Abstract: An active pixel sensor cell, and the process for forming the active pixel sensor cell, featuring a pinned photodiode structure, and a readout region, located in a region of the pinned photodiode structure, has been developed. The process features the formation of a N+ readout region, performed simultaneously with the formation of the N+ source/drain region of the reset transistor, however with the N+ readout region placed in an area to be used for the pinned photodiode structure. The pinned photodiode structure is next formed via formation of a lightly doped N type well region, used as the lower segment of the pinned photodiode structure, followed by the formation of P+ region, used as the top segment of the pinned photodiode structure, with the N+ readout region, surrounded by the P+ region.

Abstract: A method of forming an image sensor is disclosed. A partially processed semiconductor wafer is provide, containing p-type and/or n-type regions which are bounded by isolation regions and with gate oxide layers grown on the surfaces upon which gate electrode structures are disposed, some of said gate electrode structures will serve as gate electrodes of image sensor transistors. Ions are implanted to form source/drain structures about the said gate electrode structures, with an extended region for source drains bordering photodiode regions. Ions are implanted to form photodiodes, overlapping the extended bordering source drain regions. A blanket transparent insulating layer is deposited.

Abstract: A process of fabricating an image sensor cell, on a semiconductor substrate, with the image sensor cell exhibiting low dark current generation, and high signal to noise ratio, has been developed. The process features the use of a photoresist shape, used to protect a previously formed photodiode element, from an reactive ion etching procedure, used to define insulator spacers on the sides of a polysilicon gate structure, of a reset transistor structure This process sequence avoids damage to the surface of an N type component, of the photodiode element, resulting in the improved electrical characteristics, when compared to counterpart image sensor cells, in which the photodiode element was subjected to the insulator spacer definition procedure.

Abstract: A ceiling lighting fixture, including a rectangular bottom-open casing having a plurality of parallel partition frames and an electric connector connected to external power supply, a plurality of lamp tubes respectively mounted in the casing and separated by the partition frames and electrically connected to the electric connector, and a cylindrical sensor-controlled switch adapted for detecting the presence of persons and switching on/off the electric connector subject to its detection result, one of the partition frames having a rounded switch mounting hole and a plurality of bendable locating strips respectively projecting into the switch mounting hole at different angles, the cylindrical sensor-controlled switch being mounted in the rounded switch mounting hole and connected to the electric connector, having a plurality of recessed holes spaced around the periphery and forced into engagement with the locating strips.

Abstract: Electrical devices are characterized by optically triggering an electrical signal onto the device and then optically sampling the electrical signal waveform on the device.