Abstract: Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Abstract: Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substate layer and includes at least one reference channel and at least one sample channel.

Abstract: A flow guide mesh has a water inlet side and a water outlet side opposite to each other, wherein a first water isolating material is provided on the water inlet side of the flow guide mesh to seal a part of the water inlet side, and an effective water inlet width is defined on the water inlet side, a second water isolating material is provided on the water outlet side of the flow guide mesh to seal a part of the water outlet side, and an effective water outlet width is defined on the water outlet side. In addition, the flow guide mesh has a comb-like structure comprising at least one comb tooth within the effective water outlet width of the water outlet side. Also disclosed are a membrane element and a filter assembly.

Abstract: An object localization system including an object detection module configured to detect an object in a current frame with reference to a preceded frame, and an object localization module configured to identify a location of the object according to the segment. The object detection module includes a difference module for computing differences between the preceded frame and the current frame at a same location to generate a difference frame, a selected block detection module for identifying a selected block of the difference frame according to a predetermined minimum difference, a segment generation module for generating a segment of the current frame.

Abstract: Various embodiments described herein relates to a lens cap, adapted to be mechanically engaged over a lens assembly of an optical projector. The lens cap, as described herein, is adapted for vignetting a light pattern projected by the optical projector. The lens cap includes a front surface and a back surface, where on at least a portion of the front surface, an elliptically shaped aperture is defined. In this aspect, the elliptically shaped aperture is chamfered towards its peripheral ends, as the elliptically shaped aperture extends out from the back surface of the lens cap towards the front surface of lens cap. Also, the elliptically shaped aperture is defined on the lens cap such that, a center axis of the aperture is offset to a central axis of the lens cap, so as to match an offset at which the light pattern is projected by the optical projector.

Abstract: Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Abstract: Nanowire devices and fin devices are formed in a first region and a second region of a substrate. To form the devices, alternating layers of a first material and a second material are formed, inner spacers are formed adjacent to the layers of the first material, and then the layers of the first material are removed to form nanowires without removing the layers of the first material within the second region. Gate structures of gate dielectrics and gate electrodes are formed within the first region and the second region in order to form the nanowire devices in the first region and the fin devices in the second region.

Abstract: A multi-functional optical illuminator comprises: a light pipe (302) with an open frame structure for visual aiming of the illuminator to facilitate an alignment of a barcode; and a circuit board (304), attached to a back opening of the light pipe (302), comprising six dark field LEDs (308) for generating six dark field illuminations and two bright field LEDs (306) for generating bright field illuminations; wherein, the two bright field LEDs (306) produce two alternating point sources for providing bright field illuminations in different directions to minimize a specular reflection hot spot without using any diffuser during the bright field illuminations; wherein, chamfered inner edges of the light pipe (302) emit the dark field illuminations in different orientations from the light pipe (302). The illuminator is designed to provide dual-field, multi-color, multi-directional illumination.

Abstract: A semiconductor device and a method of manufacturing the same are disclosed. The semiconductor device includes semiconductor wires disposed over a substrate, a source/drain epitaxial layer in contact with the semiconductor wires, a gate dielectric layer disposed on and wrapping around each channel region of the semiconductor wires, a gate electrode layer disposed on the gate dielectric layer and wrapping around the each channel region, and dielectric spacers disposed in recesses formed toward the source/drain epitaxial layer.

Abstract: A data decryption system includes an address checking-circuit, an encryption/decryption processor, and a computation circuit. The address checking circuit is configured to receive an address through an address channel. The computation circuit is coupled to the encryption/decryption processor. The computation circuit is configured to receive a reading data of the address from a storage device through a data channel in a first duration. The encryption/decryption processor computes a second key in a second duration, according to a first key and the address, and the second key is configured to decrypt the reading data, wherein the first duration overlaps with the second duration.

Abstract: A controller for executing a task based on probabilistic image-based landmark localization, uses a neural network, which is trained to process images of objects of a type having a structured set of landmarks to produce a parametric probability distribution defined by values of parameters for a location of each landmark in each processed image. The controller submits the set of input images to the neural network to produce the values of the parameters that define the parametric probability distribution over the location of each landmark in the structured set of landmarks of each input image. Further, the controller determines, for each input image, a global landmark uncertainty for the image based on the parametric probability distributions of landmarks in the input image and executes the task based on the parametric probability distributions of landmarks in each input image and the global landmark uncertainty of each input image.

Abstract: A fin structure is on a substrate. The fin structure includes an epitaxial region having an upper surface and an under-surface. A contact structure on the epitaxial region includes an upper contact portion and a lower contact portion. The upper contact portion includes a metal layer over the upper surface and a barrier layer over the metal layer. The lower contact portion includes a metal-insulator-semiconductor (MIS) contact along the under-surface. The MIS contact includes a dielectric layer on the under-surface and the barrier layer on the dielectric layer.

Abstract: A pixel array substrate includes a substrate, a first patterned conductive layer, a pixel electrode layer, a semiconductor pattern layer, a first dielectric layer, a second patterned conductive layer, a second dielectric layer, and a common electrode layer. The first patterned conductive layer includes first and second scan lines, first and second gates, and first and second connection electrodes. The pixel electrode layer includes first and second pixel electrodes. The semiconductor pattern layer includes first and second patterns. The second patterned conductive layer includes first and second data lines, first and second sources, first and second drains, and a touch wire. The common electrode layer includes a common electrode and first and second transferring electrodes. The first transferring electrode is electrically connected to the first connection electrode and the first drain. The second transferring electrode is electrically connected to the second connection electrode and the second drain.

Abstract: Embodiments of the present disclosure provide an alternative illuminator assembly and corresponding imaging assemblies utilizing the alternative illuminator assembly. The alternative illuminator assembly may provide alternative illuminations from those produced by an imager engine, such that the alternative illuminations may provide specific illuminations at specific illumination angles to illuminate a field of view for a desired purpose. In an example context, the alternative illuminator assembly provides one or more alternative illuminations for improving the likelihood of successfully reading specific direct part marking indicias of various types. Embodiments are provided using overlapping subassemblies that enable a small form factor assembly that can fit into mobile apparatus chasses, for example within conventional cell phone housings of around 7 millimeters.

Abstract: The invention relates to a monitoring system for monitoring at least one device. The monitoring system comprises a magnification lens system to generate a magnified image of the at least one device, and at least three positional sensors in an arrangement around the magnification lens system to determine a position of the at least one device. The at least one device may be a surgical tool.

Abstract: An aimer pattern projector assembly (200, 300) includes an LED light source (212, 312), an LED aperture plate (204, 304), and a projector lens (206, 306) disposed in front of and coaxial with the LED aperture plate (204, 304) and the LED light source (212, 312). The LED light source (212, 312), aperture plate (204, 304), and projector lens (206, 306) each have a central opening configured to accommodate and coaxially align with a line of sight of an imaging lens. The LED light source (212, 312) can include two or more LEDs operably coupled to a PCB. A coaxial aimer imager assembly (100) can include an imaging lens-sensor module (102) and the aimer pattern projector assembly. A method for scanning includes generating a combined aimer pattern coaxially aligned with a line of sight of an image of the object.

Abstract: Various embodiments described herein provide multi-projector (i.e., two or more) imaging apparatuses utilizing integrated illumination-aimer optics. Embodiments of the present disclosure minimize irreparable component offset to improve overall accuracy associated with the functioning of the apparatuses. Additionally, the integrated illumination-aimer optics enables embodiments disclosed herein to be provided in a significantly smaller form factor than conventional multi-projector imaging apparatuses.

Abstract: Various embodiments described herein provide a discrete focusing lens assembly. Some embodiments are designed to enable repositioning of one or more components, such as a lens barrel assembly, to adjust the focus of the discrete focusing lens assembly. Some example discrete focusing lens assemblies include a module base housing a lens barrel assembly having a pair of positioning magnets, a pair of positioning coil assemblies associated with the positioning magnets, and at least one module alignment pin positioning and/or aligning some or all of the components. The positioning coil assemblies together with the positioning magnets are configured to exert various magnetic fields to reposition the lens barrel assembly. Further embodiments are provided for imaging apparatus including at least one discrete focusing lens assembly described herein. Further, embodiments are provided for processes for assembling a discrete focusing lens assembly described herein.

Abstract: A semiconductor device and a method of manufacturing the same are disclosed. The semiconductor device includes semiconductor wires disposed over a substrate, a source/drain epitaxial layer in contact with the semiconductor wires, a gate dielectric layer disposed on and wrapping around each channel region of the semiconductor wires, a gate electrode layer disposed on the gate dielectric layer and wrapping around the each channel region, and dielectric spacers disposed in recesses formed toward the source/drain epitaxial layer.

Abstract: A communication method applied to an communication device comprising M first type antenna following a first communication standard and N second type antennas following a second communication standard, M and N are positive integers. The communication method comprises: (a) measuring usage time of the second type antennas; and (b) controlling a number of the antennas that the communication device use according to the usage time of the second type antennas.