contact part; and an elastic deformation part connecting the first contact part and the second contact part, wherein the first contact part and the second contact part are relatively displaceable along a length direction, the elastic deformation part has a shape folded in a width direction, and the elastic deformation part includes a plurality of divided parts, thereby providing an electrical connector that can reduce pin force while maintaining the strength of the elastic part. Additionally, the present invention provides an electrical connector that improves the reliability of inspection by ensuring that numerous electrical connectors provided in an inspection device can form and maintain the same current path when they are pressed and deformed.

Abstract: The present invention provides an electro-conductive contact pin which can implement a narrow-pitch and an inspection device including same. Furthermore, the present invention provides an electro-conductive contact pin which uses a guide housing formed to have consistent thickness overall, including a portion corresponding to a lower part of an interference member and prevents damage due to interference with the interference member, and an inspection device including same.

Abstract: The electrical connector of the present invention comprises a plurality of unit needle pins arranged to be spaced apart from each other and having beam portions extending in a longitudinal direction to be elastically deformed; and a connecting portion fixing the plurality of unit needle pins to be spaced apart from each other. By including these components, the present invention provides an electrical connector with a significantly increased surface area, resulting in improved current carrying capacity (CCC), and an inspection apparatus comprising the same. Additionally, the present invention provides a highly reliable electrical connector and an inspection apparatus comprising the same.

Abstract: The present invention provides an interposer that is provided between an object to be inspected and electrically conductive pins, allowing the contact terminal of the object to be inspected and the tip of the electrically conductive pins to be indirectly electrically connected to each other, thereby preventing damage to the contact terminal, and an inspection apparatus comprising the same.