Patents by Inventor Caroline Paulus

Caroline Paulus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9285329
    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
    Type: Grant
    Filed: December 26, 2012
    Date of Patent: March 15, 2016
    Assignee: Commissariat A L'Energie Atomique et Aux Energies Alternatives
    Inventors: Bahaa Ghammraoui, Joachim Tabary, Caroline Paulus
  • Publication number: 20160033427
    Abstract: A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.
    Type: Application
    Filed: September 19, 2013
    Publication date: February 4, 2016
    Inventors: Bahaa GHAMMRAOUI, Caroline PAULUS, Joachim TABARY
  • Publication number: 20140369473
    Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (?); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (?material (E0, E1, ?)), a configuration for estimating the density (p) of the material.
    Type: Application
    Filed: October 19, 2012
    Publication date: December 18, 2014
    Inventors: Caroline Paulus, Joachim Tabary
  • Publication number: 20140348298
    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
    Type: Application
    Filed: December 26, 2012
    Publication date: November 27, 2014
    Inventors: Bahaa Ghammraoui, Joachim Tabary, Caroline Paulus
  • Publication number: 20140286478
    Abstract: A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.
    Type: Application
    Filed: October 21, 2011
    Publication date: September 25, 2014
    Applicant: Commissariat a l'energie atomique et aux ene alt
    Inventors: Caroline Paulus, Joachim Tabary
  • Patent number: 8774360
    Abstract: A method and device for obtaining a first radiation spectrum diffused through a material, in which the material is exposed to an incident irradiation beam emitted by a radiation source. A first radiation spectrum diffused through the material is measured by means of a main detector, arranged so that its observation field intersects the irradiation beam inside the material. At least one secondary radiation spectrum diffused through the material is measured by means of at least one secondary detector and a measurements matrix (X) is constructed starting from previously measured spectra. The measurements matrix is decomposed in two non-negative matrices, a weights matrix (A) and a spectra matrix (S), where the spectra matrix includes an estimated multiple diffuse radiation spectrum and an estimated primary diffuse radiation spectrum. The device includes a microprocessor and computer program. A computer program product for implementing the method is also provided.
    Type: Grant
    Filed: August 31, 2011
    Date of Patent: July 8, 2014
    Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
    Inventors: Caroline Paulus, Jean Rinkel, Joachim Tabary
  • Publication number: 20120051517
    Abstract: A method and device for obtaining a first radiation spectrum diffused through a material, in which the material is exposed to an incident irradiation beam emitted by a radiation source. A first radiation spectrum diffused through the material is measured by means of a main detector, arranged so that its observation field intersects the irradiation beam inside the material. At least one secondary radiation spectrum diffused through the material is measured by means of at least one secondary detector and a measurements matrix (X) is constructed starting from previously measured spectra. The measurements matrix is decomposed in two non-negative matrices, a weights matrix (A) and a spectra matrix (S), where the spectra matrix includes an estimated multiple diffuse radiation spectrum and an estimated primary diffuse radiation spectrum. The device includes a microprocessor and computer program. A computer program product for implementing the method is also provided.
    Type: Application
    Filed: August 31, 2011
    Publication date: March 1, 2012
    Inventors: Caroline Paulus, Jean Rinkle, Joachim Tabary
  • Publication number: 20110161062
    Abstract: A model of evolution of a signal of a chromatographic column is formed, then inversed as a function of the measured signals, to calculate solute concentrations by using the entire signal. The model is based on equations that govern the transport of solutes in the column as a function of various physical parameters, which can be re-evaluated. The method can be used for searching and measuring rare components, such as proteins, in liquid biological samples.
    Type: Application
    Filed: September 4, 2009
    Publication date: June 30, 2011
    Applicant: COMM.A L'ENER. ATOM. ET AUX ENERGIES ALT
    Inventors: Caroline Paulus, Laurent Gerfault, Pierre Grangeat