Abstract: The present invention discloses a method of determining a whole-scene image by using multiple image-capturing devices, and the method has two main features including non-contact formation digital image method and the parallax elimination process for captured images. The former feature uses a concyclic fitting calculation to easily determine the locations and orientations of the image-capturing devices, so as to achieve the objective of assisting in capturing the whole-scene image. The latter feature can effectively improve the image quality, so as to effectively solve the problems in conventional technology.

Abstract: A method is provided to label invisible fluorescence by a visible light. A surgeon gets rid of screen for direct observation without repeated location confirmations between surgical site and onscreen mark. Fluid movement of a fluorescent dye can be observed in a real-time mode. Through projecting a visible-light spot at a fluorescent area at real time, the surgeon observes the fluorescent area the visible-light spot projecting to. Hence, the problem that fluorescence imaging technology must rely on screen to see the location of the fluorescent area is solved. When a patient moves or fluorescent areas changes, an image sensor automatically adjusts an area labeled by a visible-light spot through changing a photographing area with a focus automatically set. In addition, the method adjusts a projecting angle of the visible-light spot with an initial mirror and a final mirror only. Adjustment of lens group is not required the saving money.

Abstract: A device for real-time thickness inspection is provided. An optical interferometric technique is used. Measurement requirements in rapid online thickness inspection can be satisfied. An object is measured in a non-contact and non-destructive way. For measuring, an optical spherical wavefront is radiated on the object in an oblique angle. The interference fringe pattern (IFP) thus imaged on a screen is directly related to the thickness distribution of the object. The phase difference on the same horizontal cross section in the IFP monotonically decreases from the light source side to the other side. Accordingly, phase unwrapping can be effectively performed without using phase shift. The present invention achieves rapid on-line thickness inspection through the optical path of interference without using optical lens groups and special optical elements.

Abstract: A concentric circle adjusting apparatus for a multiple image capturing device is disclosed, where a first and second correction angles for correcting a first and second image capturing devices are respectively calculated by a control device according to a link length of a standard link, a first angle, a second angle, a first distance, and a second distance, respectively, so that a first and second platforms are controlled according to the first and second control commands to rotate the first and second image capturing device by the first and second correction angles, respectively, whereby the efficacy of an increased visible range and a rapid calibration may be achieved.

Abstract: An apparatus is provided for detecting transmittance of a trench. The trench is located on an infrared-transmittable material, which can be a wafer. The wafer is obtained after a ditching process. An image of the wafer is fetched. The contrast of the image is greatly enhanced. The contrast-enhanced image is used for automated analysis of the transmittance of the trench. Accuracy of detecting the transmittance is improved. Hence, the present invention uses a simple structure to detect transmittance defects of the trench for ensuring goodness of the wafer.

Abstract: An apparatus is provided for detecting transmittance of a trench. The trench is located on an infrared-transmittable material, which can be a wafer. The wafer is obtained after a ditching process. An image of the wafer is fetched. The contrast of the image is greatly enhanced. The contrast-enhanced image is used for automated analysis of the transmittance of the trench. Accuracy of detecting the transmittance is improved. Hence, the present invention uses a simple structure to detect transmittance defects of the trench for ensuring goodness of the wafer.

Abstract: A concentric circle adjusting apparatus for a multiple image capturing device is disclosed, where a first and second correction angles for correcting a first and second image capturing devices are respectively calculated by a control device according to a link length of a standard link, a first angle, a second angle, a first distance, and a second distance, respectively, so that a first and second platforms are controlled according to the first and second control commands to rotate the first and second image capturing device by the first and second correction angles, respectively, whereby the efficacy of an increased visible range and a rapid calibration may be achieved.

Abstract: The present invention provides a measurement system of real-time spatially-resolved spectrum and time-resolved spectrum and a measurement module thereof. The measurement system includes an excitation light and a measurement module. The excitation light excites a fluorescent sample and the measurement module receives and analyzes fluorescence emitted by the fluorescent sample. The measurement module includes a single-photon linear scanner and a linear CCD spectrometer. The single-photon linear scanner selectively intercepts a light beam component of a multi-wavelength light beam that has a predetermined wavelength to generate a single-wavelength time-resolved signal, wherein the multi-wavelength light beam is generated by splitting the fluorescence. The linear CCD spectrometer receives the multi-wavelength light beam and generates a spatially-resolved full-spectrum fluorescence signal.

Abstract: An array near-field high optical scattering material detection method is disclosed, which comprises steps of irradiating an input light onto a high scattering material to generate a diffuse reflection, a diffusion, and a transmission within the high scattering material; reading out an optical energy over different positions on the high scattering material, respectively; forming a two dimensional light intensity distribution data image according to the optical energy over different positions on the high scattering material, respectively; and analyzing an internal composition variation of the high scattering material according to the two dimensional light intensity distribution data image to obtain the internal composition data of the high scattering material.

Abstract: The present invention relates to a process for rapidly ex vivo expanding and harvesting high-purity of hematopoietic stem/progenitor cells and the pharmaceutical composition comprising the same. The process of the present invention is characterized by: an overnight culture of mononuclear cells isolated by density gradient centrifugation; and subsequent purification and ex vivo expansion of high-purity hematopoietic stem/progenitor cells. The prepared hematopoietic stem/progenitor cells comprise high percentage of clinically effective hematopoietic stem/progenitor cells (the CD34+ CD38? cells), and still maintain high viability and effective differential activity after cryopreservation and thawing processes. Besides, for the manufacturing method of the present invention does not use components of animal origin, the harvested hematopoietic stem/progenitor cells can be directly used in clinical applications.

Abstract: A concentric circle adjusting apparatus for a multiple image capturing device is disclosed, where a first and second correction angles for correcting a first and second image capturing devices are respectively calculated by a control device according to a link length of a standard link, a first angle, a second angle, a first distance, and a second distance, respectively, so that a first and second platforms are controlled according to the first and second control commands to rotate the first and second image capturing device by the first and second correction angles, respectively, whereby the efficacy of an increased visible range and a rapid calibration may be achieved.

Abstract: The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art.

Abstract: A multi-image capture device capturing images by means of circular motion controls the shift movement, along a semi-circular measuring rod, of a moving mechanism by a location control device. Furthermore, a rotary control device is used to control the positioning and image-capturing angle of a second image capture device fixed on the rotary mechanism. Thereby, a first image capture device and the second image capture device are of a co-circle configuration where the optical axis of the first image capture device and the second image capture device overlap to form a center of the co-circle. Such a configuration can broaden the visual range of the image capture device, and allows quick calibration of the image capture device according to positioning of shift movement and image-capturing angles.

Abstract: A frame device includes a first frame, a plurality of fasteners and an second frame. The first frame includes a base wall and a side wall extending transversely from one end of the base wall. The fasteners are disposed on the side wall opposite to the base wall. The second frame is assembled to and covers an upper end of the first frame and has a plurality of spaced-apart positioning holes. A portion of each fastener passes out of a respective positioning hole and presses against the second frame when the second frame is assembled to the first frame.

Abstract: The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art.

Abstract: A fluorescence intensity analyzing and fluorescence image synthesizing system and method are disclosed. The first fluorescence intensity detection device successively detects the plurality of first fluorescence intensities according to the first timing and the second fluorescence intensity detection device successively detects the plurality of second fluorescence intensities according to the second timing, and then the picture processing device analyzes the first and second timings and synthesizes the first and second fluorescence intensity ranges into the synthesized picture according to the fluorescence intensities, whereby the image processing technology may be used to calculate the fluorescence target range and thus mark the fluorescence target range.

Abstract: An image correlation for images having speckle pattern is evaluated. Modulation transfer function (MTF) curves of speckle-pattern images captured at different times are figured out. Whether a correlation value between the MTF curves meets a threshold is checked. If the correlation value is smaller than the threshold, speckle-pattern images are re-selected for re-figuring out the MTF curves and the correlation value. Thus, error of strain and displacement for digital image correlation owing to blurring images of the on-moving target object is figured out; calculation time of the digital image correlation is reduced; and accuracy on measuring physical parameters of the target object before and after movement is improved for digital image correlation.

Abstract: An image-based refractive index measuring system comprises an optical device and an electronic device. The optical device is used to guiding an external light which is passed through an analyte. The electronic device comprises an image capture module, an image analyze module and a display module. The image capture module generates a first image by capturing the external light source. The image analyze module connects to the image capture module to receive the first image, and analyzes the first image in order to generate an analytical result comprising the refractive index of the analyte. The display module connects to the image analyze module to receive and display the analytical result.

Abstract: A device for real-time thickness inspection is provided. An optical interferometric technique is used. Measurement requirements in rapid online thickness inspection can be satisfied. An object is measured in a non-contact and non-destructive way. For measuring, an optical spherical wavefront is radiated on the object in an oblique angle. The interference fringe pattern (IFP) thus imaged on a screen is directly related to the thickness distribution of the object. The phase difference on the same horizontal cross section in the IFP monotonically decreases from the light source side to the other side. Accordingly, phase unwrapping can be effectively performed without using phase shift. The present invention achieves rapid on-line thickness inspection through the optical path of interference without using optical lens groups and special optical elements.

Abstract: A system of computing surface reconstruction, in-plane and out-of-plane displacements and strain distribution utilizes the optical switching element to switch the reference beam to analyze the images of the test object before and after deformation, to measure the topography, in-plane and out-of-plane displacements and surface two-dimensional strain distribution on the test surface of the test object, and thus to increase the measurement range on the test surface of the test object with the use of image registration. Thereby, the complexity and error of scanning the test object can be reduced. Such a system need not to move the image capturing device or test object to generate relative displacement for reaching the measurement effect of the test surface of the test object in three-dimensional coordinates.