Abstract: A manufacturing method of a semiconductor device including providing a substrate, forming a hard mask over the substrate, etching the substrate by using the hard mask as an etch mask to form a first protrusion region and a plurality of second protrusion regions, wherein the first protrusion region is separated from a closest one of the second protrusion regions by a first trench, and neighboring two of the second protrusion regions are separated by a second trench, forming a first dielectric layer lining the first trench and the second trench, forming a second dielectric layer in the first trench, in which the second dielectric layer is along the first dielectric layer in the first trench, etching back the second dielectric layer to form a blocking structure, and filling the first trench with a filling material, in which the filling material covers the blocking structure.

Abstract: A method of manufacturing a semiconductor device is provided. The method includes providing a substrate. The method also includes forming a first trench within the substrate. The method further includes forming a first nitridation layer within the first trench. In addition, the method includes forming a first isolation layer on the first nitridation layer to form a first isolation structure.

Abstract: A film clamping device includes a film holder formed in a flat shape, a cap and a plurality of limiting pads. One side of the film holder defines a first fixing slot vertically penetrating through the film holder. The first fixing slot accommodates a negative film. A dimension of the cap is disposed to be cooperated with a dimension of the first fixing slot so as to be fastened to the film holder. A bottom surface of the cap is provided as a flat surface. The plurality of the limiting pads are made of elastic materials. The plurality of the limiting pads are disposed around a peripheral wall of the first fixing slot.

Abstract: The present application provides a semiconductor structure and a manufacturing method of the semiconductor structure. A substrate is provided, wherein the substrate includes a plurality of pillars, and a top surface of each of the plurality of pillars is a substantially planar surface. A first oxide layer is formed over the substrate conformal to the pillars, wherein the formation of the first oxide layer includes oxidizing top corners of the pillars, thereby causing the top surface of each of the plurality of pillars to become a convex surface. A first dielectric layer is formed among the pillars, wherein the first oxide layer above the plurality of pillars is partially exposed through the first dielectric layer. A planarization is performed on the pillars to partially or entirely remove the convex surface.

Abstract: The present application provides a semiconductor structure and a manufacturing method of the semiconductor structure. A substrate is provided, wherein the substrate includes a plurality of pillars, and a top surface of each of the plurality of pillars is a substantially planar surface. A first oxide layer is formed over the substrate conformal to the pillars, wherein the formation of the first oxide layer includes oxidizing top corners of the pillars, thereby causing the top surface of each of the plurality of pillars to become a convex surface. A first dielectric layer is formed among the pillars, wherein the first oxide layer above the plurality of pillars is partially exposed through the first dielectric layer. A planarization is performed on the pillars to partially or entirely remove the convex surface.

Abstract: The present application provides a semiconductor structure and a manufacturing method of the semiconductor structure. The semiconductor structure includes a substrate, a residual nitrogen, a first dielectric layer, a plurality of first contacts, and a plurality of second contacts. The substrate includes a plurality of pillars in an array region of the substrate, wherein a top surface of each of the plurality of pillars is a substantially planar surface. The residual nitrogen is partially disposed on sidewalls of the pillars proximal to the top surfaces of the pillars. The first dielectric layer surrounds each of the pillars. The plurality of first contacts extends from the top surfaces of the pillars into the pillars. The plurality of second contacts extends from the top surface of the first dielectric layer into the first dielectric layer.

Abstract: The present application provides a semiconductor structure and a manufacturing method of the semiconductor structure. The semiconductor structure includes a substrate, a residual nitrogen, an oxide layer, a plurality of first contacts, and a plurality of second contacts. The substrate includes a plurality of pillars in an array region of the substrate, wherein a top surface of each of the plurality of pillars is a substantially planar surface. The residual nitrogen is partially disposed on sidewalls of the pillars proximal to the top surfaces of the pillars. The oxide layer surrounds each of the pillars. The plurality of first contacts extends from the top surfaces of the pillars into the pillars. The plurality of second contacts extends from the top surface of the first dielectric layer into the first dielectric layer.

Abstract: The present disclosure provides a memory device and a method of manufacturing the memory device. The memory device includes a semiconductor substrate defined with an active area and including a plurality of fins protruding from the semiconductor substrate and disposed within the active area, wherein each of the plurality of fins has a first planar top surface; a first word line extending into the semiconductor substrate and between an adjacent two of the plurality of fins, wherein the first word line includes an oxide layer conformal to surfaces of the adjacent two of the plurality of fins, a first conductive member surrounded by the oxide layer, and a first nitride layer disposed over the first conductive member and surrounded by the oxide layer; and an isolation extending into the semiconductor substrate and surrounding the active area.

Abstract: The present disclosure provides a memory device and a method of manufacturing the memory device. The memory device includes a semiconductor substrate defined with an active area and including a plurality of fins protruding from the semiconductor substrate and disposed within the active area, wherein each of the plurality of fins has a first planar top surface; a first word line extending into the semiconductor substrate and between an adjacent two of the plurality of fins, wherein the first word line includes an oxide layer conformal to surfaces of the adjacent two of the plurality of fins, a first conductive member surrounded by the oxide layer, and a first nitride layer disposed over the first conductive member and surrounded by the oxide layer; and an isolation extending into the semiconductor substrate and surrounding the active area.

Abstract: A method used for a control circuit for controlling a display panel includes steps of: determining whether there is an input video data received at a predetermined time; outputting an output video data and a clock signal having a first frequency to the display panel when determining that there is an input video data received at the predetermined time; and stopping outputting the output video data but outputting the clock signal having a second frequency to the display panel when determining that there is no input video data received at the predetermined time. Wherein, the second frequency is higher than the first frequency.

Abstract: The present disclosure provides a method of preparing active areas. The method includes the operations of: receiving a substrate having an oxide layer, a nitride layer, and a silicon layer thereon; forming a patterned photoresist layer on the silicon layer; depositing a mask layer to cover a contour of the patterned photoresist layer; coating a carbon layer on the mask layer; etching the carbon layer, the mask layer, and the silicon layer to expose a top surface of the nitride layer; forming a plurality of opens in the oxide layer to expose a top surface of the substrate; and growing an epitaxial layer from the top surface of the substrate in the plurality of opens to form the active areas.

Abstract: A memory device includes a substrate, an oxide layer, and a plurality of spacers. The substrate includes a silicon layer, a nitride layer, and a plurality of isolation trenches. The nitride layer overlies the silicon layer. The plurality of isolation trenches penetrates through the nitride layer and a portion of the silicon layer. The oxide layer fills the plurality of isolation trenches and has a surface that is coplanar with a surface of the nitride layer. The plurality of spacers is encircled in the oxide layer, in which top surfaces of the plurality of spacers are covered by the oxide layer.

Abstract: A semiconductor device includes: single-bit flip-flop regions (SBFF regions) which comprise a multi-bit flip-flop (MBFF) region; the MBFF region having a two-dimensional floor plan represented by a grid including rows and a first column extending in corresponding first and perpendicular second directions, each SBFF region representing an intersection of a corresponding row and column; the SBFF regions being coupled in a daisy chain for which an output of a preceding one of the SBFF regions in the daisy chain is coupled to an input of a succeeding one of the SBFF regions in the daisy chain; and orientations of the SBFF regions relative to the first direction (?-orientations) being arranged in an alternating pattern relative to the second direction so that a two-dimensional representation of a flow path of a data signal along the first column has a serpentine shape.

Abstract: There is provided an optical sensor package including a substrate, a base layer, an optical detection region, a light source and a light blocking wall. The base layer is arranged on the substrate. The light detection region and the light source are arranged on the base layer. The light blocking wall is arranged on the base layer, and located between the light detection region and the light source to block light directly propagating from the light source to the light detection region.

Abstract: A method used for a control circuit for controlling a display panel includes steps of: determining whether there is an input video data received at a predetermined time; outputting an output video data and a clock signal having a first frequency to the display panel when determining that there is an input video data received at the predetermined time; and stopping outputting the output video data but outputting the clock signal having a second frequency to the display panel when determining that there is no input video data received at the predetermined time. Wherein, the second frequency is higher than the first frequency.

Abstract: A method for preparing a semiconductor device structure is provided. The method includes forming a target layer over a semiconductor substrate; forming an energy-sensitive layer over the target layer; performing a first energy treating process to form a plurality of first treated portions in the energy-sensitive layer; performing a second energy treating process to form a plurality of second treated portions in the energy-sensitive layer; removing the first treated portions and the second treated portions to respectively form a plurality of first openings and a plurality of second openings; transferring the first openings and the second openings into the target layer to respectively form a plurality of third openings and a plurality of fourth openings; and transferring the third openings and the fourth openings into the semiconductor substrate to respectively form a plurality of fifth openings and a plurality of sixth openings.

Abstract: An auxiliary assessment method for cardiac function performed by a computing unit includes collecting a number of heartbeats and an amount of movement of a subject in a period of time; and calculating a distance per beat to assess cardiac function of the subject. The distance per beat is defined by dividing the amount of movement by the number of heartbeats. A length of the period of time is defined between at least two adjacent heartbeats. The amount of movement corresponds to a cumulative amount of movement in the period of time.

Abstract: There is provided an optical sensor package including a substrate, a base layer, an optical detection region, a light source and a light blocking wall. The base layer is arranged on the substrate. The light detection region and the light source are arranged on the base layer. The light blocking wall is arranged on the base layer, and located between the light detection region and the light source to block light directly propagating from the light source to the light detection region.

Abstract: A method of manufacturing a semiconductor device is provided. The method includes: providing a substrate; forming a metallization layer on the substrate; forming a first sacrificial layer and a second sacrificial layer; forming a first mask layer and a second mask layer, wherein the first mask layer covers the first sacrificial layer, the second mask layer covers the second sacrificial layer; forming a first width controlling element on a lateral surface of the first mask layer and a second width controlling element on a lateral surface of the second mask layer; removing the first mask layer and the second mask layer; and patterning the metallization layer to form a first word line between the first sacrificial layer and the second sacrificial layer, wherein a dimension of the first word line depends on a dimension of the first width controlling element.

Abstract: A method of manufacturing a semiconductor device is provided. The method includes: providing a substrate; forming a metallization layer on the substrate; forming a first sacrificial layer and a second sacrificial layer; forming a first mask layer and a second mask layer, wherein the first mask layer covers the first sacrificial layer, the second mask layer covers the second sacrificial layer; forming a first width controlling element on a lateral surface of the first mask layer and a second width controlling element on a lateral surface of the second mask layer; removing the first mask layer and the second mask layer; and patterning the metallization layer to form a first word line between the first sacrificial layer and the second sacrificial layer, wherein a dimension of the first word line depends on a dimension of the first width controlling element.