Patents by Inventor Caroline Paulus
Caroline Paulus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240027329Abstract: The invention relates to a lensless imaging device, comprising an emitting part comprising a light source (1) configured to emit a light beam in a direction of emission and intended to follow an optical path, a receiving part incorporating an electronic circuit board (3) bearing a sensor (2) having a planar capture surface (20) intended to receive said light beam in a direction normal to said capture surface, said optical path being subdivided into several successive optical sections, each optical section corresponding to a distinct direction of propagation of the light beam.Type: ApplicationFiled: July 19, 2023Publication date: January 25, 2024Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Xavier MERMET, Caroline PAULUS
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Patent number: 11779921Abstract: A microfluidic device includes a single rigid support and a first unit having a first chamber of nonzero volume delimited by walls of the support. A filter separates the first chamber into a first space and a second space, a first channel made in the support and a second channel. The device also includes a second unit including a second chamber, a third channel. The device further includes a first fluidic transfer channel between the first chamber and the second chamber, made in the support and opening on the one hand into said second chamber and on the other hand at a first bypass node in the second channel. The device including first flow switching means arranged for selecting connection of the first chamber to the exterior only, via the second channel only or to the second chamber only, through the first transfer channel.Type: GrantFiled: July 16, 2020Date of Patent: October 10, 2023Assignee: Commissariat a l'Energie Atomique et aux Energies AlternativesInventors: Thomas Bordy, Anne-Gaelle Bourdat, Remi Toutain, Caroline Paulus
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Patent number: 10983070Abstract: The invention is a method for characterizing an object (20), comprising the following steps: a) placing the object between a radiation source (10) and a radiation detector (30); b) irradiating the object with the radiation source and detecting radiation transmitted by the object (14) using the radiation detector, the radiation detector defining a plurality of pixels; c) for each pixel (30i), forming an energy spectrum (Si) of the detected radiation, each spectrum comprising at least two distinct energy bands; d) from each spectrum formed in c), estimating, in each pixel, at least two equivalent thicknesses ({circumflex over (L)}i,1 . . . {circumflex over (L)}i,M,{circumflex over (L)}?i,1 . . . {circumflex over (L)}?i,M) respectively associated with at least two basic materials (mat1 . . . matM,mat?1 . . .Type: GrantFiled: June 21, 2019Date of Patent: April 20, 2021Assignee: Commissariat a l'energie atomique et aux energies alternativesInventors: Caroline Paulus, Andrea Brambilla, Veronique Rebuffel
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Publication number: 20210016282Abstract: A microfluidic device includes a single rigid support and a first unit having a first chamber of nonzero volume delimited by walls of the support. A filter separates the first chamber into a first space and a second space, a first channel made in the support and a second channel. The device also includes a second unit including a second chamber, a third channel. The device further includes a first fluidic transfer channel between the first chamber and the second chamber, made in the support and opening on the one hand into said second chamber and on the other hand at a first bypass node in the second channel. The device including first flow switching means arranged for selecting connection of the first chamber to the exterior only, via the second channel only or to the second chamber only, through the first transfer channel.Type: ApplicationFiled: July 16, 2020Publication date: January 21, 2021Applicant: Commissariat a l'Energie Atomique et aux Energies AlternativesInventors: Thomas BORDY, Anne-Gaelle BOURDAT, Remi TOUTAIN, Caroline PAULUS
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Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum
Patent number: 10605749Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.Type: GrantFiled: June 25, 2015Date of Patent: March 31, 2020Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Caroline Paulus, Joachim Tabary -
Patent number: 10564113Abstract: A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.Type: GrantFiled: July 7, 2016Date of Patent: February 18, 2020Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventor: Caroline Paulus
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Publication number: 20190391090Abstract: The invention is a method for characterizing an object (20), comprising the following steps: a) placing the object between a radiation source (10) and a radiation detector (30); b) irradiating the object with the radiation source and detecting radiation transmitted by the object (14) using the radiation detector, the radiation detector defining a plurality of pixels; c) for each pixel (30i), forming an energy spectrum (Si) of the detected radiation, each spectrum comprising at least two distinct energy bands; d) from each spectrum formed in c), estimating, in each pixel, at least two equivalent thicknesses ({circumflex over (L)}i,1 . . . {circumflex over (L)}i,M,{circumflex over (L)}?i,1 . . . {circumflex over (L)}?i,M) respectively associated with at least two basic materials (mat1 . . . matM,mat?1 . . .Type: ApplicationFiled: June 21, 2019Publication date: December 26, 2019Applicant: Commissariat a l'energie atomique et aux energies alternativesInventors: Caroline PAULUS, Andrea BRAMBILLA, Veronique REBUFFEL
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Patent number: 10386508Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.Type: GrantFiled: December 23, 2016Date of Patent: August 20, 2019Assignee: Commissariat A L'Energie Atomique et aux Energies AlternativesInventors: Joachim Tabary, Damien Barbes, Caroline Paulus
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Patent number: 10371651Abstract: The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.Type: GrantFiled: December 23, 2016Date of Patent: August 6, 2019Assignee: Commissariat A L'Energie Atomique et aux Energies AlternativesInventors: Damien Barbes, Caroline Paulus, Joachim Tabary
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Patent number: 10352882Abstract: A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.Type: GrantFiled: June 25, 2015Date of Patent: July 16, 2019Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Caroline Paulus, Joachim Tabary
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Patent number: 10121561Abstract: The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.Type: GrantFiled: October 28, 2016Date of Patent: November 6, 2018Assignee: Commissariat A L'Energie Atomique et aux Energies AlternativesInventors: Fanny Marticke, Guillaume Montemont, Caroline Paulus
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Publication number: 20180195981Abstract: A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.Type: ApplicationFiled: July 7, 2016Publication date: July 12, 2018Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventor: Caroline PAULUS
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Patent number: 9880115Abstract: A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.Type: GrantFiled: October 21, 2011Date of Patent: January 30, 2018Assignee: Commissariat a l'energie atomique et aux energies alternativesInventors: Caroline Paulus, Joachim Tabary
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Publication number: 20170184518Abstract: The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.Type: ApplicationFiled: December 23, 2016Publication date: June 29, 2017Applicant: Commissariat a L'Energie Atomique et aux Energies AlternativesInventors: Damien BARBES, Caroline PAULUS, Joachim TABARY
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Publication number: 20170184739Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.Type: ApplicationFiled: December 23, 2016Publication date: June 29, 2017Applicant: Commissariat a L'Energie Atomique et aux Energies AlternativesInventors: Joachim TABARY, Damien BARBES, Caroline PAULUS
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Publication number: 20170153189Abstract: A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.Type: ApplicationFiled: June 25, 2015Publication date: June 1, 2017Inventors: Caroline PAULUS, Joachim TABARY
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Publication number: 20170131224Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.Type: ApplicationFiled: June 25, 2015Publication date: May 11, 2017Inventors: Caroline PAULUS, Joachim TABARY
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Publication number: 20170125133Abstract: The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analysing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analysed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analysed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.Type: ApplicationFiled: October 28, 2016Publication date: May 4, 2017Applicant: Commissariat a l'energie atomique et aux energies alternativesInventors: Fanny MARTICKE, Guillaume Montemont, Caroline Paulus
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Patent number: 9599580Abstract: A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.Type: GrantFiled: September 19, 2013Date of Patent: March 21, 2017Assignees: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, MOZIDO, INC.Inventors: Bahaa Ghammraoui, Caroline Paulus, Joachim Tabary
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Patent number: 9535017Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (?); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (?materiau (E0, E1, ?)), a configuration for estimating the density (p) of the material.Type: GrantFiled: October 19, 2012Date of Patent: January 3, 2017Assignee: Commissariat a L'Energie Atomique et aux Energies AlternativesInventors: Caroline Paulus, Joachim Tabary