Abstract: The present invention provides a hybrid gasification system which simultaneously has the advantages of an entrained-flow gasifier using pulverized fuel and a fluidized-bed gasifier utilized for gasifying fuel with relatively various properties. The present intention provides a hybrid gasification system employing a structure in which a second reaction chamber operated at a temperature of 700 to 900 is surrounded by a first reaction chamber operated at temperature, thereby obtaining an insulation effect, performing additional heat exchange, and minimizing a heat loss. Furthermore, the present invention provides a hybrid gasification system having a structure in which unreacted substances and tar within synthetic gas generated from a first reaction chamber reacts within a second reaction chamber, thereby increasing the entire gasification efficiency.

Abstract: A semiconductor memory device includes a current sourcing unit configured to supply a given current to a source line when a read operation is performed, a memory cell string configured to store data and receive the given current from the source line, and a data sensing unit configured to sense the given current transferred from the memory cell string to a bit line and latch the sensed given current in a data form.

Abstract: A nonvolatile semiconductor memory apparatus includes a memory cell block, a plurality of page buffers, and a reference page buffer unit. The memory cell block includes a plurality of memory cell strings each of which includes a plurality of memory cells and a dummy memory cell string which includes a plurality of dummy memory cells. The page buffers sense data stored in the memory cells and apply the sensed data to an output node. The reference page buffer unit senses the dummy memory cells and adjusts the timing to apply the values sensed by the page buffers to the output node.

Abstract: A programming method comprised of: classifying memory cells to be programmed into first, second and third levels; applying a program inhibition voltage to an unselected bit line, applying a ground voltage to bit lines, which are coupled with memory cells that are to be programmed into the third level, among selected bit lines, and applying a first voltage, which is lower than the program inhibition voltage but higher than a ground voltage, to bit lines coupled with memory cells that are to be programmed into the second level, and applying a second voltage, which is lower than the program inhibition voltage but higher than the first voltage, to bit line coupled with memory cells that are to be programmed into the first level; and supplying a program voltage, which gradually increases, to a selected word line coupled with the memory cells while applying the voltages to the bit lines.

Abstract: The semiconductor memory device includes a memory cell array that includes a plurality of cell strings coupled between a common source line and a plurality of bit lines, a peripheral circuit that reads data stored in a selected memory cell, a bouncing detection circuit that compares a voltage supplied to the common source line and a reference voltage to thereby output a detection signal while performing a reading operation, and a control circuit that controls the peripheral circuit in order to perform the reading operation by adjusting the number of sensing operation times in accordance with the detection signal.

Abstract: A programming method of a semiconductor memory device including memory cells of a first data distribution and a second data distribution includes forming an initialization distribution between the first data distribution and the second data distribution, and performing a programming operation by using the initialization distribution as a reference.

Abstract: A semiconductor device includes cell strings that each include a plurality of memory cells, a page buffer having latches coupled to bit lines and precharge the bit lines in response to page buffer control signals, a page buffer control circuit configured to generate the page buffer control signals using a high voltage source, and a controller configured to generate control signals for controlling the page buffer control circuit.

Abstract: An operating method of a semiconductor device includes precharging bit lines corresponding to selected memory cells, supplying a first verify voltage to a word line coupled to the selected memory cells and outputting programming states of the selected memory cells to the bit lines during a first time period, sensing potentials of the bit lines that have the programming states of the selected memory cells outputted to the bit lines during the first time period, supplying a first target voltage higher than the first verify voltage to the word line and outputting programming states of the selected memory cells to the bit lines during a second time period shorter than the first time period, and sensing potentials of the bit lines that have the programming states of the selected memory cells outputted to the bit lines during the second time period.

Abstract: Various embodiments of a nonvolatile memory system and related methods are disclosed. In one exemplary embodiment, the memory system may include: a memory area including a main memory area and a flag memory area; and an input/output controller configured to receive main data through a main data input line and provide the received main data to a page buffer circuit in response to a main data input control signal. The input/output controller may be further configured to receive flag data through the main data input line and provide the received flag data to the page buffer circuit in response to a flag data input control signal.

Abstract: A semiconductor memory apparatus includes: a memory unit including a first memory group and a second memory group; and a control unit configured to control input data to be programmed into selected memory cells of the first memory group such that one-bit data is programmed into each of the memory cells of the first memory group when the size of the input data is smaller than a size of data which may be stored into the first memory group during a programming mode, and control the input data programmed in the first memory group to be reprogrammed into selected memory cells of the second memory group during a standby mode after the programming mode, such that multi-bit data are programmed into each of the memory cells of the selected second memory group.

Abstract: Multi-level cell programming methods are provided. A method includes providing a page buffer including first and second registers connected to first and second memory cell blocks, respectively. A least significant bit (LSB) program of each memory cell is completed. Most significant bit (MSB) data is set in a first node of the first register. An MSB program is performed. When the MSB program is performed at a first verify voltage, first data at a first voltage level is set in the first node. When the MSB program is performed at a second verify voltage, second data at a second voltage level, opposite to the first voltage level, is set in the first node. When the MSB program is performed at a third verify voltage, the first data is set in the first node. The MSB program is repeated according to the first node data.

Abstract: A semiconductor memory device includes memory cells for storing data, page buffers each configured to comprise a dynamic latch and a static latch on which data to be programmed in to the memory cells or data read from the memory cells are latched, and a control logic configured to store a plurality of refresh mode select codes corresponding to various refresh cycles, and refresh the dynamic latch by exchanging data between the static latch and the dynamic latch according to a refresh cycle corresponding to a selected refresh mode select code.

Abstract: A page buffer circuit comprises a bit line selection unit, a latch unit, and a bit line control unit. The bit line selection unit is configured to select a bit line coupled to memory cells. The latch unit comprises a plurality of latch circuits. The plurality of latch circuits is coupled to a sense node and configured to latch data to be programmed into the memory cells or store data from the memory cells. The bit line control unit is coupled to the sense node and configured to temporarily charge a voltage of the selected bit line in response to charge and transfer control signals or transfer the charged voltage to the selected bit line.

Abstract: A method of operating a semiconductor memory device comprises performing a third program such that threshold voltages of third memory cells, from among memory cells of a selected page, are higher than a third level, after the third program loop is completed, performing a second program loop such that threshold voltages of second memory cells, from among the memory cells, are lower than the third level, but higher than a second level, and after the second program loop is completed, performing a first program loop such that threshold voltages of first memory cells, from among the memory cells, are lower than the second level, but higher than a first level.

Abstract: Multi-level cell programming methods are provided. A method includes providing a page buffer including first and second registers connected to first and second memory cell blocks, respectively. A least significant bit (LSB) program of each memory cell is completed. Most significant bit (MSB) data is set in a first node of the first register. An MSB program is performed. When the MSB program is performed at a first verify voltage, first data at a first voltage level is set in the first node. When the MSB program is performed at a second verify voltage, second data at a second voltage level, opposite to the first voltage level, is set in the first node. When the MSB program is performed at a third verify voltage, the first data is set in the first node. The MSB program is repeated according to the first node data.

Abstract: A page buffer circuit comprises a bit line selection unit, a latch unit, and a bit line control unit. The bit line selection unit is configured to select a bit line coupled to memory cells. The latch unit comprises a plurality of latch circuits. The plurality of latch circuits is coupled to a sense node and configured to latch data to be programmed into the memory cells or store data from the memory cells. The bit line control unit is coupled to the sense node and configured to temporarily charge a voltage of the selected bit line in response to charge and transfer control signals or transfer the charged voltage to the selected bit line.

Abstract: A memory device has memory cells that are Multi-Level Cells (MLCs). A memory cell array includes a plurality of cell strings, each string provided between a bit line and a common source line, wherein a positive voltage is applied to the common source line at the time of program verification. A page buffer is configured to program the MLCs, read memory cells, and perform program verification. This program verification is performed by sequentially increasing a voltage level of a bit line select signal until the bit line select signal reaches to a voltage that is sufficient to verify a programmed state of a selected cell in the memory cell array.

Abstract: A page buffer circuit comprises a bit line selection unit, a latch unit, and a bit line control unit. The bit line selection unit is configured to select a bit line coupled to memory cells. The latch unit comprises a plurality of latch circuits. The plurality of latch circuits is coupled to a sense node and configured to latch data to be programmed into the memory cells or store data from the memory cells. The bit line control unit is coupled to the sense node and configured to temporarily charge a voltage of the selected bit line in response to charge and transfer control signals or transfer the charged voltage to the selected bit line.

Abstract: A page buffer includes a first register, a second register and a data I/O unit. The first register temporarily stores data to be programmed into cells included in a first memory cell block group, or reads and stores data of a corresponding memory cell. The second register temporarily stores data to be programmed into cells included in a second memory cell block group, or reads and stores data of a corresponding memory cell. The data I/O unit inputs specific data to the first register and the second register, or outputs data stored in the first register and the second register.

Abstract: A programming method comprised of: classifying memory cells to be programmed into first, second and third levels; applying a program inhibition voltage to an unselected bit line, applying a ground voltage to bit lines, which are coupled with memory cells that are to be programmed into the third level, among selected bit lines, and applying a first voltage, which is lower than the program inhibition voltage but higher than a ground voltage, to bit lines coupled with memory cells that are to be programmed into the second level, and applying a second voltage, which is lower than the program inhibition voltage but higher than the first voltage, to bit line coupled with memory cells that are to be programmed into the first level; and supplying a program voltage, which gradually increases, to a selected word line coupled with the memory cells while applying the voltages to the bit lines.