Abstract: Semiconductor devices and methods of forming the same are provided. In some embodiments, a method includes receiving a workpiece having a redistribution layer disposed over and electrically coupled to an interconnect structure. In some embodiments, the method further includes patterning the redistribution layer to form a recess between and separating a first conductive feature and a second conductive feature of the redistribution layer, where corners of the first conductive feature and the second conductive feature are defined adjacent to and on either side of the recess. The method further includes depositing a first dielectric layer over the first conductive feature, the second conductive feature, and within the recess. The method further includes depositing a nitride layer over the first dielectric layer. In some examples, the method further includes removing portions of the nitride layer disposed over the corners of the first conductive feature and the second conductive feature.

Abstract: A semiconductor device including a substrate, a semiconductor package, a thermal conductive bonding layer, and a lid is provided. The semiconductor package is disposed on the substrate. The thermal conductive bonding layer is disposed on the semiconductor package. The lid is attached to the thermal conductive bonding layer and covers the semiconductor package to prevent coolant from contacting the semiconductor package.

Abstract: A semiconductor package includes a substrate and at least one integrated circuit (IC) die. Substrate solder resist has substrate solder resist openings exposing substrate bonding pads of the bonding surface of the substrate, and die solder resist has aligned die solder resist openings exposing die bonding pads of the bonding surface of the IC die. A ball grid array (BGA) electrically connects the die bonding pads with substrate bonding pads via the die solder resist openings and the substrate solder resist openings. The die solder resist openings include a subset A of the die solder resist openings in a region A of the bonding surface of the IC die and a subset B of the die solder resist openings in a region B of the bonding surface of the IC die. The die solder resist openings of subset A are larger than those of subset B.

Abstract: A circuit for controlling a memory includes a frequency parameter generator, a clock generator and a memory controller. The frequency parameter generator generates at least one frequency control signal. The clock generator, coupled to the frequency generator, increases or decreases the frequency of a clock signal by a multiple number of times according to the frequency control signal, such that the frequency of the clock signal is adjusted from an initial frequency to a target frequency. The memory controller, coupled to the clock generator, receives the clock signal and controls the memory according to the clock signal.

Abstract: A circuit for controlling a memory includes a frequency parameter generator, a clock generator and a memory controller. The frequency parameter generator generates at least one frequency control signal. The clock generator, coupled to the frequency generator, increases or decreases the frequency of a clock signal by a multiple number of times according to the frequency control signal, such that the frequency of the clock signal is adjusted from an initial frequency to a target frequency. The memory controller, coupled to the clock generator, receives the clock signal and controls the memory according to the clock signal.

Abstract: A memory test data generating circuit and method for generating a plurality of sets of test data is provided. The plurality of sets of test data is provided to a memory via a plurality of channels by a memory controller and is for testing the memory. The memory test data generating circuit includes: a plurality of counters, generating a plurality of counter values; and a data repetition and combination unit, generating the plurality of sets of test data according to the plurality of counter values, a bit width between the memory test data generating circuit and the memory controller, and a bit width between the memory controller and the memory. The test data of each channel is an identical and periodical data series.

Abstract: A display controller, video signal transmitting method and system thereof are provided. The display controller includes a processing circuit; a transmitting channel, coupled to the processing circuit; a receiving channel, coupled to the processing circuit; and a clock generator, that generates an internal clock signal and an external clock signal. Upon receiving a video signal, the processing circuit processes a first partial pixel data of the video signal to output a first display control signal. The transmitting channel converts a second partial pixel data of the video signal to a partial video signal having a multiple data rate according to the internal clock signal to be outputted.

Abstract: An apparatus for managing a memory having a plurality of command/address pins is provided. The apparatus includes a command generating module and a control module. The command generating module generates a set of target commands. The set of target commands include a plurality of command groups. Each of the command groups corresponds to at least one command/address pin of the plurality of command/address pins. It is known that the memory accesses the set of target commands from the plurality of command/address pins at a target time point. The control module controls the command groups to have different transition times prior to the target time points when the command groups are transmitted on the plurality of command/address pins.

Abstract: A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.

Abstract: A memory test data generating circuit and method for generating a plurality of sets of test data is provided. The plurality of sets of test data is provided to a memory via a plurality of channels by a memory controller and is for testing the memory. The memory test data generating circuit includes: a plurality of counters, generating a plurality of counter values; and a data repetition and combination unit, generating the plurality of sets of test data according to the plurality of counter values, a bit width between the memory test data generating circuit and the memory controller, and a bit width between the memory controller and the memory. The test data of each channel is an identical and periodical data series.

Abstract: A timing controller for a panel display system includes: an image signal receiver that receives an image signal; an overdrive circuit that receives and converts the image signal from the image signal receiver according to successive first frame data and second frame data in the image signal; an image signal transmitter that receives the converted image signal from the overdrive circuit and transmits the same to a display panel; a memory; and a memory interface unit. In a normal read/write period, the memory interface unit receives the first frame data from the overdrive circuit and stores the same in the memory, and fetches the first frame data from the memory when the overdrive circuit receives the second frame data in the image signal and transmits the same to the overdrive circuit. The memory interface unit further obtains sampling results to generate a preferred delay phase.

Abstract: A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.

Abstract: A memory controller and an associated signal generating method are provided. A generating sequence of commands is properly arranged to enlarge latching intervals of an address signal and a bank signal for stable access of a DDR memory module.

Abstract: A memory controller is connected to a double-data-rate dynamic random access memory (DDR DRAM) and an accessing unit. The memory controller includes: a processing unit, configured to receive a system address generated by the accessing unit; and a mapping unit, located in the processing unit, configured to convert the system address to a memory address and transmitting the memory address to the DDR DRAM. When a burst length of the DDR DRAM is L and L=2x (where L and x are positive integers), an (x+1)th bit of the memory address from a least significant bit (LSB) is included in a bank group address of the memory address.

Abstract: The invention is directed to a memory controller and an associated signal generating method. By appropriately arranging a sequence according to which command signals are generated and expanding a latching interval of a part of address signals, not only the memory controller is enabled to control the DDR memory modules in a functional manner to further overcome issues of conventionally small latching intervals, but also system stability and access performance are reinforced as the memory access clock speed continue to increase.

Abstract: A dynamic memory signal phase tracking method is provided. The method, applied to a memory controller that accesses a memory module, includes: issuing a memory access command and an access request to an arbiter to request for an access right of the memory module; when the access right is obtained, forwarding the memory access command to the memory module and asserting a flag signal; during a period of asserting the flag signal, sequentially using a plurality of candidate delay phases to adjust a memory signal for latching test data from the memory module, determining a delay phase according to latching results corresponding to the candidate delay phases, and recording the determined delay phases; updating an optimal delay phase according to the determined delay phase; and accessing the memory module according to the updated optimal delay phase.

Abstract: An apparatus for managing a memory having a plurality of command/address pins is provided. The apparatus includes a command generating module and a control module. The command generating module generates a set of target commands. The set of target commands include a plurality of command groups. Each of the command groups corresponds to at least one command/address pin of the plurality of command/address pins. It is known that the memory accesses the set of target commands from the plurality of command/address pins at a target time point. The control module controls the command groups to have different transition times prior to the target time points when the command groups are transmitted on the plurality of command/address pins.

Abstract: A timing controller for a panel display system includes: an image signal receiver that receives an image signal; an overdrive circuit that receives and converts the image signal from the image signal receiver according to successive first frame data and second frame data in the image signal; an image signal transmitter that receives the converted image signal from the overdrive circuit and transmits the same to a display panel; a memory; and a memory interface unit. In a normal read/write period, the memory interface unit receives the first frame data from the overdrive circuit and stores the same in the memory, and fetches the first frame data from the memory when the overdrive circuit receives the second frame data in the image signal and transmits the same to the overdrive circuit. The memory interface unit further obtains sampling results to generate a preferred delay phase.

Abstract: A dynamic memory signal phase tracking method is provided. The method, applied to a memory controller that accesses a memory module, includes: issuing a memory access command and an access request to an arbiter to request for an access right of the memory module; when the access right is obtained, forwarding the memory access command to the memory module and asserting a flag signal; during a period of asserting the flag signal, sequentially using a plurality of candidate delay phases to adjust a memory signal for latching test data from the memory module, determining a delay phase according to latching results corresponding to the candidate delay phases, and recording the determined delay phases; updating an optimal delay phase according to the determined delay phase; and accessing the memory module according to the updated optimal delay phase.

Abstract: A memory controller and an associated signal generating method are provided. A generating sequence of commands is properly arranged to enlarge latching intervals of an address signal and a bank signal for stable access of a DDR memory module.