Abstract: A data processing method for acoustic event includes: establishing a simulated acoustic frequency event module, a data capturing module, and a sound application decision module in a software manner, setting a simulated hardware parameter to the simulated acoustic frequency event module, inputting a sound signal to a frequency filtering module of the simulated acoustic frequency event module, and obtaining metadata from a frequency event quantizer of the simulated acoustic frequency event module, dividing each of the metadata into multiple frames according to a time interval by the data capturing module, accumulating an event number of each frame by the data capturing module, setting a label of each frame according to the event number, storing these frames, the event number and the label in a database, and training a decision model by the sound application decision module according to the database and a sound application.

Abstract: A quantization method for neural network model includes following steps: initializing a weight array of a neural network model, wherein the weight array includes a plurality of initial weights; performing a quantization procedure to generate a quantized weight array according to the weight array, wherein the quantized weight array includes a plurality of quantized weights within a fixed range; performing a training procedure of the neural network model according to the quantized weight array; and determining whether a loss function is convergent in the training procedure and outputting a post-trained quantized weight array when the loss function is convergent.

Abstract: A data processing system disposed on a sensor comprises a de-identified sensing device and a decoding device. The de-identified sensing device is configured to receive a sensing data of a target and to process the sensing data to generate a de-identified data. The decoding device communicably connects to the de-identified sensing device and is configured to generate a decoded data according to the de-identified data and a decoding parameter obtained from a database trained by machine learning. The de-identified sensing device comprises an analog encoder configured to encode the sensing data to generate a responsive data.

Abstract: A semiconductor manufacturing system includes an operating terminal, a first controller, and a plurality of second controllers. The operating terminal controls a main controller. Each of the plurality of second controllers is electrically connected to the first controller. In an initial or default state, the operating terminal controls the first controller as a main controller, and when the first controller fails, the operating terminal controls one of the plurality of the second controllers as a main controller, the others of the plurality of second controllers being controlled by the main controller.

Abstract: A front opening unified pod (FOUP) loading and air filling system comprises a FOUP loading device and an air filling device. The FOUP loading device is configured to load and unload a FOUP, and comprises a substrate and a controller. The substrate comprises a frame, a bearing platform installed on the frame, and a cavity under the bearing platform. The bearing platform is configured to support the FOUP. The controller and the air filling device are accommodated in the cavity. The air filling device is connected to the FOUP.

Abstract: A wafer supporting system includes a supporting pedestal. The supporting pedestal includes a main supporting body and a hollow frame surrounding the supporting pedestal. The main supporting body includes a top surface and a bottom surface opposite to the top surface, the top surface defined a plurality of vent grooves and a plurality of holding grooves. The main supporting body includes a plurality of holding channels extending through from the bottom surface to the holding grooves and a plurality of first through holes pass through from the top surface to the bottom surface, each holding groove is surrounded by a plurality of first through holes; an inner side surface of the hollow frame and a side wall of the supporting pedestal form a gap, and a plurality of exhaust cylinders are arranged in the annular gap and each exhaust cylinder is communicated with each vent groove.

Abstract: A reflective exposure apparatus includes a platform, an illuminating system, a photomask, a chip, and a reflecting convex mirror. The photomask is formed on the platform and faces the illuminating system. The chip is formed on the platform. The illuminating system and the reflecting curved mirror are formed on opposite sides of the platform. The platform can be moved relative to the illuminating system and the reflecting curved mirror.

Abstract: An air purifying device for a front opening unified pod (FOUP) carrying silicon wafers includes an air supply assembly and an air discharging assembly. The air supply assembly can be triggered by a signal to supply purified air to the FOUP. The air discharging assembly discharges air from the FOUP when the air supply assembly begins to supply the FOUP with purified air and detects a humidity and a temperature of the discharged air. The detected humidity and the detected temperature correspond to a relative humidity of the discharged air. When the relative humidity is equal to a preset relative humidity, the air supply assembly is stopped and the air discharging assembly is stopped.

Abstract: An air purifying device for an FOUP includes an air supply assembly. The air supply assembly includes an air supply tube and an airtight connecting unit connecting the tube to the FOUP in an airtight manner. The air tight connecting unit includes an elastic absorbing portion, a nozzle, and a driver. An initial position of the elastic absorbing portion is lower than a supporting surface of a load port before the FOUP is placed on the supporting surface. One end of the nozzle is fixedly inserted to the elastic absorbing portion, and another end of the nozzle is movably inserted to the air supply tube. The driver can drive the nozzle and the elastic absorbing portion to move upward to press against the FOUP when the FOUP is placed on the supporting surface, causing the elastic absorbing portion to be vertically deformed to maintain an airtight connection.

Abstract: A shunting device used to transport workpieces comprises a plurality of rotating shafts parallel to one another and arranged in arrays, a plurality of first omnidirectional wheels, and a plurality of second omnidirectional wheels. The first omnidirectional wheels and the second omnidirectional wheels are each wrapped around a corresponding one of the rotating shafts in a matrix. The first omnidirectional wheels and the second omnidirectional wheels are alternatively arranged along the corresponding one of the plurality of rotating shafts and a second direction perpendicular to the plurality of rotating shafts. A plurality of first driven rollers of the first omnidirectional wheels and a plurality of second driven rollers of the second omnidirectional wheels are mirror-symmetrical along at least one of a third direction parallel to the plurality of rotating shafts and the second direction.

Abstract: A single bridge magnetic field sensor includes a fluxguide mounted to a surface of a substrate. A bridge unit includes first, second, third, and fourth magnetoresistive elements mounted around the fluxguide and mounted on the surface of the substrate. A switching circuit is electrically connected to two voltage inputs, two grounding terminals, two voltage output terminals, and the four magnetoresistive elements. The switching circuit can proceed with circuit switching according to a magnetic field in each axis direction to be measured, thereby changing electrical connection between the voltage inputs, the grounding terminals, the voltage output terminals, and the four magnetoresistive elements. A measuring unit is electrically connected to the two voltage output terminals and the four magnetoresistive elements.

Abstract: A single bridge magnetic field sensor includes a fluxguide mounted to a surface of a substrate. A bridge unit includes first, second, third, and fourth magnetoresistive elements mounted around the fluxguide and mounted on the surface of the substrate. A switching circuit is electrically connected to two voltage inputs, two grounding terminals, two voltage output terminals, and the four magnetoresistive elements. The switching circuit can proceed with circuit switching according to a magnetic field in each axis direction to be measured, thereby changing electrical connection between the voltage inputs, the grounding terminals, the voltage output terminals, and the four magnetoresistive elements. A measuring unit is electrically connected to the two voltage output terminals and the four magnetoresistive elements.

Abstract: The reliability of an integrated circuit is inferred from the operational characteristics of sample metal oxide semiconductor (MOS) devices switchably coupled to drain/source bias and gate input voltages that are nominal, versus voltage and current conditions that elevate stress and cause temporary or permanent degradation, e.g., hot carrier injection (HCI), bias temperature instability (BTI, NBTI, PBTI), time dependent dielectric breakdown (TDDB). The MOS devices under test (preferably both PMOS and NMOS devices tested concurrently or in turn) are configured as current sources in the supply of power to a ring oscillator having cascaded inverter stages, thereby varying the oscillator frequency as a measure of the effects of stress on the devices under test, but without elevating the stress applied to the inverter stages.

Abstract: A solar cell includes a substrate, a first lightly-doped region, a second lightly-doped region, a second heavily-doped region, a first electrode and a second electrode. The first lightly-doped region having a first doping type is disposed in a first surface of the substrate. The second lightly-doped region and the second heavily-doped region having a second doping type different from the first doping type are disposed in a second surface of the substrate. The first electrode is disposed on the first surface of the substrate, and the second electrode is disposed on the second surface of the substrate.

Abstract: A pipelined ADC includes a first, second, and third pairs of comparators. The first pair of comparators compare an input voltage to a first positive reference voltage and to a first negative reference voltage. The second pair of comparators compare the input voltage to a second positive reference voltage and to a second negative reference voltage. Each comparator of the first and second pairs of comparators outputs a digital signal to an encoder. A third pair of comparators compares the input voltage to a third positive reference voltage and to a third negative reference voltage, and a comparator compares the input voltage to ground. The comparator and each comparator of the third pair of comparators is configured to output respective digital signals to an encoder. A multiplying digital-to-analog converter outputs a voltage based on the input voltage, an output from the encoder, and an output of the random number generator.

Abstract: A pipelined ADC includes a first, second, and third pairs of comparators. The first pair of comparators compare an input voltage to a first positive reference voltage and to a first negative reference voltage. The second pair of comparators compare the input voltage to a second positive reference voltage and to a second negative reference voltage. Each comparator of the first and second pairs of comparators outputs a digital signal to an encoder. A third pair of comparators compares the input voltage to a third positive reference voltage and to a third negative reference voltage, and a comparator compares the input voltage to ground. The comparator and each comparator of the third pair of comparators is configured to output respective digital signals to an encoder. A multiplying digital-to-analog converter outputs a voltage based on the input voltage, an output from the encoder, and an output of the random number generator.

Abstract: The reliability of an integrated circuit is inferred from the operational characteristics of sample metal oxide semiconductor (MOS) devices switchably coupled to drain/source bias and gate input voltages that are nominal, versus voltage and current conditions that elevate stress and cause temporary or permanent degradation, e.g., hot carrier injection (HCI), bias temperature instability (BTI, NBTI, PBTI), time dependent dielectric breakdown (TDDB). The MOS devices under test (preferably both PMOS and NMOS devices tested concurrently or in turn) are configured as current sources in the supply of power to a ring oscillator having cascaded inverter stages, thereby varying the oscillator frequency as a measure of the effects of stress on the devices under test, but without elevating the stress applied to the inverter stages.

Abstract: A nonvolatile analog memory has a floating gate point. The nonvolatile analog memory includes a capacitor, a first current source, a second current source and a current adjuster. The first current source controlled by a voltage value at the floating gate point and generates a first current. The second current source controlled by the voltage value at the floating gate point and generates a second current. The current adjuster receives the output voltage and a reference voltage and adjusts the first current and the second current based on the output voltage and the reference voltage. The current adjuster charges or discharges the capacitor to equalize the output voltage to the reference voltage.

Abstract: A nonvolatile analog memory has a floating gate point. The nonvolatile analog memory includes a capacitor. a first current source, a second current source and a current adjuster. The first current source controlled by a voltage value at the floating gate point and generates a first current. The second current source controlled by the voltage value at the floating gate point and generates a second current. The current adjuster receives the output voltage and a reference voltage and adjusts the first current and the second current based on the output voltage and the reference voltage. The current adjuster charges or discharges the capacitor to equalize the output voltage to the reference voltage.

Abstract: A nonvolatile analog memory has a floating gate point. The nonvolatile analog memory includes a first current source, a second current source, and a current adjuster. The first current source generates a first current, and the second current source generates a second current. The current adjuster turns on or turns off a current path of the second current according to a reference current and the first current. Furthermore, when the current path of the second current is turned on, the first current is adjusted according to the second current, such that the first current is equal to the reference current.