Semiconductor probe pin

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Description

FIG. 1 is a perspective view of a semiconductor probe pin showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is an enlarged top view thereof;

FIG. 7 is an enlarged bottom view thereof; and,

FIG. 8 is an enlarged partial view indicated in FIG. 4 thereof.

The dot-dash broken line indicates the boundary of the enlarged partial view and forms no part of the claimed design.

Claims

The ornamental design for a semiconductor probe pin as shown and described.

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Patent History
Patent number: D1051865
Type: Grant
Filed: Oct 28, 2022
Date of Patent: Nov 19, 2024
Assignee: POINT ENGINEERING CO., LTD. (Chungcheongnam-do)
Inventor: Bum Mo Ahn (Gyeonggi-do)
Primary Examiner: Rosemary K Tarcza
Assistant Examiner: Seth David Kumpf
Application Number: 29/858,094