Abstract: A method of fabricating an indium tin oxide film (ITO film) with well thermal stabilization and low resistivity has the steps of: a) Provide a silicon dioxide film and a titanium dioxide film on a substrate, wherein the stacked silicon dioxide film and the titanium dioxide form an oxide dielectric layer. b) Provide an ion beam, which is generated by introducing oxygen to an ion source, to a surface of the oxide dielectric layer to take the ion process on the surface of the oxide dielectric layer. c) Provide an indium tin oxide film on the surface of the oxide dielectric layer. The thermal stabilization and the resistivity of the ITO film are kept stable to make the ITO film having a well light transmission.

Abstract: The mixer circuit includes a differential rf input driver; a differential local oscillator input circuit coupled to the differential rf input driver; a non-linear load coupled to the differential local oscillator input circuit wherein the non-linear load compensates for non-linearity of the differential rf input driver. The non-linear load has a V-I (voltage-current) transfer function the inverse of the input driver. This improves the mixer linearity without sacrificing the Gain or Noise Figure.

Abstract: The mixer circuit includes a differential rf input driver; a differential local oscillator input circuit coupled to the differential rf input driver; a non-linear load coupled to the differential local oscillator input circuit wherein the non-linear load compensates for non-linearity of the differential rf input driver. The non-linear load has a V-I (voltage-current) transfer function the inverse of the input driver. This improves the mixer linearity without sacrificing the Gain or Noise Figure.

Abstract: A hybrid Nyquist thermometer and sigma delta digital to analog converter is presented. The digital input signal is divided into most significant bits and least significant bits. The most significant bits are converted to a thermometer code. A thermometer element array is controlled by the thermometer code. A fractional value is calculated from the least significant bits and used to dither the first unexercised array element in order to get finer resolution with guaranteed monotonicity.

Abstract: An arrangement provides a reduced harmonic content output signal that represents a value of a digital input signal. The arrangement includes plural storage devices 301 . . . configured to sample and store the digital input signal at different respective phases of a clock signal. The arrangement also has plural current steering digital-to-analog converters (DACs) 311 . . . configured to receive respective stored digital signals from respective ones of the plural storage devices, and to provide respective currents that represent the received stored digital signals. The arrangement also includes a combining arrangement configured to combine the currents from respective ones of the plural current steering DACs, so as to provide the reduced harmonic content output signal that represents the value of the digital input signal.

Abstract: A method and related system for semiconductor equipment prevention maintenance management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording time and cost of prevention maintenance after each piece of equipment runs prevention maintenance, evaluating the quality of semiconductor products, and analyzing a relationship between the corresponding process parameter, the corresponding equipment parameters, prevention maintenance cost, and semiconductor products of each piece of equipment.

Abstract: A method and related system for semiconductor equipment early warning management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording the quality of semiconductor products and corresponding testing parameters, and analyzing a relationship between the corresponding process parameters, the corresponding equipment parameters, and the quality of semiconductor products of each piece of equipment.

Abstract: A method and related system for semiconductor equipment prevention maintenance management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording time and cost of prevention maintenance after each piece of equipment runs prevention maintenance, evaluating the quality of semiconductor products, and analyzing a relationship between the corresponding process parameter, the corresponding equipment parameters, prevention maintenance cost, and semiconductor products of each piece of equipment.

Abstract: A semiconductor process and yield analysis integrated real-time management method comprises inspecting a plurality of semiconductor products with a plurality of items to generate and record a plurality of inspecting results during semiconductor process, classifying the semiconductor products as a plurality of groups with a default rule to generate and record an initial data in a database, indexing a plurality of semiconductor product groups and the corresponding initial data from the database by a default product rule and parameter to calculate a corresponding analysis result, and displaying the analysis result according to the indexed semiconductor product groups and the initial data.

Abstract: A high-speed signal level detector employs the high gain and high bandwidth of an inverter to perform a comparison. The high-speed signal level detector is capable of achieving the desired high-speed level detection without demanding the substantial power consumption required when using either the averaging technique or a high bandwidth op-amp type comparator.

Abstract: A method for analyzing final test parameters includes the following steps: To retrieve the final test parameters of each product lots by searching a database. To compare the final test parameters to select a representative final test parameter and a representative final test item. To determine if the representative final test item is correlated to a packaging process step. To classify the plurality of product lots into at least a first qualified group and a first failed group according to the representative final test item if there is correlation. To search for the equipment through which the first qualified group or the first failed group had passed in the packaging process step. To determine the equipment having a probability of having processed the first failed group being greater than a probability of having processed the first qualified group.

Abstract: Methods and systems of adjusting an oscillator frequency are disclosed. One example method includes reading a temperature associated with an oscillator, reading a first tuning code associated with the temperature from a memory, and tuning the oscillator with the first tuning code. The example method may further include determining a second tuning code, and storing the second tuning code and an indication of the temperature in the memory.

Abstract: A hybrid Nyquist thermometer and sigma delta digital to analog converter is presented. The digital input signal is divided into most significant bits and least significant bits. The most significant bits are converted to a thermometer code. A thermometer element array is controlled by the thermometer code. A fractional value is calculated from the least significant bits and used to dither the first unexercised array element in order to get finer resolution with guaranteed monotonicity.

Abstract: The differential signal squarer/limiter and balancer circuit includes: a complementary differential pair MP5, MP6, MN2, and MN3; and a complementary positive feedback amp MP11, MP12, MN12, and MN13 coupled to the complementary differential pair.

Abstract: An arrangement is provided including an electrode extending to an electrode tip for contacting a workpiece. A welding configuration of the electrode tip is established by exposing the electrode tip to a selected welding environment for use in forming a weld having a target set of weld parameters. An electrode passage is defined in a biasing force arrangement supporting at least a portion of the length of an elongated, flexible electrode and to limit lateral movement sufficient to transfer at least a portion of a resilient force to the electrode tip so that the tip resiliently contacts the weld region. The electrode passage limits induced lateral flexing to an extent which transfers an amount of the resilient force to the first end portion of the electrode that is sufficient to provide for formation of a weld between the support arrangement and the workpiece.

Abstract: The invention features methods and systems for detecting the presence of an energetic material in a sample in which the presence of the energetic material is unknown. The method includes the steps of: heating the sample; measuring heat flow between the sample and its surrounding environment, e.g., by using differential scanning calorimetry (DSC); and analyzing the measured heat flow between the sample and its surrounding environment. An exothermal peak in the measured heat flow indicates the presence of the energetic material in the sample. The system includes a thermal measuring apparatus for performing the heating and measuring steps, and an analyzer for detecting the presence of the energetic material based on the measured heat flow. The invention also features methods and systems for identifying contraband materials (e.g., explosives and drugs) by measuring the thermogram (e.g., by DSC) of a sample to be identified and comparing it to reference thermograms for known contraband materials.

Abstract: A method for analyzing final test parameters includes the following steps: To retrieve the final test parameters of each product lots by searching a database. To compare the final test parameters to select a representative final test parameter and a representative final test item. To determine if the representative final test item is correlated to a packaging process step. To classify the plurality of product lots into at least a first qualified group and a first failed group according to the representative final test item if there is correlation. To search for the equipment through which the first qualified group or the first failed group had passed in the packaging process step. To determine the equipment having a probability of having processed the first failed group being greater than a probability of having processed the first qualified group.

Abstract: The invention features methods and systems for detecting the presence of an energetic material in a sample in which the presence of the energetic material is unknown. The method includes the steps of: heating the sample; measuring heat flow between the sample and its surrounding environment, e.g., by using differential scanning calorimetry (DSC); and analyzing the measured heat flow between the sample and its surrounding environment. An exothermal peak in the measured heat flow indicates the presence of the energetic material in the sample. The system includes a thermal measuring apparatus for performing the heating and measuring steps, and an analyzer for detecting the presence of the energetic material based on the measured heat flow. The invention also features methods and systems for identifying contraband materials (e.g., explosives and drugs) by measuring the thermogram (e.g., by DSC) of a sample to be identified and comparing it to reference thermograms for known contraband materials.

Abstract: Attaching an attachment surface of an electrically conductive workpiece to an electrically conductive support surface is described. In one aspect, a biasing force is distributed at least partially around a weld region of the workpiece to urge the attachment surface of the workpiece against the support surface in a way which at least resists welding induced movement of the workpiece relative to the support arrangement. An electrode arrangement, having an electrode tip, contacts the workpiece to provide for substantially compliant movement of the electrode tip against the weld region in directions that are parallel to the support surface. In another aspect, a combined manipulation/welding arrangement is supported for controlled movement with a free end configured for engaging the workpiece to bias the workpiece against the support surface to manipulate the workpiece against the surface and to conduct an electrical current, while holding the workpiece, for welding to the support surface.

Abstract: An optical assembly includes a light path and at least one optic to be positioned in the path. A support arrangement supports the optic having a foot arrangement including at least one foot that receives a direct manipulation with the foot slidingly engaged against a support surface to move the optic relative to the light path. Movement of the foot may move the optic along a predetermined path. The foot defines a footprint for engaging the support surface and receives the direct manipulation in a way which changes the footprint on the support surface to move the optic responsive to changes in the footprint. A movement arrangement may selectively bias the foot against the support surface during a movement mode, intended to permit movement of the foot against the support surface, and in a locked mode, intended to lock the foot against the support surface.