Abstract: An overlay mark suitable for use in manufacturing nonplanar circuit devices and a method for forming the overlay mark are disclosed. An exemplary embodiment includes receiving a substrate having an active device region and an overlay region. One or more dielectric layers and a hard mask are formed on the substrate. The hard mask is patterned to form a hard mask layer feature configured to define an overlay mark fin. Spacers are formed on the patterned hard mask layer. The spacers further define the overlay mark fin and an active device fin. The overlay mark fin is cut to form a fin line-end used to define a reference location for overlay metrology. The dielectric layers and the substrate are etched to further define the overlay mark fin.

Abstract: An overlay mark suitable for use in manufacturing nonplanar circuit devices and a method for forming the overlay mark are disclosed. An exemplary embodiment includes receiving a substrate having an active device region and an overlay region. One or more dielectric layers and a hard mask are formed on the substrate. The hard mask is patterned to form a hard mask layer feature configured to define an overlay mark fin. Spacers are formed on the patterned hard mask layer. The spacers further define the overlay mark fin and an active device fin. The overlay mark fin is cut to form a fin line-end used to define a reference location for overlay metrology. The dielectric layers and the substrate are etched to further define the overlay mark fin.

Abstract: An overlay mark suitable for use in manufacturing nonplanar circuit devices and a method for forming the overlay mark are disclosed. An exemplary embodiment includes receiving a substrate having an active device region and an overlay region. One or more dielectric layers and a hard mask are formed on the substrate. The hard mask is patterned to form a hard mask layer feature configured to define an overlay mark fin. Spacers are formed on the patterned hard mask layer. The spacers further define the overlay mark fin and an active device fin. The overlay mark fin is cut to form a fin line-end used to define a reference location for overlay metrology. The dielectric layers and the substrate are etched to further define the overlay mark fin.

Abstract: A method of automatically assessing skeletal age of hand radiographs, comprising: providing a radiographic image of both two hands; cropping a first image of the left hand or the right hand; rotating the first image to make the fingertip of the medius point upwards the vertical; cropping a second image of the medius; segmenting the phalanges of the medius to acquire a third image; extracting a plurality of physiological features of the third image to acquire a first data; extracting a plurality of morphological features of the third image to obtain a second data; delivering the first data and the second data to a neural network for training; and outputting an assessment of the skeletal age.

Abstract: The present eye activity monitoring system includes a monitoring apparatus for acquiring the eye image of a user in a closed eye state and an image-processing apparatus for generating an alarm signal based on the eye image. The monitoring apparatus includes an eye mask, an image-sensing unit positioned on the eye mask, a control circuit electrically connected to the image-sensing unit, a transmitting module electrically connected to the control circuit, an antenna electrically connected to the transmitting module and at least on power supply positioned on the eye mask. The image-processing apparatus has a receiving module and an image-processing module. The image-processing module judges the eye status according to the acquired feature of the eye image, and sends a warning alarm to trigger the warning device when an abnormal event occurs.

Abstract: A method of automatically assessing skeletal age of hand radiographs, comprising: providing a radiographic image of both two hands; cropping a first image of the left hand or the right hand; rotating the first image to make the fingertip of the medius point upwards the vertical; cropping a second image of the medius; segmenting the phalanges of the medius to acquire a third image; extracting a plurality of physiological features of the third image to acquire a first data; extracting a plurality of morphological features of the third image to obtain a second data; delivering the first data and the second data to a neural network for training; and outputting an assessment of the skeletal age.