Abstract: Embodiments of a Surface Acoustic Wave (SAW) device, or filter, and methods of fabrication thereof are disclosed. In some embodiments, the SAW filter comprises a piezoelectric substrate and an Interdigitated Transducer (IDT) on a surface of the piezoelectric substrate. The IDT includes multiple fingers, each comprising a metal stack. The SAW filter further includes a cap layer on a surface of the IDT opposite the piezoelectric substrate and on areas of the surface of the piezoelectric substrate exposed by the IDT. The cap layer has a thickness in a range of and including 10 to 500 Angstroms and a high electrical resistivity (and thus a low electrical conductivity). For instance, in some embodiments, the electrical resistivity of the cap layer is greater than 10 kilo-ohm meters (K?·m). The SAW filter further includes an oxide overcoat layer on a surface of the cap layer opposite the IDT and the piezoelectric substrate.

Abstract: A heat rated scouring glove having a hand section, an arm section, and a layer of heat rated material. A sleeve having an abrasive surface is configured to receive the hand section of the glove.

Abstract: Embodiments described herein may provide a temperature-compensated surface acoustic wave (TCSAW) device, a method of fabricating a TCSAW device, and a system incorporating a TCSAW device. The TCSAW device may include a pyroelectric substrate, a plurality of electrodes formed on a first surface of the pyroelectric substrate, an amorphous silicon layer formed over the plurality of electrodes, and a temperature compensating layer formed over the amorphous silicon layer.

Abstract: Embodiments described herein may provide a temperature-compensated surface acoustic wave (TCSAW) device, a method of fabricating a TCSAW device, and a system incorporating a TCSAW device. The TCSAW device may include a pyroelectric substrate, a plurality of electrodes formed on a first surface of the pyroelectric substrate, an amorphous silicon layer formed over the plurality of electrodes, and a temperature compensating layer formed over the amorphous silicon layer.

Abstract: This disclosure relates to transfer plate lubricant compositions and methods of transporting open containers across stationary transfer plates.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: A system and method for providing media content to a content subscriber is described. One embodiment includes a media device for controlling access to media content. The media apparatus comprises a processor, a memory and a storage device housing to may house a storage device. The media apparatus further comprises a media database that stores information about media content residing on the storage device. The media apparatus may also comprise one or more communication interfaces for communicating with a content provider, the storage device or other devices. The media apparatus may also include a real-time clock to maintain the current time and date. Further, the media apparatus may comprise a viewing policy engine for controlling access to the media content on the storage device. Lastly, the media apparatus comprises a rental agreement engine for enforcing a rental policy associated with a storage device.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds.

Abstract: A box includes bottom, opposed side, front, top, and rear panels, which define an interior space of the box. The box has a display opening and an invertible panel that includes a top edge. The invertible panel may include a first section coplanar with the front panel and a second section coplanar with a side panel when the invertible panel is in an unflexed position. In the unflexed position, a vertical passageway is formed behind the invertible panel and in front of the top panel. An article having a body depending from an elongated support can be packaged in the box by placing the support in the vertical passageway and positioning the body in the display opening. Force is applied to the article and/or the invertible panel whereby the invertible panel is moved into a second position and the article is contained within the interior space of the box.