Semiconductor probe pin
Description
The dot-dash broken line indicates the boundary of the enlarged partial view and forms no part of the claimed design.
Claims
The ornamental design for a semiconductor probe pin as shown and described.
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Patent History
Patent number: D1051865
Type: Grant
Filed: Oct 28, 2022
Date of Patent: Nov 19, 2024
Assignee: POINT ENGINEERING CO., LTD. (Chungcheongnam-do)
Inventor: Bum Mo Ahn (Gyeonggi-do)
Primary Examiner: Rosemary K Tarcza
Assistant Examiner: Seth David Kumpf
Application Number: 29/858,094
Type: Grant
Filed: Oct 28, 2022
Date of Patent: Nov 19, 2024
Assignee: POINT ENGINEERING CO., LTD. (Chungcheongnam-do)
Inventor: Bum Mo Ahn (Gyeonggi-do)
Primary Examiner: Rosemary K Tarcza
Assistant Examiner: Seth David Kumpf
Application Number: 29/858,094
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)